Method and system for isolation of a fault location in a communications device
View Patent ↗The present invention provides a system and method of identifying a failure location in a datapath in a communication element, the datapath traversing from an ingress point through at least a first component to an egress point. In an embodiment the method comprises: providing a diagnostic cell to adapted to be inserted at a startpoint upstream of the first component in the datapath; providing at least a first diagnostic cell counter module adapted to be associated with a first location in the first component, the first diagnostic cell counter module being adapted to recognize when the diagnostic cell passes the first location and being adapted to track passage of the diagnostic cell past the first location; inserting the diagnostic cell into the datapath at the starting point; and analyzing the diagnostic cell counter module to identify the failure location in the datapath.
1. A method of identifying a failure location in a datapath in a communication element, said datapath traversing from an ingress point through at least a first active component and at least a first inactive component to an egress point, said method comprising:
inserting a diagnostic cell into said datapath at an insertion point upstream of said first active component in said datapath, wherein said diagnostic cell traverses said datapath through said first active component and into said first inactive component;
increasing a first diagnostic cell match counter at a first location in said first inactive component, when said first diagnostic cell match counter recognizes that said diagnostic cell has passed said first location;
analyzing the value of said first diagnostic cell match counter; and
identifying said failure location in said datapath based on the value of said first diagnostic cell match counter.
2. The method of identifying a failure location in a datapath of claim 1 , wherein said failure location is identified as being downstream of said first location when said first diagnostic cell match counter recognizes that said diagnostic cell passed said first location.
3. The method of identifying a failure location in a datapath of claim 2 , wherein a second diagnostic cell match counter is increased at a second location in said datapath, when said second diagnostic cell match counter recognizes said diagnostic cell passing said second location.
4. The method of identifying a failure location in a datapath of claim 1 , wherein:
said datapath traverses an ingress line card, an inactive switching fabric, and an egress line card;
said insertion point is upstream of said ingress line card; and
said first inactive component is selected from one of said ingress line card and said egress line card.
5. The method of identifying a failure location in a datapath as claimed in claim 4 , wherein said datapath is defined by a VPI/VCI connection, and passage of said diagnostic cell along the datapath is non-disruptive of regular data traffic passing through the communication element.
6. The method of identifying a failure location in a datapath of claim 1 , wherein said datapath traverses an ingress line card and returns through said ingress line card.
7. The method of identifying a failure location in a datapath as claimed in claim 6 , wherein said datapath is defined by a VPI/VCI connection, and passage of said diagnostic cell along the datapath is non-disruptive of regular data traffic passing through the communication element.
8. A system for identifying a failure location in a datapath in a communication element, said datapath traversing from an ingress point through at least a first active component and at least a first inactive component to an egress point, said system comprising:
at least a first diagnostic cell match counter associated with a first location in said first inactive component, said first diagnostic cell match counter recognizing when a diagnostic cell passes said first location and tracking passage of said diagnostic cell past said first location by increasing an internal count, wherein said diagnostic cell traverses said datapath through said first active component and into said first inactive component; and
a diagnostic cell counter module for analyzing the internal count in said diagnostic cell match counter to identify said failure location in said datapath.
9. The system of identifying a failure location in a datapath as claimed in claim 8 , wherein a second diagnostic cell match counter is provided at a second location in said datapath, said second diagnostic cell match counter recognizing when said diagnostic cell passes said second location and tracking passage of said diagnostic cell past said second location.
10. The system of identifying a failure location in a datapath as claimed in claim 9 , wherein said diagnostic cell counter module identifies said failure location as being downstream of said first location when said first diagnostic cell match counter recognizes that said diagnostic cell passed said first location.
11. The system of identifying a failure location in a datapath as claimed in claim 10 , wherein said datapath is defined by a VPI/VCI connection, and passage of said diagnostic cell along the datapath is non-disruptive of regular data traffic passing through the communication element.
12. The method of identifying a failure location in a datapath as claimed in claim 1 , wherein said datapath traversing said first inactive component passes regular data traffic when the value of said first diagnostic cell match counter indicates that said diagnostic cell passed said first location.
13. The system of identifying a failure location in a datapath as claimed in claim 8 , wherein said datapath traversing said first inactive component passes regular data traffic when the value of said first diagnostic cell match counter indicates that said diagnostic cell passed said first location.