IP Library Granted Patent US 7,671,603
Granted Patent B2
US 7,671,603 · App. 11/641,928 · Granted Mar 2, 2010

Screening of electrolytic capacitors

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Quick Facts
Patent No.
US 7,671,603
App. No.
11/641,928
Granted
Mar 2, 2010
Kind
B2
Abstract

A method for screening electrolytic capacitors places a capacitor in series with a resistor in series with a resistor, applying a test voltage and following the charge curve for the capacitor. A high voltage drop indicates high reliability and a low voltage drop is used to reject the piece. The leakage current is not adversely affected during the test.

Claims (16)

1. A method for screening a population of electrolytic capacitors comprising:

applying a common dc voltage equal to or greater than an average breakdown voltage to each capacitor and an associated resistor while each capacitor is connected in series with said associated resistor Rs, wherein 0.1 Mohm<Rs<10 Mohm;

monitoring the charge curve of each capacitor and associated resistor until the voltage drop reaches the average breakdown voltage or until time t is reached, wherein 0.5 mm<t<5 mm; and

sorting the population of electrolytic capacitors based on observed voltage drop.

2. A method according to claim 1 wherein the average breakdown voltage is established prior to the screening.

3. A method according to claim 1 wherein R s is established prior to the screening.

4. A method according to claim 1 wherein the applied dc voltage is between the average breakdown voltage and 1.5 times average breakdown voltage.

5. A method according to claim 1 wherein said capacitors are rejected if they are within 1% to 10% of the low end of the population, depending on the capacitor type and possible application.

6. A method according to claim 1 wherein said capacitors are screened after assembly, final ageing and testing.

7. A method according to claim 1 wherein said capacitors are screened in at least one of prior to assembly, after assembly, prior to final aging, after final aging, prior to final testing and after final testing.

8. A method for screening a population of electrolytic capacitors comprising:

applying a common dc voltage equal to or greater than an average breakdown voltage to each capacitor and an associated resistor while each capacitor is connected in series with said associated resistor Rs, wherein 0.1 Mohm<Rs<10 Mohm;

monitoring the charge curve of each capacitor and associated resistor until the voltage drop reaches the average breakdown voltage or until time t is reached, wherein 0.5 mm<t<5 mm; and

sorting the population of electrolytic capacitors based on observed voltage drop;

wherein said capacitors are screened after assembly, final ageing and testing; and

wherein said capacitors are rejected if they are within 1% to 10% of the low end of the population, depending on the capacitor type and possible application.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded Nov 8, 2018
From: BANK OF AMERICA, N.A.
To: KEMET CORPORATION,; KEMET ELECTRONICS CORPORATION; KEMET BLUE POWDER CORPORATION
Reel/Frame 047450/0926 →
SECURITY AGREEMENT Recorded May 22, 2017
From: KEMET CORPORATION; KEMET ELECTRONICS CORPORATION; KEMET BLUE POWDER CORPORATION
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 042523/0639 →
SECURITY INTEREST Recorded Oct 5, 2010
From: KEMET ELECTRONICS CORPORATION
To: BANK OF AMERICA, N.A. AS AGENT
Reel/Frame 025150/0023 →
RELEASE OF SECURITY INTEREST RECORDED AT REEL/FRAME 022892/0795 Recorded May 18, 2010
From: K FINANCING, LLC
To: KEMET CORPORATION
Reel/Frame 024397/0774 →
SECURITY AGREEMENT Recorded Jul 1, 2009
From: KEMET CORPORATION
To: K FINANCING, LLC
Reel/Frame 022892/0795 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2006
From: FREEMAN, YURI
To: KEMET ELECTRONICS CORPORATION
Reel/Frame 018704/0604 →