High resolution interferometric optical frequency domain reflectometry (OFDR) beyond the laser coherence length

1. A method for interferometrically measuring an optical device under test (DUT), comprising:

scanning the optical device under test by varying a wavelength of light generated by a laser, the laser having a corresponding coherence length, and

determining an interferometric response of the optical device under test to the laser scanning,

wherein the optical device under test has an associated optical length greater than the coherence length of the laser.

2. The method in claim 1 , wherein the coherence length is a distance that the laser light can travel and still have a predictable phase.

3. The method in claim 1 , wherein the interferometric response is in the time domain.

4. The method in claim 1 , wherein the interferometric response is in the frequency domain.

5. The method in claim 1 , further comprising:

predicting an instantaneous or random phase of the laser at an optical length associated with the optical device under test, and

using the predicted laser phase in determining the interferometric response of the optical device under test.

6. The method in claim 5 , further comprising:

measuring an interferometric intensity of the optical device under test at an optical length associated with the optical device under test, and

compensating for an instantaneous random phase variation of the laser at the optical length associated with the optical device under test from the measured interferometric intensity.

7. The method in claim 1 , further comprising:

measuring an interferometric intensity of the optical device under test;

mixing the predicted phase of the laser with the measured interferometric intensity of the optical device under test; and

using the mixed data in determining the interferometric response of the optical device under test.

8. The method in claim 1 , further comprising:

providing the determined interferometric response of the optical device under test with a resolution on the order of one centimeter or less at an optical length associated with the optical device under test over a range about that optical length.

9. The method in claim 8 , wherein the laser is a DFB laser or a single mode Fabry-Perot laser.

10. The method in claim 8 , wherein the optical length is on the order of one hundred meters or more.

11. The method in claim 10 , further comprising:

varying the optical length or the range of the optical device under test and repeating the scanning and determining steps.

12. The method in claim 1 , further comprising:

detecting the interferometric intensity of the optical device under test to the laser scanning,

converting the interferometric intensity into digital format using data acquisition circuitry,

wherein a linewidth of the laser is less than a bandwidth of the data acquisition circuitry, the linewidth being approximately inversely proportional to the coherence length of the laser.

13. The method in claim 1 , further comprising:

(a) acquiring interferometric intensity data from the laser and from the optical device under test;

(b) converting the laser interferometric intensity data to laser phase data;

(c) processing the laser phase data to generate location laser phase data at a location associated with the optical device under test;

(d) mixing the location laser phase data with the interferometric intensity data from the optical device under test; and

(e) transforming the mixed data to generate the interferometric response of the optical device under test to the laser scanning.

14. The method in claim 13 , wherein between steps (a) and (b) the method further comprises:

converting the laser phase data to second derivative laser phase data;

processing the second derivative laser phase data to generate location second derivative laser phase data at a location associated with the optical device under test; and

integrating the generated location second derivative laser phase data to provide location laser phase data.

15. The method in claim 13 , wherein between steps (d) and (e) the method further comprises:

low pass filtering the correlated data, and

linearizing the low pass filtered data,

wherein the transforming step includes transforming the linearized data to generate the interferometric response of the optical device under test to the laser scanning.

16. Apparatus for interferometrically measuring an optical device under test (DUT), comprising:

a laser for scanning the optical device under test over a range of different wavelengths of light, the laser having a corresponding coherence length, and

electronic circuitry that determines an interferometric response of the optical device under test to the laser scanning,

wherein the interferometric response of the optical device under test has an associated optical length greater than the coherence length of the laser.

17. The apparatus in claim 16 , wherein the coherence length is a distance that the laser light can travel and still have a predictable phase.

18. The apparatus in claim 16 , wherein the interferometric response is in the time domain.

19. The apparatus in claim 16 , wherein the interferometric response is in the frequency domain.

20. The apparatus in claim 16 , wherein the electronic circuitry is programmed to:

predict an instantaneous or random phase of the laser at an optical length associated with the optical device under test, and

use the predicted laser phase in determining the interferometric response of the optical device under test.

21. The apparatus in claim 20 , wherein the electronic circuitry is programmed to:

measure an interferometric intensity of the optical device under test at an optical length associated with the optical device under test, and

compensate for an instantaneous random phase variation of the laser at the the optical length associated with the optical device under test from the measured interferometric intensity.

22. The apparatus in claim 16 , wherein the electronic circuitry is programmed to:

measure an interferometric intensity of the optical device under test;

mix the predicted phase of the laser with the measured interferometric intensity of the optical device under test; and

use the mixed data in determining the interferometric response of the optical device under test.

23. The apparatus in claim 16 , wherein the electronic circuitry is programmed to:

provide the determined interferometric response of the optical device under test with a resolution on the order of one centimeter or less at an optical length associated with the optical device under test over a range about that optical length.

24. The apparatus in claim 23 , wherein the laser is a DFB laser or a single mode Fabry-Perot laser.

25. The apparatus in claim 23 , wherein the optical length is on the order of one hundred meters or more.

26. The apparatus in claim 25 , wherein the electronic circuitry is programmed to:

detect the interferometric intensity of the optical device under test to the laser scanning, and

convert the interferometric intensity into digital format using data acquisition circuitry,

wherein a linewidth of the laser is less than a bandwidth of the data acquisition circuitry, the linewidth being approximately inversely proportional to the coherence length of the laser.

27. The apparatus in claim 16 , wherein the electronic circuitry is programmed to perform the following tasks:

(a) acquire interferometric intensity data from the laser and from the optical device under test;

(b) convert the laser interferometric intensity data to laser phase data;

(c) process the laser phase data to generate location laser phase data at a location associated with the optical device under test;

(d) mix the location laser phase data with the interferometric intensity data from the optical device under test; and

(e) transform the mixed data to generate the interferometric response of the optical device under test to the laser scanning.

28. The apparatus in claim 27 , wherein between tasks (a) and (b) the electronic circuitry is programmed to:

convert the laser phase data to second derivative laser phase data;

process the second derivative laser phase data to generate location second derivative laser phase data at a location associated with the optical device under test; and

integrate the generated location second derivative laser phase data to provide location laser phase data.

29. The apparatus in claim 27 , wherein between tasks (d) and (e), the electronic circuitry is programmed to:

low pass filter the mixed data, and

linearize the low pass filtered data,

wherein the transforming task includes transforming the linearized data to generate the interferometric response of the optical device under test to the laser scanning.

30. The apparatus in claim 16 , wherein the apparatus employs Optical Frequency Domain Reflectometry (OFDR).