Optical calibration system and method
View Patent ↗An optical system calibration system and method particularly suited for calibrating the optical slit planes in an ophthalmic diagnostic instrument. The system includes an illumination source projector, an illumination image receiver, and a calibration component all having known relative positions, orientations and physical and optical characteristics. The calibration component includes at least two separated, diffusely reflecting surfaces. Images of an exemplary slit illumination pattern projected onto the calibration component and formed on the diffusely reflecting surfaces are detected by the image receiver such as a video camera. Based upon camera image coordinates and triangulation parameters of the projector, the receiver, and the calibration component, the slit image positions on the image detector plane can be calibrated to the axially displaced, diffusely reflecting calibration component surface positions.
1. An optical calibration system, comprising
an illumination projector having an illumination projection axis lying in a plane, wherein the projector is positioned at a selected reference location coordinate (x P ,y 0 ,z p ) in the plane, further wherein the projection axis has a known projection axis direction in the plane;
an illumination imager having an imaging axis lying in the plane, wherein the illumination imager is positioned at a known receiver location coordinate (x R , y 0 , z R ) in the plane;
a calibration component comprising at least a first at least partially diffusely reflecting surface disposed along the projection axis at a known first surface location coordinate (x C ,y 0 ,z C1 ) and a second at least partially diffusely reflecting surface disposed along the projection axis at a known second surface location coordinate (x C ,y 0 ,z C2 ) that is different than the first surface location coordinate, the system configured such that the first at least partially diffusely reflecting surface and the second at least partially diffusely reflecting surface are disposed along the projection axis at a same time; and
a processing component operatively coupled to the system and adapted to determine a spatial calibration indicia for the system.
2. The optical calibration system of claim 1 , wherein the calibration component comprises at least a third at least partially diffusely reflecting surface disposed along the projection axis at a known third surface location coordinate that is different than the first and the second surface location coordinates.
3. The optical calibration system of claim 2 , wherein the calibration component comprises a plurality of stacked, optically transmitting plates each having a given thickness, wherein at least one of a front and a back surface of each of the plurality of plates is an at least partially diffusely reflecting surface.
4. The optical calibration system of claim 2 , wherein the calibration component comprises at least a first at least partially diffusely reflecting surface portion positionable in the path of the projection axis and a second at least partially diffusely reflecting surface portion disposed parallel to the first surface portion and displaced a known distance from the first surface.
5. The optical calibration system of claim 4 , wherein the calibration component comprises at least a third at least partially diffusely reflecting surface portion disposed parallel to the first and second surface portions and displaced a known distance from at least one of the first and the second surface portions.
6. The optical calibration system of claim 3 , wherein the given thicknesses of at least some of the plurality of plates are equal to one another.
7. The optical calibration system of claim 1 , wherein the calibration component has a homogeneous index of refraction.
8. The optical calibration system of claim 3 , wherein all of the plurality of plates have an equal index of refraction.
9. The optical calibration system of claim 1 , wherein the at least first and second surfaces are flat.
10. The optical calibration system of claim 1 , wherein the at least first and second surfaces are parallely displaced.
11. The optical calibration system of claim 1 , each of the diffusing surfaces is at least one of an etched surface, a roughened surface, a coated surface, a frosted surface, and a ground surface.
12. The optical calibration system of claim 1 , wherein the illumination projector produces a predetermined illumination pattern.
13. The optical calibration system of claim 12 , wherein the illumination projector produces a slit light pattern.
14. The optical calibration system of claim 12 , wherein the illumination projector is an incoherent light projector.
15. The optical calibration system of claim 1 , wherein the calibration component is optical glass.
16. The optical calibration system of claim 1 , wherein the illumination projector is a Scheimpflug slit beam projector.
17. The optical calibration system of claim 1 , wherein the calibration indicia describes a relationship between a) the separation of corresponding coordinate parameters between at least two different diffuse illumination images on a sensor plane in the imager and, b) an axial separation distance between at least two respective diffusely reflecting surfaces of the calibration component.
18. A method for calibrating an optical system, comprising:
projecting an illumination pattern from a selected projection location, having a projection axis and known projection axis direction;
simultaneously illuminating a plurality of partially diffusing calibration component surfaces disposed in a path of the projection axis, each of said surfaces disposed at respective known calibration component surface locations along the projection axis that are different than one another;
imaging the plurality of diffusely scattered illumination images from the plurality of optically diffusing calibration component surfaces on an image sensor positioned at a known imager location; and
spatially calibrating the optical system based upon the projector, imager and calibration component surface locations, axis direction parameters, and sensor image parameters.
19. The method of claim 18 , wherein the projecting step comprises projecting an incoherent illumination pattern.
20. The method of claim 19 , wherein the projecting step comprises projecting a slit illumination pattern.
21. The method of claim 18 , wherein calibrating the optical system comprises determining a relationship between a) the separation of corresponding coordinate parameters between at least two different diffuse illumination images on a sensor plane in the imager and, b) an axial separation distance between at least two respective diffusely reflecting surfaces of the calibration component.
22. An image calibration system, comprising:
a slit illumination projector adapted to project a slit illumination pattern along an illumination axis;
a calibration component having a plurality of diffusely reflecting surfaces, each of which is positioned along the illumination axis, each of which diffusely scatters at least a portion of the slit illumination pattern, the system configured such that the plurality of diffusely reflecting surfaces are disposed along the projection axis at a same time;
a camera disposed so as to image each of the diffusely scattered slit patterns on each of the respective plurality of diffusely reflecting surfaces; and
a processing component coupled to the camera and adapted to determine a spatial calibration indicia for the slit images.
23. The image calibration system of claim 22 , wherein each of the slit illumination projector, the calibration component, and the camera have relative location and orientation coordinates sufficient for the processing component to determine the calibration indicia for the slit plane images.
24. The image calibration system of claim 22 , wherein the slit illumination projector is adapted to project an incoherent slit illumination pattern.
25. The image calibration system of claim 24 , wherein the slit illumination projector is a Scheimpflug slit beam projector.
26. The image calibration system of claim 22 , wherein the calibration component has at least three diffusely reflecting surfaces.
27. The image calibration system of claim 22 , wherein a separation distance between any two adjacent diffuse surfaces is different than a separation distance between any other two adjacent diffuse surfaces.
28. The image calibration system of claim 27 , wherein the separation distance between a first diffuse surface and a second diffuse surface is greater than the distance between the second diffuse surface and a third diffuse surface.
29. The image calibration system of claim 22 , wherein each of the plurality of diffusely reflecting surfaces are flat and mutually parallel.
30. The image calibration system of claim 22 , wherein the calibration indicia describes a relationship between a) the separation of corresponding coordinate parameters between at least two different diffuse illumination images on a sensor plane in the imager and, b) an axial separation distance between at least two respective diffusely reflecting surfaces of the calibration component.
31. The image calibration system of claim 22 , constituting a portion of a corneal topography analysis device.
32. The image calibration system of claim 31 , further comprising an ophthalmic wavefront analyzer cooperatively engaged with the system.
33. The image calibration system of claim 22 , constituting a portion of an anterior corneal segment analyzer device.
34. The image calibration system of claim 33 , further comprising an ophthalmic wavefront analyzer cooperatively engaged with the system.