IP Library Granted Patent US 7,564,548
Granted Patent B2
US 7,564,548 · App. 11/692,625 · Granted Jul 21, 2009

Low pixel count tunable laser raman spectroscopy system and method

Assignee: Axsun Technologies, Inc.
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Quick Facts
Patent No.
US 7,564,548
App. No.
11/692,625
Granted
Jul 21, 2009
Kind
B2
Abstract

A Raman system uses a semiconductor tunable laser subsystem to generate a tunable signal that is tuned over a scan band of greater than 50 nanometers. A probe system transmits the tunable signal to a sample. Finally a detector system comprises a bandpass filter for filtering a Raman signal from the sample generated by the tunable signal, and a detector for detecting the filtered Raman signal.

Claims (74)

1. A Raman system comprising:

a semiconductor tunable laser subsystem for generating a tunable signal that is tuned over a scan band of greater than 50 nanometers;

a probe system for transmitting the tunable signal to a sample; and

a detector system, comprising a bandpass filter for filtering a Raman signal from the sample generated by the tunable signal and a detector for detecting the filtered Raman signal.

2. A system as claimed in claim 1 , wherein the semiconductor tunable laser subsystem comprises a semiconductor optical amplifier and a wavelength tunable element.

3. A system as claimed in claim 2 , wherein the wavelength tunable element is integrated on a common optical bench in a common hermetic package with the semiconductor optical amplifier.

4. A system as claimed in claim 1 , wherein the probe system comprises a wavelength reference detector for determining an instantaneous wavelength of the tunable signal.

5. A system as claimed in claim 1 , wherein the probe system comprises an amplitude reference detector for determining amplitude of the tunable signal.

6. A system as claimed in claim 1 , further comprising a controller for controlling the semiconductor tunable laser subsystem and monitoring the response of the detector to determine a Raman spectral response of the sample.

7. A system as claimed in claim 6 , further comprising a housing for the Raman system and containing the semiconductor tunable laser subsystem, the probe system, the detector system, and the controller.

8. A system as claimed in claim 7 , further comprising a display on the housing for providing a user interface to an operator of the system.

9. A system as claimed in claim 7 , further comprising a thermoelectric cooler in the housing for controlling a temperature of the semiconductor tunable laser subsystem.

10. A system as claimed in claim 7 , further comprising a thermoelectric cooler in the housing for controlling a temperature of the detector.

11. A system as claimed in claim 7 , further comprising a single thermoelectric cooler for controlling a temperature of the semiconductor tunable laser subsystem and detector.

12. A system as claimed in claim 7 , further comprising printed circuit board to which the semiconductor tunable laser subsystem, the probe system, the detector system, and the controller are attached.

13. A system as claimed in claim 7 , further comprising a wireless interface used by the controller to transmit information to a host computer.

14. A system as claimed in claim 1 , wherein the scan band is greater than 100 nanometers.

15. A system as claimed in claim 1 , wherein the scan band is greater than 200 nanometers.

16. A system as claimed in claim 1 , wherein the scan band is greater than 250 nanometers.

17. A method for obtaining and using a Raman response, comprising:

generating a tunable signal with a semiconductor tunable laser;

varying a wavelength of the tunable signal over a scan band of greater than 50 nanometers;

transmitting the tunable signal to a sample;

bandpass filtering a Raman signal from the sample generated by the tunable signal;

detecting the filtered Raman signal with a detector; and

analyzing the sample in response to the detector.

18. A method as claimed in claim 17 , further comprising determining an instantaneous wavelength of the tunable signal.

19. A method as claimed in claim 17 , further comprising determining an amplitude of the tunable signal.

20. A method as claimed in claim 17 , further comprising scanning the tunable signal and monitoring the response of the detector to determine a Raman spectral response of the sample.

21. A method as claimed in claim 17 , further comprising wirelessly transmitting information concerning the analysis of the sample to a host computer.

22. A method as claimed in claim 17 , wherein the step of varying the wavelength comprises varying the wavelength of the tunable signal over a scan band of greater than 100 nanometers.

23. A method as claimed in claim 17 , wherein the step of varying the wavelength comprises varying the wavelength of the tunable signal over a scan band of greater than 200 nanometers.

24. A method as claimed in claim 17 , wherein the step of varying the wavelength comprises varying the wavelength of the tunable signal over a scan band of greater than 250 nanometers.

25. A Raman analysis system comprising:

a semiconductor tunable laser subsystem for generating a tunable signal that is tuned over a spectral scan band;

a Raman sample that generates the Raman signal from the tunable signal;

a detector system, comprising a bandpass filter for filtering a Raman signal from the Raman sample generated by the tunable signal and a detector for detecting the filtered Raman signal; and

a controller that uses the Raman signal from the Raman sample to determine an authenticity of an article with which the Raman sample is associated.

