IP Library Granted Patent US 7,728,426
Granted Patent B2
US 7,728,426 · App. 11/702,151 · Granted Jun 1, 2010

Semiconductor device

Assignee: Oki Semiconductor Co., Ltd.
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Quick Facts
Patent No.
US 7,728,426
App. No.
11/702,151
Granted
Jun 1, 2010
Kind
B2
Abstract

A semiconductor device 10 includes a silicon substrate 20 having a first interconnection layer 24 , a second interconnection layer 26 , and grooves 22 provided at the second main surface 20 b . Mounted on the substrate 20 are one or more semiconductor chips 30 having chip external terminals 32 electrically connected to the first interconnection layer; and one or more peripheral chips 40 electrically connected to the first interconnection layer on the silicon substrate. By the provision of the grooves 22 , the heat radiating property is improved.

Claims (30)

1. A semiconductor device comprising:

a substrate having

a first main surface having a chip mounting portion,

a second main surface opposite to the first main surface,

a first insulating film provided on the first main surface,

a first interconnection layer including a plurality of interconnection conductors extending over the first insulating film,

a second insulating film provided on the second main surface,

a second interconnection layer including a plurality of interconnection conductors extending over the second insulating film,

through holes extending from the first main surface to the second main surface, and open at the first insulating film and the second insulating film,

contacts filling the through holes and being electrically connected to the first interconnection layer and the second interconnection layer,

a plurality of substrate external terminals electrically connected to the second interconnection layer, and

at least one groove provided at the second main surface, said groove being provided in at least a portion of said second main surface opposite to said chip mounting portion of said first main surface;

one or more semiconductor chips mounted in said chip mounting portion of said first main surface, each of said semiconductor chips having a front surface, a rear surface opposite to the front surface, and chip external terminals provided on the rear surface and electrically connected to the first interconnection layer on the substrate;

one or more peripheral chips electrically connected to the first interconnection layer on the substrate; and

a heat radiating member covering the second main surface and the inner surface of the groove.

2. The semiconductor device as set forth in claim 1 , wherein the substrate is a silicon substrate.

3. The semiconductor device as set forth in claim 1 , wherein

two or more grooves are provided,

the two or more grooves extend linearly, and

one of the grooves extends in a first direction and the other of the grooves extends in a second direction perpendicular to the first direction.

4. The semiconductor device as set forth in claim 1 , wherein a plurality of the grooves are provided, and the grooves have the same width and the same depth.

5. The semiconductor device as set forth in claim 1 , wherein said at least one groove is provided in an area including an area directly under the area where the semiconductor chip is mounted.

6. The semiconductor device as set forth in claim 1 , wherein said at least one groove extends perpendicular to a linearly arranged row of the substrate external terminals, and the width of said groove is narrower than the distance between the substrate external terminals in each of the rows of the substrate external terminals.

7. The semiconductor device as set forth in claim 1 , wherein

a plurality of the grooves are provided, and extend perpendicular to a linearly arranged row of the substrate external terminals, and extend through the respective spaces between adjacent ones of the substrate external terminals in each of the rows of the substrate external terminals, and

the width of each groove is narrower than the distance between the substrate external terminals in each of the rows of the substrate external terminals.

8. The semiconductor device as set forth in claim 1 , wherein the depth of the groove is not more than one third of the thickness of the substrate.

9. The semiconductor device as set forth in claim 1 , wherein the peripheral chips include an element selected from a group of elements consisting of a capacitor element, a resistive element, and an inductor element.

10. The semiconductor device as set forth in claim 1 , wherein said heat radiating member is a sheet member.

11. The semiconductor device as set forth in claim 1 , wherein the heat radiating member is a heat radiating layer formed by applying a liquid material, and drying to form a coated film.

Assignments (3)
CHANGE OF NAME Recorded Mar 21, 2014
From: OKI SEMICONDUCTOR CO., LTD
To: LAPIS SEMICONDUCTOR CO., LTD.
Reel/Frame 032495/0483 →
CHANGE OF NAME Recorded Jan 16, 2009
From: OKI ELECTRIC INDUSTRY CO., LTD.
To: OKI SEMICONDUCTOR CO., LTD.
Reel/Frame 022162/0586 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 5, 2007
From: SHIRAISHI, YASUSHI
To: OKI ELECTRIC INDUSTRY CO., LTD.
Reel/Frame 018967/0067 →
Priority Claims (1)
JP 2006-062839 · Mar 8, 2006 · national
Continuity (1)
Related Publication 20070210378A1 · Sep 13, 2007