Semiconductor component and device and method for connecting such a component, particularly for test purposes

1. An electrical connection device comprising:

a platform and a moving head between which can be placed a semiconductor component comprising an electrical connection plate bearing an integrated circuit chip;

said platform comprising electrical connection means in contact with front electrical connection terminals provided on a front panel of said electrical connection plate;

wherein said moving head bears a printed circuit board having interlinked pairs of contact terminals and pairs of electrical connection means for contacting respectively on the one hand with the pairs of contact terminals of the printed circuit board and on the other hand with one rear link terminal and one rear transfer terminal provided on a rear panel of said electrical connection plate, and

wherein said electrical connection plate includes means for electrically connecting the rear link terminals to said chip and means for electrically connecting the rear transfer terminals to front transfer terminals.

2. The device according to claim 1 , wherein the front panel of said connection plate has a multiplicity of front terminals linked to said chip and provided on an area and a multiplicity of front transfer terminals linked to rear transfer terminals and provided outside a peripheral edge of said area.

3. The device according to claim 1 , wherein said head comprises two detachable parts between which said printed circuit board is installed.

4. The device according to claim 1 , wherein said chip is fixed to said rear panel of said electrical connection plate, said rear terminals being provided outside a peripheral edge of said chip.

5. A method for testing a semiconductor component comprising an electrical connection plate bearing an integrated circuit chip, the electrical connection plate including front terminals on a front side of the plate and rear terminals on a rear side of the plate, a first subset of the front terminals being electrically connected to a first subset of the rear terminals, comprising:

making direct electrical test contact with a second subset of the front terminals, the second subset of front terminals being connected to the integrated circuit chip; and

making indirect electrical test contact with a second subset of the rear terminals, the second subset of rear terminals being connected to the integrated circuit chip, the making of indirect electrical test contact comprising:

making direct electrical test contact to the first subset of the front terminals, which are electrically connected to the first subset of the rear terminals, and

making bridging electrical contact between the first subset of the rear terminals and the second subset of the rear terminals.

6. The method of claim 5 wherein making direct electrical test contact to the first subset of the front terminals and making direct electrical test contact with the second subset of the front terminals comprises using a test platform which receives the front side of the electrical connection plate bearing an integrated circuit chip.

7. The method of claim 6 wherein making bridging electrical contact between first subset of the rear terminals and the second subset of the rear terminals comprises using a moving head which mounts to the test platform and includes means for electrically interconnecting the first subset of the rear terminals and the second subset of the rear terminals.

8. The method of claim 7 wherein the moving head, when mounted to the test platform, retains the electrical connection plate bearing an integrated circuit chip.

9. An electrical connection device comprising:

a test platform which receives a front side of an electrical connection plate bearing an integrated circuit chip, the test platform making direct electrical test contact to a first subset of front terminals on the front side of the electrical connection plate and making direct electrical test contact with a second subset of the front terminals also on the front side of the electrical connection plate;

wherein the first subset of the front terminals are electrically connected by the electrical connection plate to a first subset of rear terminals on a rear side of the electrical connection plate; and

a moving head which mounts to the test platform to give indirect electrical test contact to a second subset of rear terminals on the rear side of the electrical connection plate and includes means for electrically interconnecting the first subset of the rear terminals and the second subset of rear terminals.

10. The device of claim 9 wherein the moving head, when mounted to the test platform, retains the electrical connection plate bearing an integrated circuit chip.

11. The device of claim 9 , wherein said moving head comprises:

first and second detachable parts; and

a printed circuit board installed between the first and second detachable parts, the printed circuit board including circuitry for supporting electrical interconnection of the first subset of the rear terminals and the second subset of rear terminals.

12. The device of claim 11 wherein the printed circuit board comprises electrically interlinked pairs of contact terminals, a first contact terminal in a pair being associated with a rear terminal in the first subset and a second contact terminal in that pair being associated with a rear terminal in the second subset.

13. The device of claim 12 wherein the first detachable part includes elastic contact members extending between the contact terminals and the first and second subsets of rear terminals.

14. The device of claim 9 wherein the test platform includes elastic contact members extending to make contact with the first and second subsets of front terminals.