IP Library Granted Patent US 7,502,564
Granted Patent B2
US 7,502,564 · App. 11/679,800 · Granted Mar 10, 2009

Integrated memory mapped controller circuit for fiber optics transceiver

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Quick Facts
Patent No.
US 7,502,564
App. No.
11/679,800
Granted
Mar 10, 2009
Kind
B2
Abstract

Circuitry for monitoring an optoelectronic device includes memory, including one or more memory arrays for storing information related to the optoelectronic device and analog to digital conversion circuitry for: receiving a plurality of analog signals from the optoelectronic device; converting the received analog signals into digital values; and storing the digital values in memory mapped locations within the memory. The analog signals correspond to operating conditions of the optoelectronic device. The circuitry further includes a memory interface for allowing a host device to read from and write to memory mapped locations within the memory in accordance with commands received from a host device. The memory interface allows the host device to read the digital values corresponding to operating conditions of the optoelectronic device from the memory mapped locations within the memory.

Claims (59)

1. Circuitry for monitoring an optoelectronic device, comprising:

memory configured for storing information related to the optoelectronic device;

circuitry configured for: (i) receiving a plurality of analog signals from the optoelectronic device, the analog signals corresponding to current operating conditions of the optoelectronic device including a temperature of the optoelectronic device, transmitter output power, transmitter bias current, and received optical power, (ii) converting the received analog signals into digital values, and (iii) storing the digital values in memory mapped locations within the memory; and

a two-wire serial interface for allowing a host device to read from and write to individual memory mapped locations within the memory in accordance with commands and individual addresses received from the host device, wherein the interface allows the host device to read the digital values corresponding to operating conditions of the optoelectronic device from host-specified individual memory mapped locations within the memory.

2. The circuitry of claim 1 , further including:

a power supply voltage sensor coupled to the analog to digital conversion circuitry, the power supply voltage sensor generating a power level signal corresponding to a power supply voltage level of the optoelectronic device, wherein the analog to digital conversion circuitry is configured to convert the power level signal into a digital power level value and to store the digital power level value in a power level location within the memory; wherein the digital power level is readable via the interface when the host device specifies to the interface a location value corresponding to the power level location.

3. The circuitry of claim 2 , further including:

means for comparing the digital power level value with a power level limit value, generating a power level flag value based on the comparison of the digital power level value with the power level limit value, and storing the power level flag value in a power level flag location within the memory; wherein the power level flag value is readable via the interface when the host device specifies to the interface a location value corresponding to the power level flag location.

4. The circuitry of claim 1 , wherein:

the transmitter bias current is a laser bias current signal;

the analog to digital conversion circuitry is configured to convert the laser bias current signal into a digital laser bias current value and to store the digital laser bias current value in a laser bias current location within the memory; and

the digital laser bias current value is readable via the interface when the host device specifies to the interface a location value corresponding to the laser bias current location.

5. The circuitry of claim 4 , further including:

means for comparing the digital laser bias current value with a laser bias current limit value, generating a laser bias current flag value based on the comparison of the digital laser bias current value with the laser bias current limit value, and storing the laser bias current flag value in a laser bias current flag location within the memory; wherein the laser bias current flag value is readable via the interface when the host device specifies to the interface a location value corresponding to the laser bias current flag location.

6. The circuitry of claim 1 , wherein

the transmitter output power is a transmitted laser power signal;

the analog to digital conversion circuitry is configured to convert the transmitted laser power signal into a digital transmitted laser power value and to store the digital transmitted laser power value in a transmitted laser power location within the memory; and

the digital transmitted laser power value is readable via the interface when the host device specifies to the interface a location value corresponding to the transmitted laser power location.

7. The circuitry of claim 6 , further including:

means for comparing the digital transmitted laser power value with a transmitted laser power limit value, generating a transmitted laser power flag value based on the comparison of the digital transmitted laser power value with the transmitted laser power limit value, and storing the transmitted laser power flag value in a transmitted laser power flag location within the memory; wherein the transmitted laser power flag value is readable via the interface when the host device specifies to the interface a location value corresponding to the transmitted laser power flag location.

