Semiconductor memory device changing refresh interval depending on temperature
View Patent ↗A semiconductor memory device includes a memory core circuit having memory cells for storing data, a circuit configured to refresh the memory core circuit at a refresh interval, a temperature detecting unit configured to detect temperature, and a control circuit configured to shorten the refresh interval immediately in response to detection of a predetermined temperature rise by the temperature detecting unit and to elongate the refresh interval after refreshing every one of the memory cells at least once in response to detection of a temperature drop by the temperature detecting unit.
1. A semiconductor memory device comprising:
a memory core circuit having memory cells for storing data;
a circuit configured to refresh said memory core circuit at a refresh interval;
a temperature detecting unit configured to detect temperature;
a control circuit configured to elongate the refresh interval in response to detection of a temperature drop by said temperature detecting unit after refreshing every one of the memory cells at least once following the detection of the temperature drop.
2. The semiconductor memory device as claimed in claim 1 , wherein said control circuit shortens the refresh interval in response to detection of a predetermined temperature rise by said temperature detecting unit.
3. The semiconductor memory device as claimed in claim 1 , wherein said control circuit elongates the refresh interval based on the detected temperature and a signal indicating a start of refresh.
4. The semiconductor memory device as claimed in claim 1 , wherein said control circuit includes a counter circuit that starts counting when the drop is detected and elongates the refresh interval after reaching a predetermined count value.
5. The semiconductor memory device as claimed in claim 1 , wherein said control circuit includes a memory circuit that stores a refresh address when the drop is detected.
6. The semiconductor memory device as claimed in claim 5 , wherein the control circuit elongates the refresh interval when a new refresh address is coincident with the refresh address in the memory circuit.
7. A memory system comprising:
a unit configured to output a address; and
a DRAM device configured to receive the address from the unit and configured to execute a refresh operation;
wherein the DRAM device comprising:
a memory core circuit having memory cells for storing data;
a circuit configured to refresh said memory core circuit at a refresh interval;
a temperature detecting unit configured to detect temperature;
a control circuit configured to elongate the refresh interval in response to detection of a temperature drop by said temperature detecting unit after refreshing every one of the memory cells at least once following the detection of the temperature drop.
8. The memory system as claimed in claim 7 , wherein said control circuit shortens the refresh interval in response to detection of a predetermined temperature rise by said temperature detecting unit.
9. The memory system as claimed in claim 7 , wherein said control circuit elongates the refresh interval based on the detected temperature and a signal indicating a start of refresh.
10. The memory system as claimed in claim 7 , wherein said control circuit includes a counter circuit that starts counting when the drop is detected and elongates the refresh interval after reaching a predetermined count value.
11. The memory system as claimed in claim 7 , wherein said control circuit includes a memory circuit that stores a refresh address when the drop is detected.
12. A semiconductor memory device comprising:
a memory core circuit having memory cells for storing data;
a circuit configured to refresh said memory core circuit at a refresh interval;
a temperature detecting unit configured to detect temperature; and
a control circuit configured to elongate the refresh interval after refreshing every one of the memory cells at least once in response to detection of a temperature drop by said temperature detecting unit,
wherein said control circuit includes a counter circuit that starts counting when the drop is detected and elongates after reaching a predetermined count value.
13. A semiconductor memory device comprising:
a memory core circuit having memory cells for storing data;
a circuit configured to refresh said memory core circuit at a refresh interval;
a temperature detecting unit configured to detect temperature; and
a control circuit configured to elongate the refresh interval after refreshing every one of the memory cells at least once in response to detection of a temperature drop by said temperature detecting unit,
wherein said control circuit includes a memory circuit that stores a refresh address when the drop is detected.
wherein the control circuit elongates when a new refresh address is coincident with the refresh address in the memory circuit.