IP Library Granted Patent US 7,630,632
Granted Patent B2
US 7,630,632 · App. 11/612,550 · Granted Dec 8, 2009

Method for measuring the high speed behavior of fiber optic transceivers

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Quick Facts
Patent No.
US 7,630,632
App. No.
11/612,550
Granted
Dec 8, 2009
Kind
B2
Abstract

A method for measuring the high speed behavior of fiber optic transceivers and transceiver modules. The method includes providing a fiber optic transceiver, performing one or more low speed performance tests on the fiber optic transceiver at each of a plurality of temperatures across transceiver operating temperature range, and performing a high speed performance test suite on the fiber optic transceiver at a single temperature within the testing temperature range. Based on the low speed performance tests and the high speed performance test suite at the single temperature, the method can determine, via calculation, approximation or prediction, the high speed behavior of the transceiver over temperature. The basis for determining the high speed behavior of the transceiver also can include the measured or available modeled relationships of high speed performance characteristics of at least a portion of the transceiver to the temperature-dependent parameters measured in the low speed performance tests.

Claims (18)

1. A method for measuring the high speed behavior of a fiber optic transceiver, comprising the steps of:

providing a fiber optic transceiver;

performing at least one low speed performance test on the fiber optic transceiver at a first temperature;

performing at least one low speed performance test on the fiber optic transceiver at at least one second temperature, wherein the first temperature and the at least one second temperature define a testing temperature range;

performing at least one high speed performance test on the fiber optic transceiver at a single temperature within the testing temperature range; and

determining the high speed behavior of the fiber optic transceiver based on the plurality of low speed performance tests and the at least one high speed performance test.

2. The method as recited in claim 1 , wherein the determining step also is based on the relationship of at least one high speed performance characteristic of at least a portion of the transceiver to at least one testing parameter measured as part of at least one low speed performance test.

3. The method as recited in claim 1 , wherein the at least one low speed performance test measures how one or more performance characteristics of the fiber optic transceiver depends on changes in temperature.

4. The method as recited in claim 1 , wherein the at least one high speed performance test measures how one or more high speed performance characteristics of the fiber optic transceiver depends on changes in temperature.

5. The method as recited in claim 1 , wherein the determining step includes determining the relationship of one or more performance characteristics of the fiber optic transceiver to the high speed performance of the fiber optic transceiver.

6. The method as recited in claim 1 , wherein the determining step includes determining the relationship of the performance characteristics of at least one component in the transceiver to the performance characteristics of the fiber optic transceiver.

7. The method as recited in claim 1 , wherein the at least one low speed performance test includes determining the direct current (DC) behavior of the fiber optic transceiver.

8. The method as recited in claim 1 , wherein the low speed performance test includes performing at least one low speed performance test on at least one component within the fiber optic transceiver.

9. The method as recited in claim 1 , wherein the low speed performance test includes measuring at least one DC characteristic of at least one component within the fiber optic transceiver.

10. The method as recited in claim 1 , wherein the fiber optic transceiver includes a semiconductor laser optical source, and wherein the at least one low speed performance test measures at least one of a threshold current and a slope efficiency of the semiconductor laser optical source.

11. The method as recited in claim 1 , wherein the at least one high speed performance test includes a high speed performance test selected from the group consisting of a Bit Error Ratio (BER) test, a small signal frequency response test, a jitter test and a drive current test.

12. The method as recited in claim 1 , wherein the fiber optic transceiver includes a laser light source, at least one transmitter module integrated circuit and at least one receiver module integrated circuit, and wherein the low speed performance test includes performing at least one low speed performance test on at least one of the laser light source, the transmitter module integrated circuit and the receiver module integrated circuit.

13. The method as recited in claim 1 , wherein the at least one high speed performance test includes performing a high speed performance test on at least one component within the fiber optic transceiver.

Assignments (7)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 14, 2020
From: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
To: BROADCOM INTERNATIONAL PTE. LTD.
Reel/Frame 053771/0901 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE OF MERGER PREVIOUSLY RECORDED AT REEL: 047195 FRAME: 0827. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Nov 5, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047924/0571 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047195/0827 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032851-0001) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 037689/0001 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032851/0001 →