Compensating for time varying phase changes in interferometric measurements

1. A method for interferometrically measuring an optical device under test (DUT), the method comprising:

a tunable laser generating light at different wavelengths at different times that is applied to the DUT;

in response to the applied light, obtaining first interference pattern data for the DUT via a first path and obtaining second interference pattern data for the DUT via a second path, where the second interference pattern data is delayed in time from the first interference pattern data; and

identifying a time varying component of the DUT from the first and second interference pattern data.

2. The method in claim 1 , further comprising:

using the identified time varying component to modify the first or the second interference pattern data.

3. The method in claim 2 , further comprising:

determining one or more optical characteristics of the DUT based on the modified interference pattern data.

4. The method in claim 2 , wherein the DUT includes a fiber having a length greater than 500 meters, the method further comprising:

using the modified interference pattern data to determine one or more optical characteristics at any position along the fiber.

5. The method in claim 4 , further comprising:

determining the position along the fiber with a resolution of one or two centimeters based on the modified interference pattern data.

6. The method in claim 1 , wherein the first and second interference pattern data each include static phase information and dynamic phase information, and wherein the time varying component includes the dynamic phase information.

7. The method in claim 6 , further comprising:

combining the first and second fringe interference pattern data to substantially remove the static phase information.

8. The method in claim 1 , further comprising:

modifying the first or the second interference pattern data to compensate for vibration that affects the interference pattern data obtained for the DUT.

9. The method in claim 1 , further comprising:

using optical frequency domain reflectometry (OFDR) to obtain the first interference pattern data and the second interference pattern data, and

storing the modified interference pattern data in memory.

10. The method in claim 9 , further comprising:

compensating the first and second interference pattern data for non-linearity associated with the tunable laser to obtain compensated first and second interference pattern data.

11. The method in claim 1 , further comprising:

transforming the first and second interference pattern data into the frequency domain;

capturing a first window of frequency domain data for the first interference pattern data corresponding to a portion of the DUT under analysis;

capturing a second window of frequency domain data for the second interference pattern data corresponding to the portion of the DUT under analysis;

converting the first and second windows of frequency domain data into first and second corresponding phase data; and

combining the first and second corresponding phase data.

12. The method in claim 1 , wherein light from the first and second paths interferes with light from a common reference path.

13. The method in claim 1 , wherein light from the first and second paths have the same polarization.

14. The method in claim 1 , wherein light from the first and second paths interferes with light from first and second reference paths, respectively.

15. Apparatus for interferometrically measuring an optical device under test (DUT), comprising:

a tunable laser for generating light applied to the DUT at different wavelengths at different times;

optical detection circuitry configured to obtain, in response to the applied light, first interference pattern data for the DUT via a first path and second interference pattern data for the DUT via a second path, where the second interference pattern data is delayed in time from the first interference pattern data; and

processing circuitry configured to identify a time varying component of the DUT from the first and second interference pattern data.

16. The apparatus in claim 15 , wherein the processing circuitry is configured to use the identified time varying component to modify the first or the second interference pattern data.

17. The apparatus in claim 16 , wherein the processing circuitry is configured to determining one or more optical characteristics of the DUT based on the modified interference pattern data.

18. The apparatus in claim 16 , wherein the DUT includes a fiber having a length greater than 500 meters, and wherein the processing circuitry is configured to use the modified interference pattern data to determine one or more optical characteristics at any position along the fiber.

19. The apparatus in claim 18 , wherein the processing circuitry is configured to determine the position along the fiber with a resolution of one or two centimeters based on the modified interference pattern data.

20. The apparatus in claim 15 , wherein the first and second interference pattern data each include static phase information and dynamic phase information, and wherein the time varying component includes the dynamic phase information.

21. The apparatus in claim 20 , wherein the processing circuitry is configured to combine the first and second fringe interference pattern data to substantially remove the static phase information.

22. The apparatus in claim 15 , wherein the processing circuitry is configured to modify the first or the second interference pattern data to compensate for vibration that affects the interference pattern data obtained for the DUT.

23. The apparatus in claim 15 , wherein the apparatus is an optical frequency domain reflectometer that includes a tunable laser, wherein the processing circuitry is configured to compensate the first and second interference pattern data for non-linearity associated with the tunable laser used in the optical frequency domain reflectometer to obtain compensated first and second interference pattern data.

24. The apparatus in claim 15 , wherein the processing circuitry is configured to: transform the first and second interference pattern data into the frequency domain;

capture a first window of frequency domain data for the first interference pattern data corresponding to a portion of the DUT under analysis;

capture a second window of frequency domain data for the second interference pattern data corresponding to the portion of the DUT under analysis;

convert the first and second windows of frequency domain data into first and second corresponding phase data; and

combine the first and second corresponding phase data.

25. The apparatus in claim 15 , wherein light from the first and second paths interferes with light from a common reference path.

26. The apparatus in claim 15 , wherein light from the first and second paths have the same polarization.

27. The apparatus in claim 15 , wherein light from the first and second paths interferes with light from first and second reference paths, respectively.

28. The apparatus in claim 15 , further comprising:

one or more polarization stabilization components included in one or both of the first and second paths.

29. The apparatus in claim 28 , wherein the one or more polarization stabilization components includes a Faraday rotator mirror coupled at the end of the first or second paths.

30. The apparatus in claim 29 , wherein the one or more polarization stabilization components includes a polarization beam splitter in the first or second paths.

31. The apparatus in claim 30 , wherein the one or more polarization stabilization components includes a Faraday rotator in the first and second paths coupled to an output port of the polarization beam splitter or a circulator.