Intrusion detection using a conductive material
View Patent ↗Tampering with an assembly that includes an integrated circuit is detected by measuring a change in at least one property of a conductive molding formed over at least a portion of the integrated circuit. For example, the conductive molding can be a mixture of resin with conductive powder and/or fibers. The molding can be formed as a continuous region or as strips of conductive material. Conductive contacts are positioned to provide and receive current through portions of the conductive material. For example, the property of the molding can be an impedance of a portion of the conductive molding. A significant change in the impedance measured through one or more conductive contacts indicates tampering with the assembly.
1. An apparatus comprising:
an integrated circuit device;
a molded conductive material formed over the integrated circuit device, wherein the molded conductive material comprises a resin-based conductor, and wherein an indication of an access to the integrated circuit device is based in part on a measurement of a change of at least one property of the molded conductive material;
an input contact and an output contact, wherein an electrically conductive path through the molded conductive material couples the input contact with the output contact; and
a memory that stores a reference impedance value of the path, wherein the integrated circuit determines a determined impedance value through the path, and wherein the indication of the access is based in part on when the determined impedance value for the path differs substantially from the reference impedance value.
2. An apparatus comprising:
an integrated circuit device;
a molded conductive material formed over the integrated circuit device, wherein the molded conductive material comprises a resin-based conductor, and wherein an indication of an access to the integrated circuit device is based in part on a measurement of a change of at least one property of the conductive material;
an input contact and an output contact, wherein an electrically conductive path through the conductive region couples the input contact with the output contact;
a memory that stores a reference impedance value of the path, wherein the integrated circuit determines a determined impedance value through the path, and wherein the indication of the access is based in part on when the determined impedance value for the path differs substantially from the reference impedance value; and
a second memory that stores confidential information, wherein the integrated circuit erases contents of the second memory in response to the indication of the access.
3. A method comprising:
indicating an access to an integrated circuit device based in part on a change of at least one property of a molded homogenized conductive material that is disposed over the integrated circuit device, wherein the indicating comprises:
measuring an impedance through a portion of the molded homogenized conductive material;
comparing the measured impedance with a reference impedance for the portion; and
indicating the access based on a substantial difference between the measured impedance and the reference impedance for the portion.