8. The circuitry of claim 1 , wherein:

the received power analog signal corresponds to received power as measured by a photodiode detector;

the analog to digital conversion circuitry is configured to convert the received power analog signal into a digital received power value and to store the digital received power value in a received power location within the memory; and

the digital received power value is readable via the interface when the host device specifies to the interface a location value corresponding to the received power location.

9. The circuitry of claim 8 , further including:

means for comparing the digital received power value with a received power limit value, generating a received power flag value based on the comparison of the digital received power value with the received power limit value, and storing the received power flag value in a received power flag location within the memory; wherein the received power flag value is readable via the interface when the host device specifies to the interface a location value corresponding to the received power flag location.

10. Circuitry for monitoring an optoelectronic device, comprising:

memory, for storing information related to the optoelectronic device;

circuitry configured for: (i) receiving a plurality of analog signals from the optoelectronic device, the analog signals corresponding to current operating conditions of the optoelectronic device including optoelectronic device temperature, laser output power, laser bias current, and received optical power analog signals, (ii) periodically converting the received analog signals into digital values, and (iii) periodically storing the digital values in memory mapped locations within the memory; and

a two-wire serial interface for allowing a host device to read from individual memory mapped locations within the memory in accordance with commands and individual addresses received from the host device, wherein the interface allows the host device to read the digital values corresponding to operating conditions of the optoelectronic device from host-specified individual memory mapped locations within the memory.

11. The circuitry of claim 10 , further including:

a power supply voltage sensor coupled to the analog to digital conversion circuitry, the power supply voltage sensor generating a power level signal corresponding to a power supply voltage level of the optoelectronic device, wherein the analog to digital conversion circuitry is configured to convert the power level signal into a digital power level value and to store the digital power level value in a power level location within the memory; wherein the digital power level is readable via the interface when the host device specifies to the interface a location value corresponding to the power level location.

12. The circuitry of claim 11 , further including:

means for comparing the digital power level value with a power level limit value, generating a power level flag value based on the comparison of the digital power level value with the power level limit value, and storing the power level flag value in a power level flag location within the memory; wherein the power level flag value is readable via the interface when the host device specifies to the interface a location value corresponding to the power level flag location.

13. The circuitry of claim 10 , wherein:

the analog to digital conversion circuitry is configured to convert the laser bias current signal into a digital laser bias current value and to store the digital laser bias current value in a laser bias current location within the memory; and

the digital laser bias current value is readable via the interface when the host device specifies to the interface a location value corresponding to the laser bias current location.

14. The circuitry of claim 13 , further including:

means for comparing the digital laser bias current value with a laser bias current limit value, generating a laser bias current flag value based on the comparison of the digital laser bias current value with the laser bias current limit value, and storing the laser bias current flag value in a laser bias current flag location within the memory; wherein the laser bias current flag value is readable via the interface when the host device specifies to the interface a location value corresponding to the laser bias current flag location.

15. The circuitry of claim 10 , wherein

the plurality of analog signals comprises a transmitted laser power signal;

the analog to digital conversion circuitry is configured to convert the transmitted laser power signal into a digital transmitted laser power value and to store the digital transmitted laser power value in a transmitted laser power location within the memory; and

the digital transmitted laser power value is readable via the interface when the host device specifies to the interface a location value corresponding to the transmitted laser power location.

16. The circuitry of claim 15 , further including:

means for comparing the digital transmitted laser power value with a transmitted laser power limit value, generating a transmitted laser power flag value based on the comparison of the digital transmitted laser power value with the transmitted laser power limit value, and storing the transmitted laser power flag value in a transmitted laser power flag location within the memory; wherein the transmitted laser power flag value is readable via the interface when the host device specifies to the interface a location value corresponding to the transmitted laser power flag location.

