IP Library Granted Patent US 7,576,866
Granted Patent B2
US 7,576,866 · App. 11/714,854 · Granted Aug 18, 2009

Optical tomography system

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,576,866
App. No.
11/714,854
Granted
Aug 18, 2009
Kind
B2
Abstract

In an optical tomography system, an interference light obtained by multiplexing the reflected light from the object and the reference light is guided to an interference light detecting means by a waveguide means. The interference light detecting means has a spectrometer spectrally dividing the interference light. A polarization setting means which causes the interference light guided by the waveguide means to enter the spectrometer after setting the state of polarization of the interference light guided by the waveguide means to a predetermined state of polarization is provided between the waveguide means and the spectrometer.

Claims (12)

1. An optical tomography system comprising

a light source which emits light,

a light dividing means which divides the light emitted from the light source into measuring light and reference light,

a multiplexing means which multiplexes the reflected light from the object when the measuring light emitted is projected onto the object and the reference light,

an interference light detecting means which has a spectrometer spectrally dividing interference light of the reflected light which has been multiplexed by the multiplexing means and detects the reference light which has been spectrally divided by the spectrometer,

a waveguide means which guides the interference light to the interference light detecting means and

a tomographic image obtaining means which obtains a tomographic image of the object on the basis of the interference light detected by the interference light detecting means,

wherein the improvement comprises that a polarization setting means which causes the interference light guided by the waveguide means to enter the spectrometer after setting the state of polarization of the interference light guided by the waveguide means to a predetermined state of polarization is provided between the waveguide means and the spectrometer.

2. An optical tomography system as defined in claim 1 in which the polarization setting means sets the state of polarization to linearly polarized light.

3. An optical tomography system as defined in claim 2 in which the polarization setting means divides the interference light into two bundles of linearly polarized light which are perpendicular to each other in the direction of polarization and then synthesizes them after changing the direction of polarization of one of them to be the same as the other.

4. An optical tomography system as defined in claim 3 further comprising an optical path length adjusting means which adjusts the optical path length of one of the two bundles of linearly polarized light.

5. An optical tomography system as defined in claim 1 in which the polarization setting means sets the state of polarization to non-polarized light.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 4, 2013
From: FUJIFILM CORPORATION
To: TOPCON CORPORATION
Reel/Frame 031350/0178 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 7, 2007
From: OHKUBO, KAZUNOBU
To: FUJIFILM CORPORATION
Reel/Frame 019022/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 7, 2007
From: OHKUBO, KAZUNOBU
To: FUJIFILM CORPORATION
Reel/Frame 019074/0966 →