IP Library Granted Patent US 7,427,891
Granted Patent B2
US 7,427,891 · App. 11/709,915 · Granted Sep 23, 2008

Charge pump-type booster circuit

Assignee: Seiko Instruments Inc.
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Quick Facts
Patent No.
US 7,427,891
App. No.
11/709,915
Granted
Sep 23, 2008
Kind
B2
Abstract

Provided is a charge pump circuit whose power efficiency is not reduced even when a threshold voltage of a transistor is increased by a substrate effect with an increase in the number of stages. A depletion transistor is used as an N-channel transistor included in an inverter of a high-voltage clock generating circuit. A P-channel enhancement transistor is used as a charge transfer device.

Claims (9)

1. A charge pump circuit, comprising:

charge transfer transistors connected in series between a voltage input terminal and a voltage output terminal;

coupling capacitors each having one terminal connected with a connection point between the adjacent charge transfer transistors;

a clock generating circuit for alternately inputting clocks whose phases are reversed to each other to the other terminals of the coupling capacitors; and

inverters, each of which includes an N-channel depletion transistor and a P-channel enhancement transistor, for controlling gates of the charge transfer transistors based on signals at the one terminals of the coupling capacitors.

2. A charge pump circuit according to claim 1 , wherein each of the charge transfer transistors comprises an N-channel enhancement transistor.

3. A charge pump circuit according to claim 2 , wherein each of charge transfer transistors located at an nth-stage, in which n is an integer equal to or larger than 2, and subsequent stages comprises a P-channel enhancement transistor.

4. A charge pump circuit according to claim 1 , wherein each of inverters located at an mth-stage, in which m is an integer equal to or larger than 2, and stages previous thereto comprises an N-channel enhancement transistor and a P-channel enhancement transistor.

5. A charge pump circuit according to claim 1 , further comprising an input voltage limiting circuit for limiting an input voltage, which is provided on an input side of a charge transfer transistor located at a first stage.

Assignments (5)
CHANGE OF ADDRESS Recorded Jun 8, 2023
From: ABLIC INC.
To: ABLIC INC.
Reel/Frame 064021/0575 →
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 037783 FRAME: 0166. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Feb 23, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 037903/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION .
Reel/Frame 037783/0166 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 12, 2007
From: SAKURAI, ATSUSHI; SATO, YUTAKA
To: SEIKO INSTRUMENTS INC.
Reel/Frame 019457/0569 →
Priority Claims (1)
JP 2006-044818 · Feb 22, 2006 · national
Continuity (1)
Related Publication 20070273431A1 · Nov 29, 2007