17. The circuitry of claim 10 , wherein:

the plurality of analog signals comprises a received power signal corresponding to received power as measured by a photodiode detector;

the analog to digital conversion circuitry is configured to convert the received power signal into a digital received power value and to store the digital received power value in a received power location within the memory; and

the digital received power value is readable via the interface when the host device specifies to the interface a location value corresponding to the received power location.

18. The circuitry of claim 17 , further including:

means for comparing the digital received power value with a received power limit value, generating a received power flag value based on the comparison of the digital received power value with the received power limit value, and storing the received power flag value in a received power flag location within the memory; wherein the received power flag value is readable via the interface when the host device specifies to the interface a location value corresponding to the received power flag location.

19. The circuitry of claim 10 , further comprising circuitry for: (i) comparing the digital values with threshold values to generate flags if the thresholds have been exceeded, and (ii) for storing the flags in predefined memory mapped locations in the memory, wherein the host is able to read the flags from the memory mapped locations.

20. The circuitry of claim 19 , wherein a certain flag is defined as an end of life indicator.

21. The circuitry of claim 20 , wherein the end of life indicator is a higher than expected bias current at a constant power.

22. The circuitry of claim 19 , wherein the threshold values exist for each of the temperature of the optoelectronic device, transmitter output power, transmitter bias current, and received optical power.

23. The circuitry of claim 10 , further comprising a memory mapped location in memory for a transmitter disable value.

24. The circuitry of claim 10 , further comprising a memory mapped location in memory for a receiver rate select value.

25. The circuitry of claim 10 , further comprising a memory mapped location in memory for a transmitter fault value.

26. The circuitry of claim 10 , further comprising a memory mapped location in memory for a loss of signal value.

Assignments (6)
PATENT RELEASE AND REASSIGNMENT Recorded Jul 5, 2022
From: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
To: II-VI INCORPORATED; MARLOW INDUSTRIES, INC.; EPIWORKS, INC.; LIGHTSMYTH TECHNOLOGIES, INC.; KAILIGHT PHOTONICS, INC.; COADNA PHOTONICS, INC.; OPTIUM CORPORATION; FINISAR CORPORATION; II-VI OPTICAL SYSTEMS, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; II-VI DELAWARE, INC.; II-VI OPTOELECTRONIC DEVICES, INC.; PHOTOP TECHNOLOGIES, INC.
Reel/Frame 060574/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2020
From: FINISAR CORPORATION
To: II-VI DELAWARE, INC.
Reel/Frame 052286/0001 →
NOTICE OF GRANT OF SECURITY INTEREST IN PATENTS Recorded Sep 25, 2019
From: II-VI INCORPORATED; MARLOW INDUSTRIES, INC.; EPIWORKS, INC.; LIGHTSMYTH TECHNOLOGIES, INC.; KAILIGHT PHOTONICS, INC.; COADNA PHOTONICS, INC.; OPTIUM CORPORATION; FINISAR CORPORATION; II-VI OPTICAL SYSTEMS, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; II-VI DELAWARE, INC.; II-VI OPTOELECTRONIC DEVICES, INC.; PHOTOP TECHNOLOGIES, INC.
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 050484/0204 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 22, 2019
From: ARONSON, LEWIS B.; HOSKING, STEPHEN G.
To: FINISAR CORPORATION
Reel/Frame 049258/0465 →
RELEASE OF SECURITY INTEREST Recorded Oct 6, 2016
From: WELLS FARGO CAPITAL FINANCE, LLC
To: FINISAR CORPORATION; OPTIUM CORPORATION; AZNA LLC; FINISAR SALES, INC.; KAILIGHT PHOTONICS, INC.
Reel/Frame 040248/0860 →
SECURITY AGREEMENT Recorded Nov 10, 2009
From: FINISAR CORPORATION; OPTIUM CORPORATION; AZNA LLC; FINISAR SALES, INC.; KAILIGHT PHOTONICS, INC.
To: WELLS FARGO FOOTHILL, LLC, AS AGENT
Reel/Frame 023486/0741 →