Phase mask with continuous azimuthal variation for a coronagraph imaging system
View Patent ↗Systems and methods for shifting the phase of incident light to induce a continuous phase variation in an azimuthal direction. A phase mask assembly has a first surface and a second surface. The first surface and the second surface are configured such that the distance between the first surface and the second surface varies continuously in an azimuthal direction around the phase mask. This mask can be used in a coronagraph system to effectively suppress the on-axis star image for the detection of off-axis planets.
1. A phase mask assembly comprising:
a first surface that is substantially flat; and
a second surface;
wherein the first surface and the second surface are configured such that a distance between the first surface and the second surface varies continuously in an azimuthal direction around the phase mask across the entirety of the phase mask, such that when light passes from the first surface to the second surface, the intensity of the light leaving the second surface of the phase mask at a center of the phase mask is substantially attenuated.
2. The assembly of claim 1 , wherein the distance between the first surface and the second surface varies sinusoidally in an azimuthal direction across the phase mask assembly.
3. The assembly of claim 1 , wherein the distance between the first surface and the second surface at a given azimuthal angle is equal to the product of a variation amplitude and the cosine of an integer multiple of the angle.
4. The assembly of claim 3 , wherein the variation amplitude can be determined as the solution to a zeroth order Bessel function.
5. The assembly of claim 3 , wherein the integer multiple is two, such that the distance between the first surface and the second function varies over two full cycles in one circumscription of the phase mask.
6. The assembly of claim 3 , wherein the integer multiple is four, such that the distance between the first surface and the second function varies over four full cycles in one circumscription of the phase mask.
7. A method for producing a phase mask assembly that provides a continuous phase variation to incident light along an azimuthal direction, comprising:
determining a desired wavelength;
determining an appropriate width variation for the phase mask assembly according to the desired wavelength, such that the width of the phase mask varies continuously in an azimuthal direction; and
fabricating a transparent material to the determined width variation, such that a first surface of the phase mask assembly is substantially flat and a distance between the first surface and a second surface of the phase mask varies continuously in an azimuthal direction around the phase mask across the entirety of the phase mask, such that when light passes from the first surface to the second surface, the intensity of the light leaving the second surface of the phase mask at a center of the phase mask is substantially attenuated.
8. The method of claim 7 , wherein shaping a transparent material to the determined width variation comprises fabricating the transparent material via diamond turning.
9. The method of claim 7 , wherein determining an appropriate width variation for the phase mask assembly according to the desired wavelength, comprises calculating a variation amplitude representing a range of the determined width variation for the for the phase mask assembly as the zeroes of a zeroth order Bessel function.
10. A phase mask assembly, having an associated wavelength of interest, comprising:
a first surface; and
a second surface;
wherein the first surface and the second surface are configured such that a distance between the first surface and the second surface varies continuously in an azimuthal direction around the phase mask, such that the distance between the first surface and the second surface at a given azimuthal angle is equal to the product of a variation amplitude, substantially equal to one-half the associated wavelength of interest, and a sinusoidal function of an integer multiple of the angle.