Sensor including porous body with metal particles loaded in the pores of the body and measuring apparatus using the same
View Patent ↗A sensor chip includes a layer-shaped base body, which has a plurality of fine holes formed in one surface, and fine metal particles, each of which is loaded in one of the fine holes of the base body. At least a part of each of the fine metal particles is exposed to a side of the layer-shaped base body, which side is more outward than the one surface of the layer-shaped base body. The layer-shaped base body may be constituted of anodic oxidation alumina. The sensor chip constitutes a sensor utilizing localized plasmon resonance, with which a state of binding of a sensing medium with a specific substance is capable of being detected quickly and with a high sensitivity.
1. A sensor using a fine structure body,
wherein the fine structure body comprises:
i) a layer-shaped base body, which has a plurality of fine holes formed in one surface,
ii) fine metal particles, each of which is loaded in one of the fine holes of the base body, and
iii) a thin metal film formed on areas of the one surface of the layer-shaped base body, which areas are located around each of the fine holes of the layer-shaped base body, such that the thin metal film is located at a spacing from each of the fine metal particles;
wherein the layer-shaped base body comprises dielectric material or semiconductor material,
wherein the sensor comprises:
i) means for irradiating measuring light to an area of the fine metal particles and the thin metal film of the fine structure body, and
ii) photo detecting means for detecting intensity of the measuring light, which has passed through the area of the fine metal particles and the thin metal film, or has been reflected from the area of the fine metal particles and the thin metal film.
2. A sensor as defined in claim 1 wherein the photo detecting means spectrophotometrically detects the intensity of the measuring light, which has passed through the area of the fine metal particles and the thin metal film, or has been reflected from the area of the fine metal particles and the thin metal film.