IP Library Granted Patent US 7,515,685
Granted Patent B2
US 7,515,685 · App. 11/587,930 · Granted Apr 7, 2009

Fluorescent X-ray analysis method and device

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Quick Facts
Patent No.
US 7,515,685
App. No.
11/587,930
Granted
Apr 7, 2009
Kind
B2
Abstract

In a fluorescent X-ray analysis method, a sample ( 1 ) is set on a sample stage ( 2 ) on an upper side of an X-ray irradiation chamber ( 7 ) and a sample cover ( 6 ) is closed from the upper part of the sample ( 1 ) to surround the sample ( 1 ), and then, a lower plane of the sample ( 1 ) is irradiated with X-ray for analysis. When the sample ( 1 ) is set on the sample stage ( 2 ) and the sample cover ( 6 ) is closed, a cover detecting means ( 8 ) detects that the sample cover ( 6 ) is closed and X-ray is automatically projected from an X-ray source ( 3 ) to start analysis.

Claims (13)

1. A fluorescent X-ray analysis method in which a sample covered by a sample cover openably and closeably attached to a sample stage is irradiated with X-rays, and the fluorescent X-rays emitted from the sample are detected, comprising:

determining whether the sample cover is open or closed;

determining whether or not the sample has been placed on the sample stage;

when the sample cover is closed, starting the X-ray irradiation of the sample; and

even when the sample cover is closed, not irradiating the sample with X-rays if the sample has not been placed on the sample stage.

2. A fluorescent X-ray analysis device, comprising:

a sample stage upon which a sample can be placed;

a sample cover openably and closeably attached to the sample stage;

an X-ray irradiation unit for irradiating the sample with X-rays;

a fluorescent X-ray detection unit for detecting fluorescent X-rays from the sample;

a sample cover open/closed detection unit for detecting whether the sample cover is open or closed;

a sample recognition unit for determining whether or not the sample has been placed on the sample stage; and

an X-ray irradiation starting unit for starting the X-ray irradiation of the sample when the sample cover is closed, or, even when the sample cover is closed, not irradiating the sample with X-rays if the sample has not been put in place, on the basis of a signal from the sample cover open/closed detection unit and the sample recognition unit.

Assignments (2)
CHANGE OF NAME Recorded Nov 21, 2008
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 021897/0570 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 26, 2007
From: IWAMOTO, HIROSHI; TANI, YOSHIYUKI; HISAZUMI, TAKAO; IWATA, YUKIHIRO; SAKAGUCHI, ETSUYOSHI
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 018930/0943 →