26. A system as claimed in claim 25 , wherein the Raman sample is embedded in the article.

27. A system as claimed in claim 25 , wherein the Raman sample is part of a bar code label of the article.

28. A system as claimed in claim 25 , wherein the Raman sample is in a strip on the article.

29. A system as claimed in claim 25 , wherein the Raman sample is in a dot on the article.

30. A Raman analysis system comprising:

a semiconductor tunable laser subsystem for generating a tunable signal that is tuned over a spectral scan band;

a Raman sample that generates the Raman signal from the tunable signal; and

a detector system, comprising a bandpass filter for filtering a Raman signal from the Raman sample generated by the tunable signal and a detector for detecting the filtered Raman signal; and

wherein the Raman sample is in communication with a body of a user of the system.

31. A Raman analysis system comprising:

a semiconductor tunable laser subsystem for generating a tunable signal that is tuned over a spectral scan band;

a Raman sample that generates the Raman signal from the tunable signal; and

a detector system, comprising a bandpass filter for filtering a Raman signal from the Raman sample generated by the tunable signal and a detector for detecting the filtered Raman signal; and

wherein the Raman sample is in communication with blood of a user of the system.

32. A Raman analysis system comprising:

a semiconductor tunable laser subsystem for generating a tunable signal that is tuned over a spectral scan band;

a Raman sample that generates the Raman signal from the tunable signal; and

a detector system, comprising a bandpass filter for filtering a Raman signal from the Raman sample generated by the tunable signal and a detector for detecting the filtered Raman signal; and

wherein the Raman sample is in communication with sweat of a user of the system.

33. A system as claimed in claim 25 , further comprising a wireless interface for transmitting Raman information gathered from the sample to a remote host computer.

34. A Raman system comprising:

a semiconductor tunable laser subsystem for generating a tunable signal that is tuned over a scan band;

a probe system for transmitting the tunable signal to a sample; and

a detector system, comprising a bandpass filter for filtering a Raman signal from the sample generated by the tunable signal and a detector for detecting the filtered Raman signal;

a controller that is responsive to the detector system and controls the semiconductor tunable laser system to scan over subbands within the scan band at which spectral features in the Raman signal are detected by the detector system.

35. A system as claimed in claim 34 , wherein the controller dithers the semiconductor tunable laser system in the subbands.

36. A system as claimed in claim 34 , wherein the spectral features are peaks in the Raman signal.

37. A method for obtaining and using a Raman response, comprising:

generating a tunable signal with a semiconductor tunable laser;

varying a wavelength of the tunable signal over a scan band;

transmitting the tunable signal to a sample;

bandpass filtering a Raman signal from the sample generated by the tunable signal;

detecting the filtered Raman signal with a detector;

analyzing the sample in response to the detector;

varying the wavelength of the tunable signal over sub-bands within the scan band to detect Raman features of interest; and

generating a composite Raman signal having higher resolution spectral information for the Raman features of interest.

Assignments (8)
RELEASE OF FIRST LIEN SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Aug 12, 2022
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: AXSUN TECHNOLOGIES, INC.
Reel/Frame 061161/0854 →
RELEASE OF SECOND LIEN SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Aug 12, 2022
From: ROYAL BANK OF CANADA, AS COLLATERAL AGENT
To: AXSUN TECHNOLOGIES, INC.
Reel/Frame 061161/0942 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 11, 2020
From: AXSUN TECHNOLOGIES INC.
To: EXCELITAS TECHNOLOGIES CORP.
Reel/Frame 054698/0911 →
FIRST LIEN INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Jan 2, 2019
From: AXSUN TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 048000/0692 →
SECOND LIEN INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Jan 2, 2019
From: AXSUN TECHNOLOGIES, INC.
To: ROYAL BANK OF CANADA, AS COLLATERAL AGENT
Reel/Frame 048000/0711 →
CHANGE OF NAME Recorded Aug 31, 2017
From: AXSUN TECHNOLOGIES, LLC
To: AXSUN TECHNOLOGIES, INC.
Reel/Frame 043733/0195 →
CHANGE OF NAME Recorded Feb 24, 2016
From: AXSUN TECHNOLOGIES, INC.
To: AXSUN TECHNOLOGIES LLC
Reel/Frame 037901/0152 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 23, 2007
From: FLANDERS, DALE C.; KOTIDIS, PETROS; WANG, XIAOMEI
To: AXSUN TECHNOLOGIES, INC.
Reel/Frame 019739/0650 →
Continuity (3)
Provisional Application 6074386100 · Mar 28, 2006
Provisional Application 6086785800 · Nov 30, 2006
Related Publication 20080030726A1 · Feb 7, 2008