Specimen inspection stage implemented with processing stage coupling mechanism
View Patent ↗A specimen inspection stage implemented with a processing stage coupling mechanism provides a capability to conduct with maximum efficiency post-processing specimen inspections on-board a processing platform. Heavy inspection equipment is mounted on a specimen inspection stage that is separate from a processing stage. In a preferred embodiment, the processing stage moves in response to an applied motive force and performs laser-based processing operations on a specimen. While laser processing is ongoing, the specimen inspection stage remains parked in its home position. When it is time for post-processing inspection, a stage coupling and decoupling mechanism couples together the specimen inspection stage and the processing stage, which transports the specimen inspection stage to and from the specimen position.
1. A method of using a laser-based system to process and inspect a specimen, comprising:
providing a specimen processing stage for movement on a substrate on which the specimen is mounted during processing and inspection, the specimen processing stage carrying laser beam propagation path-directing optical components that are movable on the substrate in response to an applied motive force;
providing a specimen inspection stage for movement on the substrate, the specimen inspection stage carrying optical inspection equipment characterized by a substantially large mass and having a home position when parked at rest;
providing a coupling device for releasably coupling the specimen inspection stage and the specimen processing stage to each other;
moving the specimen processing stage to position the laser beam relative to the specimen to process it and, thereafter, to position the coupling device to couple the specimen inspection stage and the specimen processing stage to each other;
moving the coupled specimen processing and inspection stages in tandem to position the optical inspection equipment relative to the specimen to inspect it and, thereafter, to park on the specimen inspection stage at the home position; and
uncoupling the specimen processing and inspection stages and, thereafter, moving the specimen processing stage away from the parked specimen inspection stage.
2. The method of claim 1 , in which the optical inspection equipment includes a microscope and a camera.
3. The method of claim 1 , in which the coupling device is a kinematic mount comprising a ball and a V groove.
4. The method of claim 1 , in which the substrate includes a stone slab.
5. The method of claim 4 , in which the stone slab is formed of granite.