X-ray imaging of baggage and personnel using arrays of discrete sources and multiple collimated beams
View Patent ↗A system and methods are provided for imaging an object, based on activating an array of discrete X-ray sources in a prescribed temporal pattern so as to illuminate the object with a beam varying in spatial orientation, and detecting X-rays of the beam after interaction with the object and generating a detector signal. An image of the object may then be constructed on the basis of the time variation of the detector signal. The discrete X-ray sources may be moved during the course of inspection, moreover, the prescribed temporal pattern may constitute a Hadamard code. The discrete sources may be carbon nanotube x-ray sources.
1. A method for imaging an object, the method comprising:
a. activating an array of discrete X-ray sources in a prescribed temporal pattern so as to illuminate the object with a beam varying in spatial orientation;
b. detecting with a detector X-rays of the beam scattered after interaction with the object and generating a detector signal; and
c. constructing an image of the object based on the time variation of the detector signal.
2. A method in accordance with claim 1 , wherein the step of activating further includes moving the array of discrete X-ray sources with respect to the detector.
3. A method in accordance with claim 1 , wherein the step of activating further includes rotating the array of discrete X-ray sources with respect to the detector about an axis.
4. A method in accordance with claim 1 , wherein the step of activating further includes translating the array of discrete X-ray sources with respect to the detector.
5. A method in accordance with claim 4 , wherein the array of discrete X-ray sources is characterized by an array axis, and wherein the step of activating includes translating the array in a direction substantially transverse to the array axis.
6. A method in accordance with claim 1 , wherein the prescribed temporal pattern constitutes a Hadamard code.
7. A method in accordance with claim 1 , wherein the step of activating discrete X-ray sources includes activating field emission sources.
8. A method in accordance with claim 7 , wherein the step of activating discrete X-ray sources includes activating a plurality of field emission sources, each field emission source including a reflective target.
9. A method in accordance with claim 7 , wherein the step of activating discrete X-ray sources includes activating a plurality of field emission sources, each field emission source including a transmission target.
10. An inspection system for inspecting an object, the inspection system comprising:
a. a plurality of linear arrays of discrete sources of penetrating radiation;
b. at least one scatter detector configured to generate a scatter signal based upon detection of penetrating radiation scattered by the inspected object; and
c. a processor for receiving the scatter signal and generating an image of the object.
11. An inspection system in accordance with claim 10 , wherein the discrete sources of penetrating radiation are carbon nanotube x-ray sources.
12. A method for inspecting an object, the method comprising:
a. illuminating the object with a plurality of linear arrays of discrete sources of penetrating radiation;
b. generating a scatter signal based upon detection of penetrating radiation scattered by the inspected object; and
c. processing the scatter signal to generate an image of the object.
13. A method in accordance with claim 12 , further comprising moving the object during a course of illumination by the plurality of linear arrays.