IP Library Patent Application 11740054
Patent Application
App. No. 11/740,054

HIGH PERFORMANCE FIELD EFFECT TRANSISTORS COMPRISING CARBON NANOTUBES FABRICATED USING SOLUTION BASED PROCESSING

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Patent No.
US None
App. No.
11/740,054
Abstract

The present invention is directed toward field effect transistors (FETs) and thin film transistors (TFTs) comprising carbon nanotubes (CNTs) and to methods of making such devices using solution-based processing techniques, wherein the CNTs within such devices have been fractionated so as to be concentrated in semiconducting CNTs. Additionally, the relatively low-temperature solution-based processing achievable with the methods of the present invention permit the use of plastics in the fabricated devices.

Claims (36)

1 - 15 . (canceled)

16 . A field effect transistor comprising:

a) a plastic substrate;

b) a gate electrode;

c) a dielectric layer in contact with the gate electrode;

d) a semiconducting active material in contact with the dielectric layer, wherein the semiconducting active material comprises carbon nanotubes, the carbon nanotubes having been non-destructively enriched in semiconducting carbon nanotubes; and

e) source and drain electrodes in contact with the semiconducting active material.

17 . The field effect transistor of claim 16 , wherein the semiconducting active material further comprises material selected from the group consisting of polymeric material, oligomers, single-stranded DNA, polyethylenimine, C60, aromatic organic molecules, and combinations thereof.

18 . The field effect transistor of claim 16 , wherein the semiconducting active material further comprises a polymeric material in contact with the carbon nanotubes.

19 . The field effect transistor of claim 18 , wherein the polymeric material has dendritic material attached to it.

20 . The field effect transistor of claim 16 , wherein the semiconducting active material further comprises a polythiophene material.

21 . The field effect transistor of claim 16 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-3 cm2/Vsec and about 105 cm2/Vsec.

22 . The field effect transistor of claim 16 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-1 cm2/Vsec and about 30 cm2/Vsec.

23 . The field effect transistor of claim 16 , wherein the carbon nanotubes within the semiconducting active material have a density high enough to achieve a percolation threshold.

24 . The field effect transistor of claim 16 , wherein the transistor is part of a matrix-addressable array, with each node in the array comprising at least one such transistor.

25 . A field effect transistor comprising:

a) input and output electrodes; and

b) a semiconducting active material coupled to the input and output electrodes, wherein the semiconducting active material comprises carbon nanotubes, the carbon nanotubes having been non-destructively enriched in semiconducting carbon nanotubes.

26 . The field effect transistor of claim 25 , wherein the substrate is a polymeric material.

27 . The field effect transistor of claim 25 , wherein the semiconducting active material further comprises material selected from the group consisting of polymeric material, oligomers, single-stranded DNA, polyethylenimine, C60, aromatic organic molecules, and combinations thereof.

28 . The field effect transistor of claim 25 , wherein the semiconducting active material further comprises a polythiophene material.

29 . The field effect transistor of claim 25 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-3 cm2/Vsec and about 105 cm2/Vsec.

30 . The field effect transistor of claim 25 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-1 cm2/Vsec and about 30 cm2/Vsec.

31 . The field effect transistor of claim 25 , wherein the carbon nanotubes within the semiconducting active material have a density high enough to achieve a percolation threshold.

32 . The field effect transistor of claim 25 , wherein the transistor is part of a matrix-addressable array, with each node in the array comprising at least one such transistor.

33 . A field effect transistor comprising:

a) a plastic substrate;

b) a gate electrode;

c) a dielectric layer in contact with the gate electrode;

d) source and drain electrodes; and

e) a semiconducting active material bridging the source and drain electrodes, the material comprising a nanotube network of semiconducting and metallic carbon nanotubes, wherein the nanotube network has a nanotube density sufficient to achieve percolation threshold and below a level that would short the device.

34 . The field effect transistor of claim 33 , wherein the semiconducting active material further comprises material selected from the group consisting of polymeric material, oligomers, single-stranded DNA, polyethylenimine, C60, aromatic organic molecules, and combinations thereof.

35 . The field effect transistor of claim 33 , wherein the semiconducting active material further comprises a polythiophene material.

36 . The field effect transistor of claim 33 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-3 cm2/Vsec and about 105 cm2/Vsec.

37 . The field effect transistor of claim 33 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-1 cm2/Vsec and about 30 cm2/Vsec.

38 . The field effect transistor of claim 33 , wherein the transistor is part of a matrix-addressable array, with each node in the array comprising at least one such transistor.

Assignments (2)
RELEASE OF SECURITY INTEREST Recorded Jun 19, 2009
From: CITIBANK, N.A.
To: SABIC INNOVATIVE PLASTICS IP B.V.
Reel/Frame 022846/0411 →
SECURITY AGREEMENT Recorded Aug 18, 2008
From: SABIC INNOVATIVE PLASTICS IP B.V.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 021423/0001 →