IP Library Granted Patent US 7,548,820
Granted Patent B2
US 7,548,820 · App. 11/588,173 · Granted Jun 16, 2009

Detecting a failure condition in a system using three-dimensional telemetric impulsional response surfaces

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,548,820
App. No.
11/588,173
Granted
Jun 16, 2009
Kind
B2
Abstract

One embodiment of the present invention provides a system that facilitates high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data. During operation, the system applies a sudden impulse step change to one or more operational parameters of the electronic system during operation. Next, the system generates a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data to the sudden impulse step change. The system then determines from the 3D TIRF surface whether the telemetry data contains an anomaly.

Claims (56)

1. A method for facilitating high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data, the method comprising:

applying a sudden impulse step change to one or more operational parameters of the electronic system during operation;

generating a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data associated with the one or more operational parameters to the sudden impulse step change; and

determining from the 3D TIRF surface whether the telemetry data contains an anomaly, which involves:

generating a reference 3D TIRF surface for the 3D TIRF surface;

computing a residual response surface between the 3D TIRF surface and the reference TIRF surface; and

determining from the residual response surface whether the telemetry data contains an anomaly.

2. The method of claim 1 , wherein generating the reference 3D TIRF surface for the 3D TIRF surface involves:

receiving a certified electronic system of the same type as the electronic system, wherein the certified electronic system is guaranteed to operate normally;

applying the same sudden impulse step change to the same one or more operational parameters of the certified electronic system; and

generating the reference 3D TIRF surface to the sudden impulse step change from a dynamic response in the corresponding telemetry data from the certified electronic system.

3. The method of claim 1 , wherein computing the residual response surface involves subtracting the reference 3D TIRF surface from the 3D TIRF surface.

4. The method of claim 1 , wherein generating the 3D TIRF surface involves:

producing a two-dimensional (2D) time-domain TIRF from the dynamic response in the telemetry data to the sudden impulse step change; and

computing a complex transfer function of the 2D time-domain TIRF, wherein the complex transfer function represents the 3D TIRF surface in a complex plane.

5. The method of claim 4 , wherein the complex transfer function can be obtained by using:

a z-transform; or

a Fourier-transform.

6. The method of claim 1 , wherein determining from the residual response surface whether the telemetry data contains an anomaly involves applying a 2D Sequential Probability Ratio Test (SPRT) to the residual response surface.

7. The method of claim 6 , wherein applying the 2D SPRT to the residual response surface involves performing two parallel one-dimensional (1D) SPRT tests along each direction of the residual response surface.

8. A computer-readable storage medium storing instructions that when executed by a computer cause the computer to perform a method for facilitating high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data, the method comprising:

applying a sudden impulse step change to one or more operational parameters of the electronic system during operation;

generating a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data associated with the one or more operational parameters to the sudden impulse step change; and

determining from the 3D TIRF surface whether the telemetry data contains an anomaly, which involves:

generating a reference 3D TIRF surface for the 3D TIRF surface;

computing a residual response surface between the 3D TIRF surface and the reference TIRF surface; and

determining from the residual response surface whether the telemetry data contains an anomaly.

9. The computer-readable storage medium of claim 8 , wherein generating the reference 3D TIRF surface for the 3D TIRF surface involves:

receiving a certified electronic system of the same type as the electronic system, wherein the certified electronic system is guaranteed to operate normally;

applying the same sudden impulse step change to the same one or more operational parameters of the certified electronic system; and

generating the reference 3D TIRF surface to the sudden impulse step change from a dynamic response in the corresponding telemetry data from the certified electronic system.

10. The computer-readable storage medium of claim 8 , wherein computing the residual response surface involves subtracting the reference 3D TIRF surface from the 3D TIRF surface.

11. The computer-readable storage medium of claim 8 , wherein generating the 3D TIRF surface involves:

producing a two-dimensional (2D) time-domain TIRF from the dynamic response in the telemetry data to the sudden impulse step change; and

computing a complex transfer function of the 2D time-domain TIRF, wherein the complex transfer function represents the 3D TIRF surface in a complex plane.

12. The computer-readable storage medium of claim 11 , wherein the complex transfer function can be obtained by using:

a z-transform; or

a Fourier-transform.

13. The computer-readable storage medium of claim 8 , wherein determining from the residual response surface whether the telemetry data contains an anomaly involves applying a 2D Sequential Probability Ratio Test (SPRT) to the residual response surface.

14. The computer-readable storage medium of claim 13 , wherein applying the 2D SPRT to the residual response surface involves performing two parallel one-dimensional (1D) SPRT tests along each direction of the residual response surface.

15. An apparatus that facilitates high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data, comprising:

an excitation mechanism configured to apply a sudden impulse step change to one or more operational parameters of the electronic system during operation;

a generation mechanism configured to generate a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data associated with the one or more operational parameters to the sudden impulse step change; and

a determination mechanism configured to determine from the 3D TIRF surface whether the telemetry data contains an anomaly,

wherein the determination mechanism is further configured to:

generate a reference 3D TIRF surface for the 3D TIRF surface;

compute a residual response surface between the 3D TIRF surface and the reference TIRF surface; and

determine from the residual response surface whether the telemetry data contains an anomaly.

16. The apparatus of claim 15 , wherein the determination mechanism is further configured to:

receive a certified electronic system of the same type as the electronic system, wherein the certified electronic system is guaranteed to operate normally;

apply the same sudden impulse step change to the same one or more operational parameters of the certified electronic system; and to

generate the reference 3D TIRF surface to the sudden impulse step change from a dynamic response in the corresponding telemetry data from the certified electronic system.

17. The apparatus of claim 15 , wherein the generation mechanism is configured to:

produce a two-dimensional (2D) time-domain TIRF from the dynamic response in the telemetry data to the sudden impulse step change; and to

compute a complex transfer function of the 2D time-domain TIRF, wherein the complex transfer function represents the 3D TIRF surface in a complex plane.

18. The apparatus of claim 15 , wherein the determination mechanism is further configured to apply a 2D Sequential Probability Ratio Test (SPRT) to the residual response surface.

Assignments (2)
MERGER AND CHANGE OF NAME Recorded Dec 16, 2015
From: ORACLE USA, INC.; SUN MICROSYSTEMS, INC.; ORACLE AMERICA, INC.
To: ORACLE AMERICA, INC.
Reel/Frame 037304/0183 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 26, 2006
From: URMANOV, ALEKSEY M.; BOUGAEV, ANTON A.; GROSS, KENNY C.
To: SUN MICROSYSTEMS, INC.
Reel/Frame 018483/0142 →