Semiconductor structure with a plastic housing and separable carrier plate

1. A semiconductor structure, comprising:

a earner plate;

a thermosensitive adhesive coupled to a top surface of the carrier plate, the thermosensitive adhesive being removable from the carrier plate at a predetermined, defined temperature at which the thermosensitive adhesive loses its adhesive action;

a plurality of semiconductor chips having active top surfaces and back surfaces, the active top surfaces including contact surfaces disposed on the thermosensitive adhesive;

a common carrier comprising a plastic embedding compound on the carrier plate, the semiconductor chips being embedded in the plastic embedding compound; and

an adhesive film laminated to the top surface of the carrier plate, the adhesive film being provided with the thermosensitive adhesive on a side facing away from the carrier plate and being provided with a permanent adhesive on a side facing the carrier plate.

2. The semiconductor structure of claim 1 , wherein the carrier plate comprises a material that is dimensionally stable in a temperature range from 20° C. to 200° C., has a low coefficient of thermal expansion, and is provided with a thermosensitive adhesive on its top surface.

3. The semiconductor structure of claim 2 , wherein the dimensionally stable material has a coefficient of thermal expansion α<10·10 −6 /K at room temperature.

4. The semiconductor structure of claim 2 , wherein the dimensionally stable material has a thermal conductivity σ>100 W/mK at room temperature.

5. The semiconductor structure of claim 2 , wherein the dimensionally stable material provided is a ceramic.

6. The semiconductor structure of claim 2 , wherein the dimensionally stable material provided is a metal or an alloy.

7. The semiconductor structure of claim 2 , wherein the dimensionally stable material provided is glass or silicon.

8. A semiconductor structure, comprising:

a carrier plate;

a thermosensitive adhesive coupled to a top surface of the carrier plate, the thermosensitive adhesive being removable from the carrier plate at a predetermined, defined temperature at which the thermosensitive adhesive loses its adhesive action;

a plurality of semiconductor chips having active top surfaces and back surfaces, the active top surfaces including contact surfaces disposed on the thermosensitive adhesive;

a common carrier comprising a plastic embedding compound on the carrier plate, the semiconductor chips being embedded in the plastic embedding compound; and

an adhesive film laminated to the top surface of the carrier plate, the adhesive film including a permanent adhesive on a side facing away from the carrier plate and including the thermosensitive adhesive on a side facing the carrier plate.

9. The semiconductor structure of claim 8 , wherein the thermosensitive adhesive is in direct contact with the top surface of the carrier plate.

10. A semiconductor structure, comprising:

a earner plate;

a plurality of semiconductor chips having active top surfaces and back surfaces, the active top surfaces including contact surfaces;

a common carrier comprising a plastic embedding compound on the carrier plate, the semiconductor chips being embedded in the plastic embedding compound;

a thermosensitive adhesive disposed between the carrier plate and the plastic embedding compound of the common carrier, wherein the contact surfaces of the semiconductor chips are disposed on the thermosensitive adhesive and the thermosensitive adhesive is removable from the carrier plate at a predetermined, defined temperature at which the thermosensitive adhesive loses its adhesive action; and

an adhesive film laminated to the top surface of the carrier plate, the adhesive film including a permanent adhesive on a side facing away from the carrier plate and including the thermosensitive adhesive on a side facing the carrier plate.

11. The semiconductor structure of claim 10 , wherein the carrier plate comprises a material that is dimensionally stable in a temperature range from 20° C. to 200° C., has a low coefficient of thermal expansion, and is provided with a thermosensitive adhesive on its top surface.

12. The semiconductor structure of claim 11 , wherein the dimensionally stable material has a coefficient of thermal expansion α<10·10 −6 /K at room temperature.

13. The semiconductor structure of claim 11 , wherein the dimensionally stable material has a thermal conductivity σ>100 W/mK at room temperature.

14. The semiconductor structure of claim 11 , wherein the dimensionally stable material provided is a ceramic.

15. The semiconductor structure of claim 11 , wherein the dimensionally stable material provided is a metal or an alloy.

16. The semiconductor structure of claim 11 , wherein the dimensionally stable material provided is glass or silicon.

17. A semiconductor structure, comprising:

a carrier plate;

a plurality of semiconductor chips having active top surfaces and back surfaces, the active top surfaces including contact surfaces;

a common carrier comprising a plastic embedding compound on the carrier plate, the semiconductor chips being embedded in the plastic embedding compound;

a thermosensitive adhesive disposed between the carrier plate and the plastic embedding compound of the common carrier, wherein the contact surfaces of the semiconductor chips are disposed on the thermosensitive adhesive and the thermosensitive adhesive is removable from the carrier plate at a predetermined, defined temperature at which the thermosensitive adhesive loses its adhesive action; and

an adhesive film laminated to the top surface of the carrier plate, the adhesive film being provided with the thermosensitive adhesive on a side facing away from the carrier plate and being provided with a permanent adhesive on a side facing the carrier plate.

18. The semiconductor structure of claim 10 , wherein the thermosensitive adhesive is in direct contact with the top surface of the carrier plate.