A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional diamond and otherwise, as well as unconventional designs, to produce high resolution and otherwise superior indentation measurements.
1. A nanoindenter, comprising:
a module installed in an atomic force microscope which includes an actuator that is operable to actuate an indenter probe and an optical lever detection system that is operable to measure the motion of a flexure controlling the indenter probe;
an indenter probe attached to a central shaft of a monolithic threedimensional leaf spring flexure which constrains the motion of such probe to the axis perpendicular to a sample; and
a mechanical converter assembly which converts a z-axis motion of such central shaft to an angular change which is operable to measure such optical lever detection system.