Test circuit for semiconductor integrated circuit
View Patent ↗The present invention provides a test circuit for a semiconductor integrated circuit that can be used for testing plural of logic blocks each having plural input-output terminals. This test circuit is provided with scanning flip-flop (SFF) circuits whose output terminals are connected to the input terminals of the logic blocks. The SFF circuits hold test data which is sequentially supplied, supply the test data to the logic blocks and receive logic operation data generated from the logic blocks. The logic operation data may be sequentially supplied from the SFF circuits, on the basis of which performances of the logic blocks are examined.
1. A test circuit for testing a basic logic block having at least two input terminals and at least two output terminals and at least one additional logic block having at least two input terminals and at least two output terminals, said basic logic block for receiving test data through said at least two input terminals thereof and outputting resultant data respectively through said at least two output terminal thereof in synchronism with a clock signal, and said at least one additional logic block for receiving test data through said at least two input terminals thereof and outputting resultant data through said at least two input terminals thereof in synchronism with said clock signal, said test circuit comprising:
at least two basic bit holding and relaying units whose output terminals are connected to said at least two input terminals of said basic logic block, respectively; and
at least two additional bit holding and relaying units whose output terminals are connected to said at least two input terminals of said additional logic block, respectively,
wherein both of said basic and additional bit holding and relaying units operate in synchronism with said clock signal,
each of said basic and additional bit holding and relaying units has a data input terminal, a scanning input terminal and a mode switching terminal, receives a data bit by bit selected from said test data or resultant data respectively supplied to said data input terminal and said scanning input terminal in accordance with a mode designation signal supplied to said mode switching terminal thereby to hold said data and then relay said data to said output terminal thereof,
one of said basic bit holding and relaying units receives at said scanning input terminal thereof basic output data generated from the other of said basic bit holding and relaying units while an output data from said one of the basic bit holding and relaying units is supplied to said scanning input terminal of one of said additional bit holding and relaying units,
an additional output data from said one of the additional bit holding and relaying units is supplied to said scanning input terminal of the other of said additional bit holding and relaying units,
an external input data is supplied to said scanning input terminal of said other of the basic bit holding and relaying units,
an output terminal of said other of the additional bit holding and relaying units is a test data output terminal, and
said basic and additional bit holding and relaying units are respectively provided with signal delay circuits at a front stage thereof, said signal delay circuits respectively delaying said basic and additional input data.
2. A test circuit according to claim 1 , wherein
said basic logic blocks, said additional logic blocks, said basic bit holding and relaying units and said additional holding and relaying units are integrally formed in an IC chip.
3. A test circuit according to claim 2 , wherein
said signal delay circuits are either latch circuits for respectively latching said basic and additional output data or inverter circuits for respectively adjusting a timing of said basic and additional output data.
4. A test circuit according to claim 1 , wherein
said signal delay circuits are either latch circuits for respectively latching said basic and additional output data or inverter circuits for respectively inverting said basic and additional output data.
5. A test circuit according to claim 4 , wherein
each of said latch circuits latches said basic and additional output data in response to said clock signal which is supplied from gate cell in response to said mode designation signal.