Versatile system for optimizing current gain in bipolar transistor structures
View Patent ↗Disclosed are apparatus and methods for designing electrical contact for a bipolar emitter structure. The area of an emitter structure ( 106, 306, 400, 404 ) and the required current density throughput of an electrical contact structure ( 108, 308, 402, 406 ) are determined. A required electrical contact area is determined based on the required current density, and the electrical contact structure is then designed to minimize the required electrical contact area with respect to the emitter structure area.
1. A bipolar emitter structure adapted to optimize H fe , comprising:
an emitter having a given area; and
an electrical contact structure disposed on the emitter; wherein the electrical contact structure is configured to minimize a contact area between the electrical contact structure and the emitter based on an optimization function to optimize H fe ; the electrical contact structure is a single unit contact; the electrical contact structure is disposed atop the emitter structure; and the contact area between the electrical contact structure and the emitter is about 1% of the given area of the emitter.
2. the structure of claim 1 , wherein the electrical contact structure is disposed atop a salicided region of the emitter.
3. The structure of claim 1 , wherein the electrical contact structure is further configured to minimize contact area based on a functional parameter.
4. The structure of claim 3 , wherein the functional parameter is current gain.
5. The structure of claim 3 , wherein the functional parameter is current density.
6. The structure of claim 1 , wherein the optimization function is
A
E
(
H
fe
)
(
A
NC
)
=
(
J
BC
)
(
A
C
)
(
J
C
)
(
A
NC
)
+
J
BNC
J
C
.
7. The structure of claim 1 , further comprising four electrical contact structures disposed atop the emitter structure; wherein a contact area between each electrical contact structure and the emitter is about 1% of the given area of the emitter, such that a total contact area between the four electrical contact structures and the emitter is about 4% of the given area of the emitter.
8. The structure of claim 1 , wherein the electrical contact structure is a first electrical contact structure and the bipolar emitter structure further comprises a plurality of individual contacts disposed atop the emitter structure.
9. A bipolar emitter structure adapted to optimize H fe , comprising:
an emitter having a given area; and
an electrical contact structure disposed on the emitter; wherein the electrical contact structure is configured to minimize a contact area between the electrical contact structure and the emitter based on an optimization function to optimize H fe ; the electrical contact structure comprises a plurality of single unit contacts disposed evenly atop the emitter structure; and each of the single unit contacts provides a contact area with the emitter which is about 1% of the given area of the emitter based on the optimization function.