X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
View Patent ↗An X-ray imaging inspection system for bags and packages. Transmission imaging is performed using a fan beam and a segmented detector, while scatter imaging is performed with a scanned pencil beam, with both beams active simultaneously. Cross-talk between the beams is mitigated by a combination of shielding, scatter detector design, positioning and orientation, and image processing. Image processing subtracts the measured radiation scattered from the transmission beam into the scatter detectors, reducing cross-talk.
1. A system for inspecting an object, the system comprising:
a. a first radiation source that emits a fan beam of penetrating radiation;
b. a segmented array of detector elements for measuring the intensity of penetrating radiation transmitted through the object by the first radiation source;
c. a second radiation source that emits a scanning pencil beam of penetrating radiation;
d. at least one scatter detector for detecting penetrating radiation scattered out of the scanning pencil beam by the object; and
e. a processor, a memory, and a display, the memory containing instructions that cause the processor:
to subtract a background signal from a measured signal from the scatter detector, the background signal measured by the scatter detector when the scanning pencil beam is not illuminating the object, thereby forming a corrected measured scatter signal, and
to display on the display the corrected measured scatter signal and a measured transmission signal from the segmented array of detector elements for use in inspecting the object.
2. A system according to claim 1 , wherein the first radiation source emitting the fan beam and the second radiation source emitting the scanning pencil beam are the same radiation source.
3. A system according to claim 1 , wherein the at least one scatter detector includes means for collimating penetrating radiation such that penetrating radiation from the scanning pencil beam is preferentially detected.
4. A system according to claim 1 , wherein the at least one scatter detector includes a substantially planar face, the planar face sensitive to incident radiation, the planar face characterized by a normal to the face and wherein the normal to the face is oriented substantially towards a point of incidence of the scanning pencil beam with the object.
5. A system according to claim 4 , wherein at least one surface of the scatter detector other than the planar face is shielded to reduce detection of penetrating radiation from the fan beam.
6. A system according to claim 1 , further including a barrier disposed between the fan beam and the at least one scatter detector such that a measured signal from the scatter detector due to the fan beam is reduced.
7. A system according to claim 6 , wherein the barrier is a curtain disposed substantially parallel to the fan beam.
8. A system according to claim 6 , wherein the barrier is a swinging shield disposed substantially parallel to the fan beam.
9. A system according to claim 6 , wherein the barrier is a shield disposed substantially perpendicular to the fan beam.
10. A system according to claim 1 , wherein the memory further includes instructions to cause the processor to adjust the aspect ratio and size of the measured transmission signal and the corrected measured scatter signal such that the size and shape of the object appear similar in a display of the measured transmission signal and in a display of the corrected measured scatter signal.
11. The system according to claim 1 , wherein the segmented array of detector elements includes a first set of elements that measure radiation in a first energy range and a second set of elements that measure radiation in a second energy range.
12. A system according to claim 11 , wherein the memory further includes instructions to cause the processor to determine the effective atomic number of at least one portion of the object using measurements from the first set of elements and measurements from the second set of elements, and to display on the display an image of the at least one portion of the object showing the effective atomic number of the portion.
13. A system according to claim 1 , wherein the segmented array of detector elements includes a collimator to reduce fan beam penetrating radiation scattered from the segmented array of detectors and incident on the scatter detector.
14. A system for inspecting an object, the system comprising:
a. a first radiation source that emits a fan beam of penetrating radiation;
b. a segmented array of detector elements for measuring the intensity of penetrating radiation transmitted through the object from the first radiation source, the array including a collimator to intercept radiation scattered by the array;
c. a second radiation source that emits a scanning pencil beam of penetrating radiation;
d. at least one scatter detector for detecting penetrating radiation scattered out of the scanning pencil beam by the object, the scatter detector further including means for intercepting radiation scattered from the fan beam; and
e. a processor, a memory and a display, the memory containing instructions that cause the processor:
to subtract a background signal from a measured signal from the scatter detector, the background signal measured by the scatter detector when the second radiation source is not illuminating the object, thereby forming a corrected measured scatter signal, and
to display on the display the corrected measured scatter signal and a measured transmission signal from the segmented array of detector elements for use in inspecting the object.
15. A system according to claim 14 , wherein the first radiation source emitting the fan beam and the second radiation source emitting the scanning pencil beam are the same radiation source.
16. A system according to claim 14 , wherein the segmented array of detector elements includes a first set of elements that measure radiation in a first energy range and a second set of elements that measure radiation in a second energy range and wherein the memory further includes instructions that cause the processor:
to adjust the aspect ratio and size of the measured transmission signal and the corrected measured scatter signal such that the size and shape of the object appear similar in a display of the measured transmission signal and in a display of the corrected measured scatter signal,
to determine the effective atomic number of at least one portion of the object using measurements from the first set of elements and measurements from the second set of elements, and
to display on the display an image of the at least one portion of the object showing the effective atomic number of the portion.