Optimized reference level generation
View Patent ↗A method, apparatus and system for optimizing the magnitude of reference levels in non-invasive imaging and analysis is disclosed. Optimizing the magnitude of reference levels enables improving signal to noise ratios and thereby improving the sensitivity and performance of the imaging and analysis system. The invention includes dynamically modifying the magnitude of one or more reference beams and significantly reducing the magnitude of undesirable reference radiation components. It may further include one or more stabilizing feedback systems.
1. A method for increasing sensitivity of non-invasive analysis of a target, said method comprising:
generating probe radiation and reference radiation;
modulating said reference radiation;
dynamically interferometrically attenuating said modulated reference radiation;
applying said probe radiation to said target;
capturing at least part of said probe radiation scattered from within said target to form captured scattered probe radiation;
combining said captured scattered probe radiation and said attenuated modulated reference radiation to form an interferometric signal;
detecting said interferometric signal to form an electronic signal; and
processing said electronic signal to achieve non-invasive analysis of said target whereby said non-invasive analysis has increased sensitivity.
2. The method of claim 1 , wherein the dynamically attenuated reference radiation is dynamically attenuated in a manner that is synchronously related to the modulation of the reference radiation.
3. The method of claim 1 , wherein the magnitude of the attenuation of the dynamically attenuated reference radiation varies in a manner related to the region of the target with which a signal is related.
4. A method for increasing sensitivity of non-invasive analysis of a target, said method comprising:
generating probe radiation and composite reference radiation;
modulating at least some component of said composite reference radiation;
selectively interferometrically attenuating at least one component of said composite reference radiation;
applying said probe radiation to said target;
capturing at least part of said probe radiation scattered from within said target to form captured scattered probe radiation;
combining said captured scattered probe radiation and said selectively attenuated composite reference radiation to form a composite interferometric signal;
detecting said composite interferometric signal to form an electronic signal; and
processing said electronic signal to achieve non-invasive analysis of said target whereby said non-invasive analysis has increased sensitivity.
5. A system for increasing sensitivity of non-invasive analysis of a target, said system comprising:
a source operable to generate probe radiation and reference radiation;
a modulator operable to modulate said reference radiation;
an interferometric attenuating element operable to dynamically attenuate said modulated reference radiation;
components operable to apply said probe radiation to said target;
components operable to capture at least part of said probe radiation scattered from within said target to form captured scattered probe radiation;
components operable to combine said captured scattered probe radiation and said attenuated modulated reference radiation to form an interferometric signal;
a detector operable to detect said interferometric signal to form an electronic signal; and
a processor operable to process said electronic signal to achieve non-invasive analysis of said target whereby said non-invasive analysis has increased sensitivity.
6. The system of claim 5 , wherein the dynamically attenuated reference radiation is dynamically attenuated in a manner that is synchronously related to the modulation of the reference radiation.
7. The system of claim 5 , wherein the magnitude of the attenuation of the dynamically attenuated reference radiation varies in a manner related to the region of the target with which a signal is related.
8. A system for increasing sensitivity of non-invasive analysis of a target, said system comprising:
a source operable to generate probe radiation and composite reference radiation;
a modulator operable to modulate at least some component of said composite reference radiation;
an interferometric attenuating element operable to selectively attenuate at least one component of said composite reference radiation;
components operable to apply said probe radiation to said target;
components operable to capture at least part of said probe radiation scattered from within said target to form captured scattered probe radiation;
components operable to combine said captured scattered probe radiation and said selectively attenuated composite reference radiation to form a composite interferometric signal;
a detector operable to detect said composite interferometric signal to form an electronic signal; and
a processor operable to process said electronic signal to achieve non-invasive analysis of said target whereby said non-invasive analysis has increased sensitivity.
9. An apparatus for increasing sensitivity of non-invasive analysis of a target, said apparatus comprising:
means for generating probe radiation and reference radiation;
means for modulating said reference radiation;
means for dynamically interferometrically attenuating said modulated reference radiation;
means for applying said probe radiation to said target;
means for capturing at least part of said probe radiation scattered from within said target to form captured scattered probe radiation;
means for combining said captured scattered probe radiation and said attenuated modulated reference radiation to form an interferometric signal;
means for detecting said interferometric signal to form an electronic signal; and
means for processing said electronic signal to achieve non-invasive analysis of said target whereby said non-invasive analysis has increased sensitivity.
10. The apparatus of claim 9 , wherein the dynamically attenuated reference radiation is dynamically attenuated in a manner that is synchronously related to the modulation of the reference radiation.
11. The apparatus of claim 9 , wherein the magnitude of the attenuation of the dynamically attenuated reference radiation varies in a manner related to the region of the target with which a signal is related.
12. An apparatus for increasing sensitivity of non-invasive analysis of a target, said apparatus comprising:
means for generating probe radiation and composite reference radiation;
means for modulating at least some component of said composite reference radiation;
means for selectively interferometrically attenuating at least one component of said composite reference radiation;
means for applying said probe radiation to said target;
means for capturing at least part of said probe radiation scattered from within said target to form captured scattered probe radiation;
means for combining said captured scattered probe radiation and said selectively attenuated composite reference radiation to form a composite interferometric signal;
detecting said composite interferometric signal to form an electronic signal; and
means for processing said electronic signal to achieve non-invasive analysis of said target whereby said non-invasive analysis has increased sensitivity.