IP Library Granted Patent US 8,174,051
Granted Patent B2
US 8,174,051 · App. 11/821,908 · Granted May 8, 2012

III-nitride power device

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Quick Facts
Patent No.
US 8,174,051
App. No.
11/821,908
Granted
May 8, 2012
Kind
B2
Abstract

A III-nitride power device that includes a Schottky electrode surrounding one of the power electrodes of the device.

Claims (32)

1. A monolithic integrated III-Nitride power device comprising:

a heterojunction III-nitride body including a first III-nitride layer, and a second III-nitride layer having a band gap different from that of said first III-nitride layer disposed over said first III-nitride layer;

a first power electrode electrically connected to said second III-nitride layer;

a second power electrode electrically connected to said second III-nitride layer;

a gate structure; and

a schottky electrode in schottky contact with said second III-nitride layer and surrounding one of said first and second power electrodes, said schottky electrode disposed between said gate structure and said one of said first and second power electrodes; and

wherein said gate structure is narrower than said schottky electrode.

2. A power device according to claim 1 , said gate structure surrounding said schottky electrode.

3. A power device according to claim 2 , wherein said gate structure includes a gate electrode and a gate insulation interposed between said heterojunction and said gate electrode.

4. A power device according to claim 3 , wherein said gate insulation is comprised of silicon dioxide.

5. A power device according to claim 3 , wherein said gate insulation is comprised of silicon nitride.

6. A power device according to claim 1 , wherein said first III-nitride layer is comprised of GaN and said second III-nitride layer is comprised of AlGaN.

7. A power device according to claim 1 , wherein said first III-nitride layer is comprised of one alloy of from the InAlGaN system and said second III-nitride layer is comprised of another alloy from the InAlGaN system having a band gap that is different from that of said one alloy.

8. A power device according to claim 1 , wherein said first power electrode and said second power electrode make ohmic contact with said second III-nitride layer.

9. A power device according to claim 1 , wherein said electrode surrounded by said schottky electrode is the drain electrode.

10. A power device according to claim 1 , wherein said schottky electrode is biased to a voltage.

11. A power device according to claim 1 , further comprising at least one field plate ring disposed around said one of said electrodes and between said one of said electrodes and said schottky electrode.

12. A power device according to claim 1 , wherein said schottky electrode is surrounding and spaced from said one of said first and second power electrodes.

13. A III-Nitride device comprising:

a heterojunction III-nitride body including a first III-nitride layer, and a second III-nitride layer having a band gap different from that of said first III-nitride layer disposed over said first III-nitride layer;

a source electrode electrically connected to said second III-nitride layer;

a drain electrode electrically connected to said second III-nitride layer;

a gate structure; and

a schottky electrode in schottky contact with said second III-nitride layer and surrounding and spaced from said drain electrode, said schottky electrode disposed between said gate structure and said drain electrode; and

wherein said gate structure is narrower than said schottky electrode.

14. A device according to claim 13 , said gate structure surrounding said schottky electrode.

15. A device according to claim 14 , wherein said gate structure includes a gate electrode and a gate insulation interposed between said heterojunction and said gate electrode.

16. A device according to claim 13 , wherein said first III-nitride layer is comprised of one alloy of from the InAlGaN system and said second III-nitride layer is comprised of another alloy from the InAlGaN system having a band gap that is different from that of said one alloy.

17. A device according to claim 13 , wherein said source electrode and said drain electrode make ohmic contact with said second III-nitride layer.

18. A device according to claim 13 , wherein said schottky electrode is biased to a voltage.

19. A device according to claim 13 , wherein said schottky electrode is shorted to said source electrode.

20. A device according to claim 13 , further comprising at least one field plate ring disposed around said drain electrode and between said drain electrode and said schottky electrode.

Assignments (1)
CHANGE OF NAME Recorded Jul 23, 2018
From: INTERNATIONAL RECTIFIER CORPORATION
To: INFINEON TECHNOLOGIES AMERICAS CORP.
Reel/Frame 046612/0968 →