IP Library Granted Patent US 7,515,254
Granted Patent B2
US 7,515,254 · App. 11/644,256 · Granted Apr 7, 2009

Reflection-testing device and method for use thereof

Assignee: Altus Technology Inc.
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Quick Facts
Patent No.
US 7,515,254
App. No.
11/644,256
Granted
Apr 7, 2009
Kind
B2
Abstract

A reflection-testing device for testing for unwanted reflections in a lens module ( 12 ) includes a plurality of light sources ( 18 ) and an image capturer ( 16 ). The plurality of light sources is provided around the top end of the lens module, and the image capturer is provided near the other end of the lens module for receiving optical signals through the lens module. A lens reflection testing method is also disclosed.

Claims (22)

1. A reflection-testing device for testing unacceptable levels of a reflection of a lens module, comprising:

a plurality of light sources provided around the top end of the lens module, the plurality of light sources being arranged in a circle, and an inner diameter of the circle being approximately equal to a diameter of the lens module, the plurality of light sources being fixed on one surface of a turn sheet and faces towards the lens module, and, during testing, the turn sheet being rotated about the optical axis of the lens module; and

an image capturer provided near the other end of the lens module, the image capturer being configured for receiving an optical signal through the lens module.

2. The reflection-testing device as claimed in claim 1 , wherein the light sources and the lens module both can be moved along an optical axis of the lens module.

3. The reflection-testing device as claimed in claim 1 , wherein the light sources are one of common lamps, light-emitting diodes, and large-area light sources.

4. The reflection-testing device as claimed in claim 3 , a baffle is provided in the center of the plurality of light sources, the baffle facing towards the lens module, wherein the area of the baffle corresponds to the area of the cross section of the lens module.

5. A reflection testing method for reflection testing of a lens module, comprising the following steps:

providing a plurality of light sources around a top surface of the lens module, the light sources being fixed on one surface of a turn sheet and facing towards the lens module, and, during testing, the turn sheet being rotated about the optical axis of the lens module to make the plurality of light sources emit a generally annular light;

providing an image capturer and placing it near the other end of the lens module;

receiving an optical signal through the lens module and forming an image by the image capturer; and

testing for the presence of unwanted reflections in the image.

6. A reflection testing method as claimed in claim 5 , wherein the light sources and the lens module both can be moved along an optical axis of the lens module.

7. A reflection testing method as claimed in claim 5 , wherein the light sources are one of common lamps, light-emitting diodes and large-area light sources.

8. The reflection testing method as claimed in claim 5 , a baffle is provided in the center of the plurality of light sources, the baffle faces towards the lens module, wherein the area of the baffle corresponds to the area of the cross section of the lens module.

9. A reflection-testing device for testing unacceptable levels of a reflection, comprising:

an optical device including a barrel and a lens module, the barrel being a hollow cylinder with the lens module received therein, the lens module comprising a plurality of lenses;

a plurality of light sources provided around the top end of the barrel and emitting an annular light, the plurality of light sources being fixed on one surface of a turn sheet and faces towards the lens module, and, during testing, the turn sheet being rotated about the optical axis of the lens module; and

an image capturer provided near the other end of the barrel, the image capturer being configured for receiving an optical signal through the lens module.

10. The reflection-testing device as claimed in claim 9 , wherein the light sources and the lens module both can be moved along an optical axis of the lens module.

11. The reflection-testing device as claimed in claim 9 , wherein the light sources are one of common lamps, light-emitting diodes, and large-area light sources.

12. The reflection-testing device as claimed in claim 9 , wherein the plurality of light sources are arranged in a circle, and the inner diameter of the circle is approximately equal to the inner diameter of the barrel.

13. The reflection-testing device as claimed in claim 12 , a baffle is provided in the center of the plurality of light sources, the baffle facing towards the lens module, wherein the area of the baffle corresponds to the area of the cross section of the lens module.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 29, 2019
From: HON HAI PRECISION INDUSTRY CO., LTD.
To: POLIGHT TECHNOLOGIES LTD.
Reel/Frame 050248/0298 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 15, 2012
From: ALTUS TECHNOLOGY INC.
To: HON HAI PRECISION INDUSTRY CO., LTD.
Reel/Frame 029127/0489 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 21, 2006
From: JAO, CHING-LUNG
To: ALTUS TECHNOLOOGY INC.
Reel/Frame 018742/0086 →
Priority Claims (1)
CN 2006 1 0060235 · Apr 7, 2006 · national
Continuity (1)
Related Publication 20070236683A1 · Oct 11, 2007