Power supply assembly and semiconductor testing system using same
View Patent ↗A power supply assembly that can be miniaturized even though an applied voltage to a load is rendered variable, and a semiconductor testing system using the same are put into practice. With an improvement of the power supply assembly for finding an error against a set voltage by feeding back an applied voltage applied to a load, and applying a predetermined voltage to the load by causing an output amplifier to increase and decrease amperage to be fed to the load on the basis of the error, it is characterized in provided a voltage converter causing a voltage level of a power supply voltage of the output amplifier to follow up a voltage level of the set voltage.
1. A power supply assembly for finding an error against a set voltage by feeding back an applied voltage applied to a load, and applying a predetermined voltage to the load by causing an output amplifier to increase and decrease amperage to be fed to the load on the basis of the error, wherein the output amplifier comprises an input terminal receiving the set voltage and a power supply terminal, wherein the power supply assembly is provided with a voltage converter causing a voltage level of a power supply voltage supplied to the power supply terminal of the output amplifier to follow up a voltage level of the set voltage, wherein the voltage level of the power supply voltage of the output amplifier is variable, wherein the voltage converter comprises: a level-shift circuit for receiving the set voltage and adding a bias voltage to the voltage level of the set voltage to generate a reference voltage; and a DC-DC converter connected to the level-shift circuit and receiving the generated reference voltage, and wherein the DC-DC converter is connected to the power supply terminal of the output amplifier and outputs the power supply voltage to the output amplifier on the basis of the reference voltage from the level-shift circuit.
2. The power supply assembly according to claim 1 , wherein the DC-DC converter is a step-down converter.
3. A semiconductor testing system used for inspection of devices comprising: a power supply unit; and any one of the power supply assemblies according to claim 1 or 2 , driven by power supplied from the power supply unit; wherein the load is a device under test.
4. The semiconductor testing system according to claim 3 , wherein a plurality of any of the power supply assemblies are provided, and electric power is fed thereto from the same power supply unit.
5. A semiconductor testing system used for inspection of devices comprising: a power supply unit; and any one of the power supply assemblies according to claim 1 or 2 , driven by power supplied from the power supply unit; wherein the load is a device under test; and the DC-DC converter is a switching power supply for executing switching control in sync with a clock signal for system control.
6. The semiconductor testing system according to claim 5 , further comprising: a current measurement circuit for taking measurements on current fed from some of the power supply assemblies described in the foregoing to the device under test; and a timing adjuster for causing the switching power supply to stop switching while the current measurement circuit takes measurements on the current.
7. The semiconductor testing system according to claim 5 , wherein a plurality of any of the power supply assemblies are provided, electric power is fed thereto from the same power supply unit, and switching control is executed through synchronization among the power supply assemblies.