Microscope with higher resolution and method for increasing same
View Patent ↗Microscope with higher resolution with partial spatial superposition in the illumination by an excitation beam and a de-excitation beam and/or a switching beam in a fluorescing sample, whereby the light from the sample is deflected, whereby, in the excitation beam and/or in the de-excitation and/or the switching beam, at least one combination of devices exercising circular and radial influence on the spatial phase is provided.
1. A microscope possessing higher resolution for measuring a fluorescent sample, the microscope comprising:
excitation means for generating an excitation beam for illuminating a sample,
de-excitation means for generating first and second de-excitation beams having a spatial phase,
means for exercising circular and radial influence on the spatial phase of the first and second de-excitation beams,
a beam combiner in the paths of the first and second de-excitation beams, and
superposing means for incoherently superposing the first and second de-excitation beams downstream of the beam combiner.
2. The microscope of claim 1 , wherein the microscope further comprises an objective lens upstream of the sample, and
wherein the superposing means comprises pupil optics between the excitation means and the objective lens, and the means for exercising circular and radial influence lies in or in the vicinity of the pupil plane of the objective lens.
3. The microscope of claim 1 , wherein the microscope further comprises means for scanning the sample with the excitation beam.
4. The microscope of claim 1 , wherein the de-excitation means includes means for generating a single de-excitation beam and beam splitting means for splitting the single de-excitation beam into the first and second de-excitation beams, and
wherein the microscope further comprises delay means in the beam path of the first de-excitation beam for delaying the first de-excitation beam, wherein the first and second de-excitation beams are incoherently superimposed due to the delay caused by the delay means.
5. The microscope of claim 4 , wherein the means for exercising circular and radial influence includes a spiral mask in the path of the first de-excitation beam and a radial mask in the path of the second de-excitation beam.
6. The microscope of claim 4 , wherein the means for exercising circular and radial influence includes a combination spiral-radial mask in the path of the first de-excitation beam and a radial mask in the path of the second de-excitation beam.
7. The microscope of claim 6 , further comprising:
further beam splitting means for splitting the excitation beam into the first and second excitation beams,
further delay means in the beam path of the first excitation beam for delaying the first excitation beam
a radial mask in the beam path of the first excitation beam,
a further beam combiner in the paths of the first and second excitation beams, and and
further beam superposing means for incoherently superposing the first and second excitation beams downstream of the further beam combiner, wherein the first and second excitation beams are incoherently superimposed due to the delay caused by the further delay means.
8. The microscope of claim 1 , wherein the de-excitation means includes means for generating a single de-excitation beam and beam splitting means for splitting the single de-excitation beam into the first and second de-excitation beams, and
wherein the means for exercising circular and radial influence includes a spiral mask in the path of the first de-excitation beam and a radial mask in the path of the second de-excitation beam, wherein the spiral and the radial masks cause the first and second de-excitation beams, respectively, to have slightly different wavelengths within the excitation spectrum for fluorescence, and wherein the combined first and second de-excitation beams are incoherently superimposed due to the difference in wavelengths.