IP Library Granted Patent US 7,687,376
Granted Patent B2
US 7,687,376 · App. 11/697,537 · Granted Mar 30, 2010

Method of manufacturing vertical gallium nitride-based light emitting diode

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Quick Facts
Patent No.
US 7,687,376
App. No.
11/697,537
Granted
Mar 30, 2010
Kind
B2
Abstract

A method of manufacturing a vertical GaN-based LED comprises preparing an n-type GaN substrate; sequentially forming an active layer and a p-type nitride semiconductor layer on the n-type GaN substrate through an epitaxial growth method; forming a p-electrode on the p-type nitride semiconductor layer; wet-etching the lower surface of the n-type GaN substrate so as to reduce the thickness of the n-type GaN substrate; forming a flat n-type bonding pad on the wet-etched lower surface of the n-type GaN substrate, the n-type bonding pad defining an n-electrode formation region; and forming an n-electrode on the n-type bonding pad.

Claims (21)

1. A method of manufacturing a vertical GaN-based LED comprising:

preparing an n-type GaN substrate;

sequentially forming an active layer and a p-type nitride semiconductor layer on the n-type GaN substrate through an epitaxial growth method;

forming a p-electrode on the p-type nitride semiconductor layer;

forming a p-type bonding pad on the p-electrode and forming a substrate support layer on the resulting structure in which the p-type bonding pad is formed, before the wet-etching of the n-type GaN substrate;

wet-etching the lower surface of the n-type GaN substrate so as to reduce the thickness of the n-type GaN substrate;

forming a flat n-type bonding pad on the wet-etched lower surface of the n-type GaN substrate, the n-type bonding pad defining an n-electrode formation region; and

forming an n-electrode on the n-type bonding pad;

wherein the active layer and the p-type nitride semiconductor layer have a lattice constant close to the lattice constant of the n-type GaN substrate: and

wherein forming the n-type bonding pad includes a plating method.

2. The method according to claim 1 ,

wherein the wet-etching of the n-type GaN substrate is performed so that surface irregularities are formed on the lower surface of the n-type GaN substrate.

3. The method according to claim 1 further comprising forming an n-type nitride semiconductor layer before the forming of the active layer.

4. The method according to claim 1 , wherein the substrate support layer is formed by using a plating method.

5. The method according to claim 2 ,

wherein the surface irregularities are formed to have a height of more than 1 μ m.

6. The method according to claim 2 ,

wherein the wet-etching of the n-type GaN substrate is performed by any one selected from the group consisting of a chemical wet etching method, an electro-chemical wet etching method, and an optical chemical wet etching method or may be performed by a combination of more than two wet etching methods.

7. The method according to claim 6 , wherein the wet-etching is performed by using an etching solution such as KOH or H 3 PO 4 solution.

8. The method according to claim 7 ,

wherein the wet etching is performed by using an etching solution having temperature of more than 50° C.

Assignments (3)
MERGER Recorded Aug 7, 2012
From: SAMSUNG LED CO., LTD.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 028744/0272 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 14, 2010
From: SAMSUNG ELECTRO-MECHANICS CO., LTD.
To: SAMSUNG LED CO., LTD.
Reel/Frame 024380/0559 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 6, 2007
From: CHOI, PUN JAE; LEE, JONG HO
To: SAMSUNG ELECTRO-MECHANICS CO., LTD.
Reel/Frame 019128/0029 →