Display element and inspecting method of the same
View Patent ↗An inspection circuit is constructed by first inspection TFTs provided to one end sides of signal lines, and second inspection TFTs provided to the other end sides of the signal lines. By using both the first inspection TFTs and the second inspection TFTs, the driving capability can be secured while miniaturizing the first inspection TFTs and the second inspection TFTs. Therefore, the signal lines can be reliably inspected while saving the space for the inspection circuit.
1. A display element comprising:
a plurality of pixels;
a plurality of drive switching elements for driving the respective pixels;
a plurality of signal wires, having first and second end sides, for transmitting signals to the switching elements; and
an inspection circuit provided to the signal wires for inspecting the signal wires to detect breakage of the signal wires, wherein the inspection circuit includes:
first inspection switching elements having first and second groups connected to at least the first end side of the signal wires, to supply an inspection signal to the signal wires in a turn-on state; and
second inspection switching elements connected between (1) the second end side of the signal wires connected to the first group, and (2) the second end sides of the signal wires connected to the second group, to short-circuit the signal wires in a turn-on state;
wherein during inspection of the signal wires for breakage, the first group of the first inspection switching elements and the second inspection switching elements are turned on, the second group of the first inspection switching elements are turned off, and the drive switching elements are turned on and drive the pixels.
2. The display element according to claim 1 , wherein:
the inspection circuit further includes an inspection circuit to detect short-circuiting of the signal wires; and
during inspection of short-circuiting of the signal wires, the first group of the first inspection switching elements are turned on, the second group of the first inspection switching elements and the second inspection switching elements are turned off, and the drive switching elements are turned on and drive the pixels.
3. A method for inspecting a display element comprising a plurality of pixels, a plurality of drive switching elements for driving the respective pixels, a plurality of signal wires having first and second end sides, for transmitting signals to the switching elements, and an inspection circuit provided to the signal wires for inspecting the signal wires to detect breakage of the signal wires, the method comprising:
connecting first inspection switching elements having first and second groups connected to at least the first end side of the signal wires to supply an inspection signal to the signal wires in a turn-on state;
connecting second inspection switching elements between (1) the second end side of the signal wires to the first group, and (2) the second end side of the signal wires connected to the second group, to short-circuit the signal wires in a turn-on state; and
inspecting the signal wires for breakage by driving the pixels with the drive switching elements in a state where the first group of the first inspection switching elements and the second inspection switching elements are turned on, the second group of the first inspection switching elements are turned off, and a signal is supplied to the signal wires.
4. The method according to claim 3 , further comprising inspecting short-circuiting of the signal wires by driving the pixels by the switching elements in a state where the first group of the first inspection switching elements are turned on, the second group of the first inspection switching elements and the second inspection switching elements are turned off, and a signal is supplied to the signal wires via the first group of the first inspection switching elements.