Method to detect helium leakage from a disk drive
View Patent ↗A method to detect helium leakage from a disk drive enclosure is disclosed and claimed. A measurement electrical current is passed through a temperature sensor disposed within the disk drive enclosure. A reference electrical resistance corresponds to a reference temperature of the temperature sensor. A heating electrical current is passed through the temperature sensor. A heated electrical resistance of the temperature sensor, corresponding to a heated temperature of the temperature sensor that exceeds the reference temperature by at least 5° C., is determined. A value that corresponds to a quantity of helium within the disk drive enclosure is determined based on the reference electrical resistance and heated electrical resistance.
1. A method to detect helium leakage from a disk drive enclosure, the method comprising:
determining a reference electrical resistance of a first temperature sensor disposed within the disk drive enclosure, the reference electrical resistance corresponding to a reference temperature of the first temperature sensor;
passing a heating electrical current through the first temperature sensor;
determining a heated electrical resistance of the first temperature sensor, the heated electrical resistance corresponding to a heated temperature of the first temperature sensor that exceeds the reference temperature of the first temperature sensor by a temperature rise of at least 5° C.; and
determining a value that corresponds to a quantity of helium within the disk drive enclosure based on the reference electrical resistance and heated electrical resistance.
2. The method of claim 1 wherein the heating electrical current is in the range 2 mA to 50 mA.
3. The method of claim 1 wherein the first temperature sensor is a thermistor.
4. The method of claim 1 wherein the determined value is compared to a plurality of stored values, each of the plurality of stored values corresponding to a quantity of helium within the disk drive enclosure.
5. The method of claim 1 wherein the heated temperature of the first temperature sensor minus the reference temperature of the first temperature sensor is at least 15° C. but no more than 100° C.
6. The method of claim 1 wherein the disk drive enclosure encloses a disk, and the heated electrical resistance of the first temperature sensor is determined while the disk is not rotating relative to the disk drive enclosure.
7. The method of claim 1 wherein the disk drive enclosure encloses a disk and a head coupled to an actuator, and the heated electrical resistance of the first temperature sensor is determined while the disk is rotating and the actuator is stationary relative to the disk drive enclosure.
8. The method of claim 1 further comprising measuring a temperature of the disk drive enclosure using a second temperature sensor.
9. The method of claim 8 wherein the reference electrical resistance of the first temperature sensor is determined by a calculation based on the temperature of the disk drive enclosure that is measured by the second temperature sensor.
10. The method of claim 1 further comprising comparing the determined value to an expected value corresponding to a condition in which negligible helium has leaked.
11. The method of claim 10 wherein if the determined value is greater than the expected value, a register corresponding to helium leakage is set.
12. The method of claim 1 further comprising calibrating the first temperature sensor before and after introducing helium into the disk drive enclosure.
13. The method of claim 12 wherein calibration includes measuring resistances of the first temperature sensor under a plurality of electrical current conditions.
14. The method of claim 13 wherein a first one of the plurality of electrical current conditions includes passing an electrical current in the range 0.04 mA to 6.7 mA through the first temperature sensor, and a second one of the plurality of electrical current conditions includes passing a current in the range 2 mA to 50 mA through the first temperature sensor.
15. The method of claim 1 further comprising determining the heated temperature of the first temperature sensor based on the heated electrical resistance of the first temperature sensor.
16. The method of claim 15 further comprising measuring a change in temperature approximately equal to the heated temperature of the first temperature sensor minus a temperature of the disk drive enclosure.
17. The method of claim 16 further comprising comparing the measured change in temperature with an expected change in temperature corresponding to a condition in which negligible helium has leaked.
18. The method of claim 17 wherein if the measured change in sensor temperature is greater than the expected change in sensor temperature, a register corresponding to helium leakage is set.
19. The method of claim 1 wherein the reference electrical resistance of the first temperature sensor is determined by passing a measurement electrical current through the first temperature sensor, the measurement electrical current being less than half of the heating electrical current.
20. The method of claim 19 wherein the measurement electrical current is in the range 0.04 mA to 6.7 mA.
21. The method of claim 19 further comprising determining a temperature of the disk drive enclosure based on the reference electrical resistance of the first temperature sensor.