IP Library Granted Patent US 7,710,482
Granted Patent B2
US 7,710,482 · App. 11/818,292 · Granted May 4, 2010

Semiconductor device

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Quick Facts
Patent No.
US 7,710,482
App. No.
11/818,292
Granted
May 4, 2010
Kind
B2
Abstract

A MOS image sensor IC has a silicon substrate, a MOS transistor and photodiodes disposed on the silicon substrate, and pixel regions each comprising one of the photodiodes. A protective film is disposed around the pixel regions. A first conductor for potential fixation is disposed under the protective film and surrounds the pixel regions. The first conductor is electrically fixed to a potential of the silicon substrate.

Claims (24)

1. A MOS image sensor IC, comprising:

a silicon substrate;

a MOS transistor and a plurality of photodiodes disposed on the silicon substrate;

a plurality of pixel regions each comprising a photodiode of the plurality of photodiodes;

a protective film disposed around the plurality of pixel regions; and

a first conductor for potential fixation disposed under the protective film and surrounding the plurality of pixel regions, the first conductor being electrically fixed to a potential of the silicon substrate.

2. A MOS image sensor IC according to claim 1 ; further comprising a plurality of second conductors for potential fixation disposed under the protective film in each pixel region, each of the second conductors having a narrow shape so as not to block incident light to the corresponding pixel region and being electrically fixed to the potential of the silicon substrate.

3. A MOS image sensor IC according to claim 1 ; wherein the first conductor is made of aluminum.

4. A MOS image sensor IC according to claim 2 ; wherein the second conductors are made of aluminum.

5. A MOS image sensor IC according to claim 2 ; wherein each of the second conductors is cross-shaped.

6. A MOS image sensor IC according to claim 2 ; wherein each of the second conductors comprises a plurality of conductor strips.

7. A MOS image sensor IC according to claim 6 ; wherein the plurality of conductor strips form a polygon shape.

8. A MOS image sensor IC comprising:

a silicon substrate;

a MOS transistor and a plurality of photodiodes disposed on the silicon substrate;

a plurality of pixel regions each comprising a photodiode of the plurality of photodiodes;

a protective film disposed around the plurality of pixel regions;

a first conductor for potential fixation disposed under the protective film and surrounding the plurality of pixel regions, the first conductor being electrically fixed to a potential of the silicon substrate; and

a plurality of second conductors for potential fixation disposed under the protective film in each pixel region, each of the second conductors having a narrow shape so as not to block incident light to the corresponding pixel region.

9. A MOS image sensor IC according to claim 8 ; wherein each of the second conductors is cross-shaped.

10. A MOS image sensor IC according to claim 8 ; wherein each of the second conductors comprises a plurality of conductor strips.

11. A MOS image sensor IC according to claim 10 ; wherein the plurality of conductor strips form a polygon shape.

12. A MOS image sensor IC according to claim 8 ; wherein the second conductors are made of aluminum.

13. A MOS image sensor IC according to claim 8 ; wherein the first conductor is made of aluminum.

Assignments (3)
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 10, 2016
From: SEIKO INSTRUMENTS INC.
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 038058/0892 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 23, 2007
From: TAKASU, HIROAKI
To: SEIKO INSTRUMENTS INC.
Reel/Frame 019643/0240 →