Plasma insensitive height sensing
View Patent ↗A method for determining a distance between a first piece and a second piece includes measuring, at the first or second piece, a first signal at a first frequency, and measuring, at the first or second piece, a second signal at a second frequency. The second frequency is different from the first frequency. The distance is determined based on the measured first and second signals.
1. A method for determining a distance between pieces of a thermal processing system using a processor or an electronic circuit, the method comprising:
directing a laser beam or a plasma arc on to a first or a second piece;
applying, using the processor or electronic circuit, at the first or second piece, a source AC signal different from a source signal of the laser beam or the plasma arc, the source AC signal including a source DC offset;
measuring, using the processor or electronic circuit, at the first or second piece, an AC signal generated by the source AC signal that is different from the source signal of the laser beam or the plasma arc, the AC signal including a DC offset; and
determining, using the processor or electronic circuit, the distance using a calibration data set that includes data values associated with the measured AC signal and the source AC signal that is different from the source signal of the laser beam or the plasma arc, deriving the distance by calculating a gap capacitance between the first piece and the second piece, the derived gap capacitance is a function of at least the measured AC signal and the source AC signal, wherein the calibration data set further includes the gap capacitance.
2. The method of claim 1 , wherein the first piece comprises a torch component and the second piece comprises a workpiece.
3. The method of claim 2 , wherein the torch component comprises a nozzle or a torch head.
4. The method of claim 1 , wherein determining the gap capacitance is derived from: a frequency of the AC signal, a magnitude of the AC signal, a magnitude of the DC offset, a magnitude of the source AC signal, a magnitude of the source DC offset, or any combination thereof.
5. The method of claim 1 , wherein the AC signal comprises:
a current signal or a voltage signal.
6. The method of claim 1 , wherein measuring the AC signal comprises passing the AC signal through a high band-pass filter, the high band-pass filter attenuating the DC offset.
7. The method of claim 6 , wherein measuring the AC signal comprises measuring the DC offset by passing the AC signal through a low band-pass filter.
8. The method of claim 1 further comprising determining a plasma resistance between the first piece and the second piece based on the measured AC signal and the source AC signal.
9. The method of claim 1 , wherein the source AC signal comprises: a current source signal or a voltage source signal.
10. The method of claim 1 , wherein the calibration data set comprises data values associated with: a frequency of the AC signal, a magnitude of the AC signal, a magnitude of the DC offset, a magnitude of the source AC signal, a magnitude of the source DC offset, or any combination thereof.
11. The method of claim 1 , wherein measuring the AC signal comprises measuring the AC signal at a position after a known electrical element, the known electrical element being located between the position and a source of the source AC signal.
12. A system for determining a distance between pieces of a thermal processing system, the system comprising:
a source adapted to apply, at a first or a second piece, a source AC signal different from a source signal of a laser beam or a plasma arc directed on the first or the second piece, the source AC signal including a source DC offset;
a measuring device adapted to measure, at one or both of the first and second piece, an AC signal generated by the source AC signal different from the source signal of the laser beam or the plasma arc, the AC signal including a DC offset; and
a signal processing device adapted to determine the distance using a calibration data set that includes data values associated with the measured AC signal and the source AC signal different from the source signal of the laser beam or the plasma arc, deriving the distance by calculating a gap capacitance between the first piece and the second piece, the derived gap capacitance is a function of at least the measured AC signal and the source AC signal, wherein the calibration data set further includes the gap capacitance.
13. The system of claim 12 , wherein the first piece comprises a torch component and the second piece comprises a workpiece.
14. The system of claim 12 further comprising:
a high band-pass filter adapted to attenuate the DC offset; and
a low band-pass filter adapted to pass the DC offset.
15. The system of claim 12 , wherein the measuring device is further adapted to measure the AC signal at a position after a known electrical element, the known electrical element being located between the position and the source.
16. A system for performing a capacitive distance measurement between pieces of a thermal processing system, the system comprising:
source means for applying, at a first or a second piece, a source AC signal different from a source signal of a laser beam or a plasma arc directed on the first or the second piece, the source AC signal including a source DC offset;
measuring means for measuring, at the first or second piece, an AC signal generated by the source AC signal different from the source signal of the laser beam or the plasma arc, the AC signal including a DC offset; and
signal processing means for determining the distance using a calibration data set that includes data values associated with the measured AC signal and the source AC signal different from the source signal of the laser beam or the plasma arc, deriving the distance by calculating a gap capacitance between the first piece and the second piece, the derived gap capacitance is a function of at least the measured AC signal and the source AC signal, wherein the calibration data set further includes the gap capacitance.
17. The system of claim 16 , wherein the first piece comprises a torch component and the second piece comprises a workpiece.
18. The system of claim 16 further comprising:
high-pass filtering means for attenuating the DC offset; and
low-pass filtering means for passing the DC offset.
19. An apparatus for determining a distance between a first piece and a second piece, the apparatus adapted to utilize the method of claim 1 .
20. The method of claim 3 , wherein the nozzle comprises a laser nozzle.