Detecting a failure condition in a system using three-dimensional telemetric impulsional response surfaces
View Patent ↗One embodiment of the present invention provides a system that facilitates high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data. During operation, the system applies a sudden impulse step change to one or more operational parameters of the electronic system during operation. Next, the system generates a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data to the sudden impulse step change. The system then determines from the 3D TIRF surface whether the telemetry data contains an anomaly.
1. A method for facilitating high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data, the method comprising:
applying a sudden impulse step change to one or more operational parameters of the electronic system during operation;
generating a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data associated with the one or more operational parameters to the sudden impulse step change; and
determining from the 3D TIRF surface whether the telemetry data contains an anomaly, which involves:
generating a reference 3D TIRF surface for the 3D TIRF surface;
computing a residual response surface between the 3D TIRF surface and the reference TIRF surface; and
determining from the residual response surface whether the telemetry data contains an anomaly.
2. The method of claim 1 , wherein generating the reference 3D TIRF surface for the 3D TIRF surface involves:
receiving a certified electronic system of the same type as the electronic system, wherein the certified electronic system is guaranteed to operate normally;
applying the same sudden impulse step change to the same one or more operational parameters of the certified electronic system; and
generating the reference 3D TIRF surface to the sudden impulse step change from a dynamic response in the corresponding telemetry data from the certified electronic system.
3. The method of claim 1 , wherein computing the residual response surface involves subtracting the reference 3D TIRF surface from the 3D TIRF surface.
4. The method of claim 1 , wherein generating the 3D TIRF surface involves:
producing a two-dimensional (2D) time-domain TIRF from the dynamic response in the telemetry data to the sudden impulse step change; and
computing a complex transfer function of the 2D time-domain TIRF, wherein the complex transfer function represents the 3D TIRF surface in a complex plane.
5. The method of claim 4 , wherein the complex transfer function can be obtained by using:
a z-transform; or
a Fourier-transform.
6. The method of claim 1 , wherein determining from the residual response surface whether the telemetry data contains an anomaly involves applying a 2D Sequential Probability Ratio Test (SPRT) to the residual response surface.
7. The method of claim 6 , wherein applying the 2D SPRT to the residual response surface involves performing two parallel one-dimensional (1D) SPRT tests along each direction of the residual response surface.
8. A computer-readable storage medium storing instructions that when executed by a computer cause the computer to perform a method for facilitating high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data, the method comprising:
applying a sudden impulse step change to one or more operational parameters of the electronic system during operation;
generating a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data associated with the one or more operational parameters to the sudden impulse step change; and
determining from the 3D TIRF surface whether the telemetry data contains an anomaly, which involves:
generating a reference 3D TIRF surface for the 3D TIRF surface;
computing a residual response surface between the 3D TIRF surface and the reference TIRF surface; and
determining from the residual response surface whether the telemetry data contains an anomaly.
9. The computer-readable storage medium of claim 8 , wherein generating the reference 3D TIRF surface for the 3D TIRF surface involves:
receiving a certified electronic system of the same type as the electronic system, wherein the certified electronic system is guaranteed to operate normally;
applying the same sudden impulse step change to the same one or more operational parameters of the certified electronic system; and
generating the reference 3D TIRF surface to the sudden impulse step change from a dynamic response in the corresponding telemetry data from the certified electronic system.
10. The computer-readable storage medium of claim 8 , wherein computing the residual response surface involves subtracting the reference 3D TIRF surface from the 3D TIRF surface.
11. The computer-readable storage medium of claim 8 , wherein generating the 3D TIRF surface involves:
producing a two-dimensional (2D) time-domain TIRF from the dynamic response in the telemetry data to the sudden impulse step change; and
computing a complex transfer function of the 2D time-domain TIRF, wherein the complex transfer function represents the 3D TIRF surface in a complex plane.
12. The computer-readable storage medium of claim 11 , wherein the complex transfer function can be obtained by using:
a z-transform; or
a Fourier-transform.
13. The computer-readable storage medium of claim 8 , wherein determining from the residual response surface whether the telemetry data contains an anomaly involves applying a 2D Sequential Probability Ratio Test (SPRT) to the residual response surface.
14. The computer-readable storage medium of claim 13 , wherein applying the 2D SPRT to the residual response surface involves performing two parallel one-dimensional (1D) SPRT tests along each direction of the residual response surface.
15. An apparatus that facilitates high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data, comprising:
an excitation mechanism configured to apply a sudden impulse step change to one or more operational parameters of the electronic system during operation;
a generation mechanism configured to generate a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data associated with the one or more operational parameters to the sudden impulse step change; and
a determination mechanism configured to determine from the 3D TIRF surface whether the telemetry data contains an anomaly,
wherein the determination mechanism is further configured to:
generate a reference 3D TIRF surface for the 3D TIRF surface;
compute a residual response surface between the 3D TIRF surface and the reference TIRF surface; and
determine from the residual response surface whether the telemetry data contains an anomaly.
16. The apparatus of claim 15 , wherein the determination mechanism is further configured to:
receive a certified electronic system of the same type as the electronic system, wherein the certified electronic system is guaranteed to operate normally;
apply the same sudden impulse step change to the same one or more operational parameters of the certified electronic system; and to
generate the reference 3D TIRF surface to the sudden impulse step change from a dynamic response in the corresponding telemetry data from the certified electronic system.
17. The apparatus of claim 15 , wherein the generation mechanism is configured to:
produce a two-dimensional (2D) time-domain TIRF from the dynamic response in the telemetry data to the sudden impulse step change; and to
compute a complex transfer function of the 2D time-domain TIRF, wherein the complex transfer function represents the 3D TIRF surface in a complex plane.
18. The apparatus of claim 15 , wherein the determination mechanism is further configured to apply a 2D Sequential Probability Ratio Test (SPRT) to the residual response surface.