IP Library Granted Patent US 7,609,433
Granted Patent B2
US 7,609,433 · App. 11/778,619 · Granted Oct 27, 2009

Electrochromic device and method of making the same

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,609,433
App. No.
11/778,619
Granted
Oct 27, 2009
Kind
B2
Abstract

An electrochromic device includes a first conductive layer, a dual-layer ion conductor layer, and a second conductive layer. The first ion conductor layer and the second ion conductor layer are formed from different materials and/or by different processes. The layers are deposited using PVD, CVD, or plating techniques.

Claims (42)

1. A method for forming an electrochromic device, comprising the steps of:

(a) forming a first conductive electrochromic layer;

(b) forming a first ion conductor layer over the first conductive layer;

(c) forming a second ion conductor layer over the first ion conductor layer, wherein the second ion conductor layer is formed from a different material or using a different deposition technique than the first ion conductor layer;

(d) forming at least one additional ion conductor layer over the second ion conductor layer, wherein each additional ion conductor layer is formed from a different material or using a different deposition technique than the previously formed ion conductor layer; and

(e) forming a second conductive counter electrode layer over the last formed additional ion conductor layer.

2. The method of claim 1 , wherein the first ion conductor layer includes a first material selected from the group consisting of tantalum oxide, silicon oxide, aluminum oxide, niobium oxide, and zirconium oxide.

3. The method of claim 2 , wherein the first ion conductor layer is formed using a deposition technique selected from the group consisting of physical vapor deposition, chemical vapor deposition, and plating.

4. The method of claim 2 , wherein the second ion conductor layer includes a second material selected from the group consisting of tantalum oxide, silicon oxide, aluminum oxide, niobium oxide, and zirconium oxide, and the second material is different from the first material.

5. The method of claim 4 , wherein the second ion conductor layer is formed using a deposition technique selected from the group consisting of physical vapor deposition, chemical vapor deposition, and plating.

6. The method of claim 5 , wherein the first ion conductor layer and the second ion conductor layer are each formed in selected atmospheres, wherein the selected atmospheres maybe the same or different and are selected from the group consisting of water vapor, oxygen, and a mixture of water vapor and oxygen.

7. The method of claim 6 , wherein the first conductive layer is a counter-electrode layer, and the second conductive layer is an electrochromic layer.

8. The method of claim 1 , wherein the first ion conductor layer is formed using a deposition technique selected from the group consisting of physical vapor deposition, chemical vapor deposition, and plating.

9. The method of claim 8 , wherein the second ion conductor layer is formed using a deposition technique selected from the group consisting of physical vapor deposition, chemical vapor deposition, and plating.

10. The method of claim 2 , wherein the first ion conductor layer includes a plurality of sublayers of the first material, and adjacent sublayers of the first material are formed using different processing or deposition conditions.

11. The method of claim 10 , wherein the sublayers are formed using different atmospheres.

12. The method of claim 11 , wherein the different atmospheres are selected from the group consisting of water vapor, oxygen, and a mixture of water vapor and oxygen.

13. The method of claim 4 , wherein the second ion conductor layer includes a plurality of sublayers of the second material, and adjacent sublayers of the second material are formed using different processing or deposition conditions.

14. The method of claim 10 , wherein the second ion conductor layer includes a second material selected from the group consisting of tantalum oxide, silicon oxide, aluminum oxide, niobium oxide, and zirconium oxide, the second material is different from the first material, the second conductor layer includes a plurality of sublayers of the second material, and adjacent sublayers of the second material are formed using different processing or deposition conditions.

15. An electrochromic device, comprising:

(a) a first conductive electrochromic layer;

(b) a first ion conductor layer formed over the first conductive layer;

(c) a second ion conductor layer formed over the first ion conductor layer, wherein the second ion conductor is formed from a different material or using a different deposition technique than the first ion conductor layer;

(d) at least one additional ion conductor layer formed over the second ion conductor layer, wherein each additional ion conductor layer is formed from a different material or using a different deposition technique than the previously formed ion conductor layer; and

(e) a second conductive counter electrode layer formed over the last formed additional ion conductor layer.

16. The electrochromic device of claim 15 , wherein the first ion conductor layer includes a first material selected from the group consisting of tantalum oxide, silicon oxide, aluminum oxide, niobium oxide, and zirconium oxide.

