IP Library Granted Patent US 7,620,868
Granted Patent B2
US 7,620,868 · App. 11/670,553 · Granted Nov 17, 2009

Method for detecting a malfunction in a state machine

Assignee: STMicroelectronics S.A.
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Quick Facts
Patent No.
US 7,620,868
App. No.
11/670,553
Granted
Nov 17, 2009
Kind
B2
Abstract

A method for detecting a malfunction in a state machine is described. The state machine has an operation modeled by a set of states linked to each other by transitions, the state machine generating, upon each transition, output signals according to input signals comprising signals generated during a previous transition. During a transition, the method comprises steps of generating at least one control signal according to a control signal generated during a previous transition, determining an expected value of the control signal, and comparing the control signal with the expected value.

Claims (47)

1. A method, comprising:

detecting a malfunction in a state machine having an operation modeled by a set of states linked to each other by transitions, the state machine generating, upon each transition, output signals according to input signals, the input signals comprising signals generated during a previous transition, by:

generating, using a processing circuit of the state machine, during a current transition at least one control signal according to a control signal generated during a previous transition;

determining during the current transition an expected value of the at least one control signal; and

comparing the at least one control signal generated with the expected value.

2. The method according to claim 1 , wherein the generating the at least one control signal further includes:

generating two logic control signals that are opposites of one another and are inverted upon each transition of the state machine.

3. The method according to claim 2 , wherein the two logic control signals are each generated according to a respective logic control signal obtained during a previous transition, and wherein the two logic control signals are obtained by the following logic operations:

D1=N[C1].C2,

D2=C1.N[C2]

in which D 1 corresponds to one of the two logic control signals and D 2 corresponds to the other of the two logic control signals, C 1 and C 2 are the respective logic control signals obtained during a previous transition, N[x] represents a logic inversion operation applied to a signal x, and “.” represents an AND logic operation.

4. The method according to claim 1 , further comprising:

generating an error signal according to a result of the comparing.

5. The method according to claim 1 , wherein the determining the expected value of the at least one control signal includes deriving the expected value from a clock signal frequency.

6. A device for detecting a malfunction in a state machine, the device comprising:

a state machine having an operation modeled by a set of states linked to each other by transitions, the state machine generating, upon each transition, output signals according to input signals, the input signals comprising signals generated during a previous transition;

a control signal generating circuit in the state machine, for generating at least one control signal during a transition of the state machine, according to a control signal generated by the control signal generating circuit during a previous transition; and

a checking circuit for determining an expected value of the at least one control signal, and comparing the at least one control signal with the expected value.

7. The device according to claim 6 , wherein the control signal generating circuit generates two logic control signals that are the opposite of one another and inverted upon each transition of the state machine.

8. The device according to claim 7 , wherein the control signal generating circuit implements the following logic operations:

D1=N[C1].C2,

D2=C1.N[C2]

in which D 1 and D 2 are each a distinct one of the two logic control signals generated during a transition in progress, C 1 and C 2 are logic control signals obtained during a previous transition, N[x] represents a logic inversion operation applied to a signal x, and “.” represents an AND logic operation.

9. The device according to claim 7 , wherein the state machine comprises a programmable logic array comprising input inverters, product logic circuits, sum logic circuits, and configuration means for selectively connecting inputs of the state machine and outputs of the input inverters to the product logic circuits, and for selectively connecting outputs of the product logic circuits to inputs of the sum logic circuits, the control signal generating circuit comprising, for each of the two logic control signals to be generated, a product logic circuit connected to a sum logic circuit supplying the logic control signal.

10. The device according to claim 9 , wherein the product logic circuits and the sum logic circuits supplying the logic control signals are configured so that the generation of the logic control signals is slowed down.

11. The device according to claim 6 , wherein the checking circuit generates an error signal according to the comparison of the at least one control signal with the expected value.

12. The device according to claim 6 , wherein the expected value of the at least one control signal is derived from a clock signal frequency.

13. A state machine having an operation modeled by a set of states linked to each other by transitions, the state machine comprising:

a logic circuit for generating, upon each transition of the state machine, output signals according to input signals the input signals comprising signals generated during a previous transition;

a control signal generating circuit for generating at least one control signal during a transition of the state machine, according to a control signal generated during a previous transition; and

a checking circuit for determining an expected value of the at least one control signal and comparing the at least one control signal with the expected value.

14. The state machine according to claim 13 , wherein the control signal generating circuit generates two logic control signals that are the opposite of one another and inverted upon each transition of the state machine.

15. The state machine according to claim 14 , in which the control signal generating circuit implements the following logic operations:

D1=N[C1].C2,

D2=C1.N[C2]

in which D 1 and D 2 are each a distinct one of the two logic control signals, C 1 and C 2 are the logic control signals obtained during a previous transition, N[x] represents a logic inversion operation applied to a signal x, and “.” represents an AND logic operation.

16. The state machine according to claim 14 , wherein the logic circuit comprises a programmable logic array comprising input inverters, product logic circuits, sum logic circuits, and configuration means for selectively connecting inputs of the state machine and outputs of the input inverters to the product logic circuits, and for selectively connecting outputs of the product logic circuits to inputs of the sum logic circuits, wherein the control signal generating circuit comprises for each of the two logic control signals a product logic circuit connected to a sum logic circuit supplying the logic control signal.

17. The state machine according to claim 16 , wherein the product logic circuits and the sum logic circuits supplying the logic control signals are configured so that the generation of the logic control signals is slowed down.

18. The state machine according to claim 13 , wherein the expected value of the at least one control signal is derived from a clock signal frequency.

19. A memory device comprising:

a memory; and

a state machine including

a control circuit configured to generate one or more secondary output control signals from the state machine based on one or more secondary input control signals previously generated by the control circuit; and

a checking circuit configured to generate and output an error signal from the state machine resulting from at least one of the one or more secondary output control signals of the state machine varying from an expected value, wherein the expected value is derived from a clock signal frequency.

20. The memory device according to claim 19 , wherein the control circuit of the state machine is configured to generate two secondary output control signals having opposite values.

21. The memory device according to claim 19 , wherein the checking circuit is configured to generate and output the error signal indicating an error in the operation of the state machine.

22. The memory device according to claim 19 , wherein the state machine is configured to have an operation modeled by a set of states linked to each other by transitions, and wherein the control circuit is farther configured to generate the one or more secondary output control signals such that each of the one or more secondary output control signals change state upon each transition of the state machine and have different values.

Assignments (2)
CHANGE OF NAME Recorded Mar 28, 2024
From: STMICROELECTRONICS SA
To: STMICROELECTRONICS FRANCE
Reel/Frame 066944/0348 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2007
From: TAILLIET, FRANCOIS; MURILLO, LAURENT
To: STMICROELECTRONICS SA
Reel/Frame 019218/0658 →
Priority Claims (1)
FR 06 00974 · Feb 3, 2006 · national
Continuity (1)
Related Publication 20070204191A1 · Aug 30, 2007