A gate array of a semiconductor substrate on which plural unit cells are arranged in parallel, the unit cells having the same pattern that includes a source potential region VDD, a PMOS, an NMOS and a ground potential region GND. Metal wiring lines being formed, with an insulating layer between, on the unit cells, with contacts that make electrical connection between the metal wiring lines and the unit cell transistors. The gate wiring of a transistor in a non-used unit cell is used in place of a metal wiring line. By doing so, the area of metal wiring lines in a gate array is reduced and the array wiring efficiency is increased.
1. A gate array comprising:
a plurality of unit cells, the unit cells arranged in parallel on a semiconductor substrate and each having a same pattern including a first MOS transistor and a second MOS transistor, the first MOS transistor and the second MOS transistor each including a gate, a source and a drain, the gate of the first MOS transistor and the gate of the second MOS transistor being connected together by gate wiring, with the gate wiring having a first gate terminal portion and a second gate terminal portion;
a plurality of metal wiring lines on the unit cells, with an insulating layer there between; and
a plurality of contacts, that make electrical connections between the metal wiring lines and the first gate terminal portions, the second gate terminal portions, and some of the sources and the drains,
wherein in at least one of the unit cells, the drains and the sources of the first and second MOS transistors are in an unconnected floating state, and the gate wiring of the at least one of the unit cells provides electrical connection between other ones of the plurality of unit cells via the contacts.
2. The gate array of claim 1 , wherein the first MOS transistor is a P channel MOS transistor, and the second MOS transistor is an N channel MOS transistor.