Micro Kelvin probes and micro Kelvin probe methodology with concentric pad structures
View Patent ↗A micro Kelvin probe assembly and method of accomplishing a micro Kelvin measurement that determines the resistance or impedance of a device under test (DUT) that has two spaced contacts. An ammeter is used to flow current through the DUT, and a voltmeter is used to measure the voltage drop across the DUT. There is a printed circuit board (PCB) carrying two pairs of contacts, with a trace leading to each contact. Anisotropic conductive elastomer (ACE) material as an electrical interposer is placed in electrical contact with each of the PCB contacts. The DUT is placed on the ACE such that each DUT contact is directly opposite one pair of PCB contacts. The ammeter is connected to one trace leading to one contact of each pair of PCB contacts to flow current through the DUT, and the voltmeter is connected to the other trace leading to the other contact of each pair of PCB contacts, so that voltmeter can measure the voltage drop across the DUT without an effect caused by the interposer. In a further embodiment, the PCB contacts are arranged in concentric circles to provide a contact surface area that is relatively constant and more tolerant of misalignment with the DUT contacts.
1. A micro Kelvin probe assembly for determining the resistance or impedance of a device under test (DUT) that has two spaced contacts, using an ammeter to flow current through the DUT and a voltmeter to measure the voltage drop across the DUT, the assembly comprising:
a printed circuit board (PCB) carrying two pairs of contacts, where each pair of contacts are arranged as concentric circles of different radii;
anisotropic conductive elastomer (ACE) material as an electrical interposer in direct physical and electrical contact with each of the PCB two pairs of contacts;
wherein the DUT is placed on the ACE such that each DUT contact is directly opposite one pair of PCB contacts; and
wherein the ammeter is connected to one contact of each pair of PCB contacts and flows current through the DUT, and the voltmeter is connected to the other contact of each pair of PCB contacts, so that voltmeter can be used to measure the voltage drop across the DUT without an effect caused by the interposer.
2. The assembly of claim 1 in which the ACE comprises conductive columns comprising magnetically aligned particles in polymer material.
3. The assembly of claim 2 in which the conductive columns are spaced apart from one another by no more than about 0.1 mm.
4. The assembly of claim 1 in which the concentric circles are in non-contacting relation to each other.
5. A method of using a micro Kelvin probe assembly to determine the resistance or impedance of a device under test (DUT) that has two spaced contacts, using an ammeter to flow current through the DUT and a voltmeter to measure the voltage drop across the DUT, the method comprising:
providing a printed circuit board (PCB) carrying two pairs of contacts, where each pair of contacts are arranged as concentric circles of different radii, with a trace leading to each contact;
placing anisotropic conductive elastomer (ACE) material as an electrical interposer in direct physical and electrical contact with each of the PCB two pairs of contacts;
placing the DUT on the ACE such that each DUT contact is directly opposite one pair of PCB contacts;
connecting the ammeter to one contact of each pair of PCB contacts to flow current through the DUT; and
connecting the voltmeter to the other contact of each pair of PCB contacts, so that voltmeter can be used to measure the voltage drop across the DUT without an effect caused by the interposer.
6. The method of claim 5 in which the ACE comprises conductive columns comprising magnetically aligned particles in polymer material.
7. The method of claim 6 in which the conductive columns are spaced apart from one another by no more than about 0.1 mm.
8. The method of claim 5 in which the concentric circles are in non-contacting relation to each other.