Semiconductor apparatus and method of disposing observation flip-flop

1. A semiconductor apparatus comprising:

a functional block to observe a state of a signal line in the semiconductor apparatus, the functional block including:

a signal transfer section to receive, transmit and output the state of the signal line; and

an observation flip-flop including an input terminal connected to anyone of an input terminal of the signal transfer section and an output terminal of the signal transfer section, an output terminal of the observation flip-flop being provided separately from the output terminal of the signal transfer section, the observation flip-flop storing a state of a terminal to which the input terminal is connected.

2. The semiconductor apparatus according to claim 1 , wherein

the functional block is disposed as one layout unit in the semiconductor apparatus.

3. The semiconductor apparatus according to claim 1 , wherein

the signal transfer section includes a buffer or an inverter.

4. The semiconductor apparatus according to claim 1 , wherein

the observation flip-flop includes a first input terminal connected with the input terminal or the output terminal of the signal transfer section, and a second input terminal connected with an output of another observation flip-flop, and

the observation flip-flop stores a state input to the first input terminal during a first mode and stores a state of the second input terminal during a second mode.

5. A method of disposing an observation flip-flop to observe a state of a signal line path in a semiconductor apparatus, comprising:

placing the observation flip-flop as a functional block including a signal transfer section to receive, transmit and output a state of the signal line and an observation flip-flop including an input terminal connected to any one of an input terminal of the signal transfer section and an output terminal of the signal transfer section, an output terminal of the observation flip-flop being provided separately from the output terminal of the signal transfer section, the observation flip-flop storing a state of a terminal to which the input terminal is connected; and

connecting the signal line path through the signal transfer section.

6. The method of disposing an observation flip-flop according to claim 5 ,

wherein the functional block is disposed as one layout unit in the semiconductor apparatus.

7. The method of disposing an observation flip-flop according to claim 5 ,

wherein the signal transfer section includes a buffer or an inverter.

8. The method of disposing an observation flip-flop according to claim 5 ,

wherein the functional block replaces a pre-placed signal delay adjustment element to adjust a signal delay time.

9. The method of disposing an observation flip-flop according to claim 6 ,

wherein the functional block replaces a pre-placed signal delay adjustment element to adjust a signal delay time.

10. The semiconductor apparatus according to claim 1 ,

wherein the stored state of the input terminal or the output terminal of the signal transfer section from the observation flip-flop is outputted to the output terminal of the observation flip-flop from the functional block while the signal transfer section outputs the state of the signal line path to the output terminal without passing through the observation flip-flop.

11. The semiconductor apparatus according to claim 1 ,

wherein the observation flip-flop outputs a stored state of the signal line path within the semiconductor apparatus and the transfer section outputs the state of the signal line path without being stored in the observation flip-flop.

12. A semiconductor apparatus comprising:

a plurality of functional blocks, each to observe a state of a signal line in the semiconductor apparatus, each of the functional blocks comprising:

a signal transfer section to receive and output the state of the signal line; and

an observation flip-flop to store a state of an input terminal or an output terminal of the signal transfer section and to store a second input received by the functional block,

wherein the signal transfer section outputs the state of the signal line path to the output terminal without passing through the observation flip-flop, and

wherein the stored state of the input terminal or the output terminal of the signal transfer section from the observation flip-flop is outputted to a test signal output terminal exclusive from the output terminal receiving the state of the signal line path without passing through the observation flip-flop.

13. The semiconductor apparatus according to claim 1 , wherein the signal transfer section outputs the state of the signal line path to the output terminal of the signal transfer section without passing through the observation flip-flop during a scan mode and a shift mode of the observation flip-flop.

14. The semiconductor apparatus according to claim 1 , wherein the signal transfer section outputs without any change of the state of the signal line path to the output terminal of the signal transfer section without passing through the observation flip-flop.

15. The semiconductor apparatus according to claim 1 , wherein the signal transfer section outputs the state of the signal line path to the output terminal of signal transfer section without passing through the observation flip-flop during any period of time to observe the state of the signal line path.

16. The semiconductor apparatus according to claim 1 , wherein the stored state of the input terminal or the output terminal of the signal transfer section from the observation flip-flop is outputted to a test signal output terminal of each of the functional blocks, separate from the output terminal of the signal transfer section.