17. The electrochromic device of claim 16 , wherein the first ion conductor layer is formed using a technique selected from the group consisting of physical vapor deposition, chemical vapor deposition, and plating.

18. The electrochromic device of claim 16 , wherein second ion conductor layer includes a second material selected from the group consisting of tantalum oxide, silicon oxide, aluminum oxide, niobium oxide, and zirconium oxide, and the second material is different from the first material.

19. The electrochromic device of claim 18 , wherein the second ion conductor layer is formed using a deposition technique selected from the group consisting of physical vapor deposition, chemical vapor deposition, and plating.

20. The electrochromic device of claim 19 , wherein first ion conductor layer and the second ion conductor layer are each formed in selected atmospheres, wherein the selected atmospheres may be the same or different and are selected from the group consisting of water vapor, oxygen, and a mixture of water vapor and oxygen.

21. The electrochromic device of claim 20 , wherein the first conductive layer is a counter-electrode layer, and the second conductive layer is an electrochromic layer.

22. The electrochromic device of claim 15 , wherein the first ion conductor layer is formed using a deposition technique selected from the group consisting of physical vapor deposition, chemical vapor deposition, and plating.

23. The electrochromic device of claim 22 , wherein the second ion conductor layer is formed using a deposition technique selected from the group consisting of physical vapor deposition, chemical vapor deposition, and plating.

24. The electrochromic device of claim 16 , wherein the first ion conductor layer includes a plurality of sublayers of the first material, and adjacent sublayers of the first material are formed using different processing or deposition conditions.

25. The electrochromic device of claim 24 , wherein the sublayers are formed using different atmospheres.

26. The electrochromic device of claim 25 , wherein the different atmospheres are selected from the group consisting of water vapor, oxygen, and a mixture of water vapor and oxygen.

27. The electrochromic device of claim 18 , wherein the second ion conductor layer includes a plurality of sublayers of the second material, and adjacent sublayers of the second material are formed using different processing or deposition conditions.

28. The electrochromic device of claim 24 wherein the second ion conductor layer includes a second material selected from the group consisting of tantalum oxide, silicon oxide, aluminum oxide, niobium oxide, and zirconium oxide, the second material is different from the first material, the second conductor layer includes a plurality of sublayers of the second material, and adjacent sublayers of the second material are formed using different processing or deposition conditions.

29. The method of claim 1 , further comprising providing ions for conduction through the ion conductor layers, wherein the provided ions are selected from the group consisting of hydrogen and lithium ions.

30. The electrochromic device of claim 15 , further comprising a source of ions for conduction through the ion conductor layers, wherein the ions are selected from the group consisting of hydrogen and lithium ions.

31. The method of claim 1 , wherein ion traps are formed at the interface between the first ion conductor layer and the second ion conductor layer.

32. The electrochromic device of claim 15 , wherein ion traps are formed at the interface between the first ion conductor layer and the second ion conductor layer.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2021
From: GREENSILL CAPITAL (UK) LIMITED
To: VIEW, INC.
Reel/Frame 055542/0516 →
SECURITY INTEREST Recorded Nov 14, 2019
From: VIEW, INC.
To: GREENSILL CAPITAL (UK) LIMITED
Reel/Frame 051012/0359 →
TERMINATION AND RELEASE OF SECURITY INTEREST Recorded Apr 1, 2019
From: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A.
To: VIEW, INC.
Reel/Frame 049100/0817 →
RELEASE OF SECURITY INTEREST Recorded Jan 26, 2017
From: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A.
To: VIEW, INC.
Reel/Frame 041549/0094 →
SECURITY INTEREST Recorded Jan 25, 2017
From: VIEW, INC.
To: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A.
Reel/Frame 041493/0859 →
SECURITY INTEREST Recorded Apr 15, 2016
From: VIEW, INC.
To: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS COLLATERAL AGENT
Reel/Frame 038440/0749 →
CHANGE OF NAME Recorded Dec 6, 2012
From: SOLADIGM, INC.
To: VIEW, INC.
Reel/Frame 029422/0119 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 22, 2007
From: NGUYEN, PAUL
To: SOLADIGM, INC.
Reel/Frame 020001/0145 →