System for depositing a film by modulated ion-induced atomic layer deposition (MII-ALD)
View Patent ↗The present invention relates to an enhanced sequential atomic layer deposition (ALD) technique suitable for deposition of barrier layers, adhesion layers, seed layers, low dielectric constant (low-k) films, high dielectric constant (high-k) films, and other conductive, semi-conductive, and non-conductive films. This is accomplished by 1) providing a non-thermal or non-pyrolytic means of triggering the deposition reaction; 2) providing a means of depositing a purer film of higher density at lower temperatures; and, 3) providing a faster and more efficient means of modulating the deposition sequence and hence the overall process rate resulting in an improved deposition method.
1. A sequential method for depositing a thin film onto a substrate in a chamber comprising:
introducing a first reactant gas selected from the group consisting of copper (I) β-diketonates, copper (II) β-diketonates, and copper halides into said chamber;
adsorption of at least one monolayer of said first reactant gas onto said substrate;
removing excess said first reactant gas from said chamber;
introducing at least one ion generating feed gas into said chamber;
introducing at least one radical generating feed gas into said chamber;
generating a plasma from said ion generating feed gas and said radical generating feed gas to form ions and radicals;
exposing said substrate to said ions and said radicals;
modulating said ions; and
reacting said adsorbed monolayer of said first reactant gas with said ions and said radicals to deposit said thin film.
2. The method of claim 1 wherein said first reactant gas is selected from the group comprising Cu(thd) 2 , Cu(acac) 2 , and Cu(hfac) 2 .