Calibrating turn-on energy of a marking device
View Patent ↗In a system and a method for calibrating turn-on energy of a fluid-ejecting marking device, a reference object and a plurality of test objects are contemporaneously printed by the marking device on a same type of substrate. The reference object is printed at a known “on” voltage at a first pattern density, and the test objects are printed at a series of decrementing voltages at an intended second pattern density greater than the first pattern density. A scanning device compares the reference object to the test objects to determine which test object(s) most closely resemble(s) the reference object. Based at least upon this comparison, a turn-on energy for the marking device is determined. By using a reference object to compare the test objects to, a turn-on energy can be calculated independent of the type of substrate used and the ambient conditions present when printing the reference and test objects.
1. A method for facilitating calibration of turn-on energy of a fluid-ejecting marking device, the method comprising the steps of:
printing a reference object at a first energy level with the fluid-ejecting marking device, the reference object being printed on a substrate of a first type;
printing a plurality of test objects at different energy levels with the fluid-ejecting marking device, the plurality of test objects being printed on one or more substrates of the first type;
identifying one or more test objects of the plurality of test objects that resemble the reference object;
identifying one or more identified energy levels or identified data related to one or more energy levels used to print the one or more selected test objects;
calculating data pertaining to a turn-on energy for the fluid-ejecting marking device based at least upon the identified energy levels or identified data; and
outputting the calculated data.
2. The method of claim 1 , wherein the fluid-ejecting marking device is an ink jet marking device.
3. The method of claim 1 , wherein the identified one or more energy levels or identified data pertains to one or more voltages.
4. The method of claim 1 , wherein the reference object and the plurality of test objects each are swatches.
5. The method of claim 4 , wherein the reference object and the plurality of test objects each have a checkerboard pattern.
6. The method of claim 1 , wherein the reference object is printed at a first pattern density, and wherein the plurality of test objects each are printed at an intended second pattern density greater than the first pattern density.
7. The method of claim 6 , wherein the first pattern density is approximately 12.5% density and the intended second pattern density is approximately 25% density.
8. The method of claim 6 , wherein the intended second pattern density is twice or less than twice the first pattern density.
9. The method of claim 1 , wherein the reference object and the plurality of test objects are printed contemporaneously or substantially contemporaneously.
10. The method of claim 1 , wherein the reference object and the plurality of test objects are printed together on a single substrate.
11. The method of claim 1 , wherein the plurality of test objects are printed in a row, each test object being printed with a successively lower energy level.
12. The method of claim 1 , wherein the plurality of test objects are printed in a row, each test object being printed with a successively higher energy level.
13. The method of claim 1 , wherein the one or more selected test objects resembles the reference object because the one or more selected test objects have closer reflectance to the reflectance of the reference object than do nonselected test objects.
14. The method of claim 1 , wherein the one or more selected test objects comprise a first selected test object and a second selected test object.
15. The method of claim 14 , wherein the first selected test object resembles the reference object because it has a closest reflectance greater than a reflectance of the reference object, and wherein the second selected test object resembles the reference object because it has a closest reflectance less than the reflectance of the reference object.
16. A system for facilitating calibration of turn-on energy of a fluid-ejecting marking device, the system comprising:
a fluid-ejecting marking device that prints
(a) a reference object at a first energy level with the fluid-ejecting marking device, the reference object being printed by the fluid-ejecting marking device on a substrate of a first type, and
(b) a plurality of test objects at different energy levels on one or more substrates of the first type;
a data storage system that, at least, retains data identifying one or more energy levels used by the fluid-ejecting marking device to print the plurality of test objects;
a scanning device that, at least, scans the one or more substrates upon which the reference object and at least some of the plurality of test objects that were printed by the fluid-ejecting marking device;
a data processing system that:
(a) receives scan information from the scanning device, the scan data describing information the scanning device acquired from scanning the substrates,
(b) identifies one or more selected test objects of the plurality of test objects that resembles the reference object based at least upon the scan information;
(c) determines, utilizing the retained data retained by the data storage system, one or more identified energy levels or identified data related to one or more energy levels used to print the one or more selected test objects,
(d) calculates calculated data pertaining to a turn-on energy for the fluid-ejecting marking device based at least upon the one or more identified energy levels or identified data, and
(e) outputs the calculated data.
17. The system of claim 16 , wherein the fluid-ejecting marking device is an ink jet marking device.
18. The system of claim 16 , wherein the one or more identified energy levels pertains to one or more voltages.
19. The system of claim 16 , wherein the reference object and the plurality of test objects each are swatches.
20. The system of claim 19 , wherein the reference object and the plurality of test objects each have a checkerboard pattern.
21. The system of claim 16 , wherein the reference object is printed by the fluid-ejecting marking device at a first pattern density, and wherein the plurality of test objects each are printed by the fluid-ejecting marking device at an intended second pattern density greater than the first pattern density.
22. The system of claim 21 , wherein the first pattern density is approximately 12.5% density and the intended second pattern density is approximately 25% density.
23. The system of claim 21 , wherein the intended second pattern density is twice or less than twice the first pattern density.
24. The system of claim 16 , wherein the reference object and the plurality of test objects are printed by the fluid-ejecting marking device contemporaneously or substantially contemporaneously.
25. The system of claim 16 , wherein the reference object and the plurality of test objects are printed by the fluid-ejecting marking device together on a single substrate.
26. The system of claim 16 , wherein the plurality of test objects are printed by the fluid-ejecting marking device in a row, each test object being printed by the fluid-ejecting marking device with a successively lower energy level.
27. The system of claim 16 , wherein the plurality of test objects are printed by the fluid-ejecting marking device in a row, each test object being printed by the fluid-ejecting marking device with a successively higher energy level.
28. The system of claim 16 , wherein the selected one or more test objects resemble the reference object, as determined by the data processing system, because the one or more selected test objects have closer reflectance to the reflectance of the reference object than do nonselected test objects.
29. The system of claim 16 , wherein the one or more selected test objects comprise a first selected test object and a second selected test object.
30. The system of claim 29 , wherein the first selected test object resembles the reference object, as determined by the data processing system, because it has a closest reflectance greater than a reflectance of the reference object, and wherein the second selected test object resembles the reference object, as determined by the data processing system, because it has a closest reflectance less than the reflectance of the reference object.