IP Library Granted Patent US 8,208,293
Granted Patent B2
US 8,208,293 · App. 11/721,432 · Granted Jun 26, 2012

Programmable phase-change memory and method therefor

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,208,293
App. No.
11/721,432
Granted
Jun 26, 2012
Kind
B2
Abstract

A non-volatile memory is disclosed. A contiguous layer of phase change material ( 21; 31; 61; 71; 81 ) is provided. Proximate the contiguous layer of phase change material ( 21; 31; 61; 71; 81 ) is provided a first pair of contacts ( 22; 32; 62; 72; 82 ) for providing an electrical current therebetween, the electrical current for passing through the contiguous layer of phase change material ( 21; 31; 61; 71; 81 ) for inducing heating thereof within a first region. Also adjacent the contiguous layer is provided a second pair of contacts ( 22; 32; 62; 72; 82 ) disposed for providing an electrical current therebetween, the electrical current for passing through the contiguous layer of phase change material ( 21; 31; 61; 71; 81 ) for inducing heating thereof within a second region thereof, the second region different from the first region. This pairs of contacts may be disposed on the same side or on opposing sides of the phase change material layer.

Claims (22)

1. A non-volatile memory comprising: a contiguous layer of phase change material having therein a first region for encoding of first data therein and a second other region for encoding of second different data therein; a first pair of contacts disposed for providing an electrical current therebetween, the electrical current for passing through the contiguous layer of phase change material for inducing heating thereof within the first region; and, a second pair of contacts disposed for providing an electrical current therebetween, the electrical current for passing through the contiguous layer of phase change material for inducing heating thereof within the second other region thereof.

2. A non-volatile memory according to claim 1 wherein both of the first pair of contacts is disposed on a same side of the contiguous layer of phase change material.

3. A non-volatile memory according to claim 2 comprising a resistive heating layer disposed adjacent the contiguous layer of phase change material.

4. A non-volatile memory according to claim 3 wherein the resistive heating layer is disposed between the contiguous layer of phase change material and the contacts.

5. A non-volatile memory according to claim 3 wherein the resistive heating layer is disposed adjacent the contiguous layer of phase change material on an opposing side to the contacts.

6. A non-volatile memory according to claim 1 wherein each contact of the first pair of contacts are disposed on opposing sides of the contiguous layer of phase change material.

7. A non-volatile memory according to claim 6 wherein each contact of the first pair of contacts are disposed in approximate alignment one with the other approximately a closest distance one to the other across the contiguous layer of phase change material.

8. A non-volatile memory according to claim 1 wherein the first pair of contacts includes a first two contacts and wherein the second pair of contacts includes a second two contacts, the first two contacts different from the second two contacts.

9. A non-volatile memory according to claim 1 wherein the first pair of contacts includes a first two contacts and wherein the second pair of contacts includes a second two contacts, one of the first two contacts a same contact as one of the second two contacts.

10. The non-volatile memory according to claim 1 wherein the contiguous layer of phase change material comprises a phase-change material having at least two stable phases different in resistance value and capable of being reversibly switched between the phases.

11. The non-volatile memory according to claim 1 wherein the phase-change material contains a chalcogenide material.

12. The non-volatile memory according to claim 1 wherein the non-volatile memory comprises a one time programmable read only memory.

13. The non-volatile memory according to claim 1 wherein the non-volatile memory is formed in an amorphous state and remains in its amorphous state until programming thereof.

14. The non-volatile memory according to claim 1 wherein the non-volatile memory is provided in a contiguous amorphous state and upon programming thereof contains crystalline regions therein.

15. A method of forming a memory device comprising: providing an amorphous phase change layer; and, providing electrical contacts spaced apart one from another, a pair of the electrical contacts for, when conducting, resulting in localized heating within the amorphous phase change layer to result in a region of crystalline phase change layer material within the amorphous phase change layer and electrically conducting between the pair of the electrical contacts.

16. A method according to claim 15 comprising: providing an electrical current between a first contact of the pair of the electrical contacts and a second contact of the pair of the electrical contacts, the current for resulting in localized heating of the amorphous phase change layer; and, upon sufficient heating within the amorphous phase change layer, discontinuing the provided current to allow for cooling of the heated portion of the amorphous phase change layer.

17. A method according to claim 16 wherein sufficient heating is determined based on an elapsed time.

18. A method according to claim 17 wherein the elapsed time is relative to a time for the heated portion of the amorphous phase change layer to crystallize.

19. A method according to claim 17 wherein current is automatically limited once the phase change material is changed to the crystalline state.

20. A method according to claim 16 comprising: reading data from the phase change layer.

21. A method according to claim 15 comprising: Providing a one time programmable read only memory comprising the contacts and the amorphous phase change layer.

22. A memory having data stored therein, the data for when executed resulting in a non-volatile memory comprising: a contiguous layer of phase change material having therein a first region for encoding of first data therein and a second other region for encoding of second different data therein; a first pair of contacts disposed for providing an electrical current therebetween, the electrical current for passing through the contiguous layer of phase change material for inducing heating thereof within the first region; and, a second pair of contacts disposed for providing an electrical current therebetween, the electrical current for passing through the contiguous layer of phase change material for inducing heating thereof within the second other region thereof.

Assignments (11)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 29, 2012
From: BOEVE, HANS; LAMBERT, NICK; VAN ACHT, VICTOR; ATTENBOROUGH, KAREN
To: NXP B.V.
Reel/Frame 027956/0848 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 24, 2009
From: KONINKLIJKE PHILIPS ELECTRONICS N.V.
To: NXP B.V.
Reel/Frame 022856/0807 →