System and method for laser temperature compensation
View Patent ↗A method for compensating for changes in output power or wavelength of an optical source with temperature. Many optical sources have power and/or wavelength variations with temperature which can be compensated by open- or closed-loop methods if a method of accurately measuring the optical source temperature is available. The voltage across a semiconductor junction varies with temperature. Measuring the optical source power or wavelength variation with temperature and tracking the voltage across the semiconductor junction provides a means for compensating an instrument for temperature induced optical output power or wavelength variations. An important field of application is optical density or turbidity measurements in cellular media.
1. A method for laser or LED temperature compensation using the forward voltage drop of the laser diode or LED for temperature sensing by creating the correction factor AU corr said method comprising the steps of:
i) determining the diode forward voltage versus temperature sensitivity of the laser or LED;
ii) determining the optical power versus temperature sensitivity of the laser or LED; and
iii) creating a compensation algorithm in accordance with the equation:
AU
corr
=
log
10
(
1
+
Δ
V
fwd
E
L
C
L
)
wherein C L is the laser forward voltage change with temperature, E L is the fractional laser power degradation with temperature factor, and ΔV fwd is the relative voltage change experienced by the laser from an established reference voltage.
2. The method of claim 1 wherein the laser is a semiconductor diode laser, a distributed feedback (DFB) laser, a vertical cavity semiconductor emitting laser (VCSEL) or a Fabry-Perot diode laser.
3. A method in accordance with claim 1 including the step of measuring the voltage across the optical diode power source using a differential amplifier.
4. A method in accordance with claim 3 comprising the additional step of providing a reference voltage to said differential amplifier.
5. A method in accordance with claim 1 wherein the diode current is held constant.
6. A method in accordance with claim 1 wherein the diode current is held constant and a correction factor based on the IV characteristics of the diode is applied.