IP Library Patent Application 11837757
Patent Application
App. No. 11/837,757

Composition to Reduce Adhesion Between a Conformable Region and a Mold

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Quick Facts
Patent No.
US None
App. No.
11/837,757
Abstract

The present invention provides compositions that feature improved preferential adhesion and release characteristics with respect to a substrate and a mold having imprinting material disposed therebetween. To that end, the compositions facilitate bifurcation of the imprinting into a surfactant-component-rich sub-portion and a surfactant-component-depleted sub-portion located between said surfactant-component-rich sub-portion and said substrate. This surfactant-component-rich sub-portion attenuates the adhesion forces between the mold and the imprinting material, once solidified.

Claims (30)

1 . An imprint lithography mold assembly, comprising:

(a) a mold having a surface;

(b) a substrate having a surface; and

(c) a polymerizable composition disposed between the surface of the mold and the surface of the substrate, wherein the polymerizable composition comprises:

(i) a bulk material; and

(ii) a non-ionic surfactant having a first end and a second end, wherein the first end of the non-ionic surfactant has an affinity for the bulk material, and the second end of the non-ionic surfactant is fluorinated.

2 . The imprint lithography mold assembly of claim 1 , wherein the second end of the non-ionic surfactant in the polymerizable composition is oriented toward the surface of the mold.

3 . The imprint lithography mold assembly of claim 1 , wherein the non-ionic surfactant has the following formula:

F(CF 2 CF 2 ) x CH 2 CH 2 O(RO) y R′

wherein (RO) y is a poly(oxyalkylene) group that includes groups having two to four carbon atoms, R′ is a terminal group of H or C 1 to C 4 alkyl, and x and y are integers.

4 . The imprint lithography mold assembly of claim 3 , wherein R is selected from the group consisting of —CH 2 CH 2 —, —CH 2 CH 2 CH 2 —, —CH(CH 3 )CH 2 —, and —CH(CH 3 )CH(CH 3 )—.

5 . The imprint lithography mold assembly of claim 3 , wherein R′ is selected from the group consisting of H and methyl.

6 . The imprint lithography mold assembly of claim 1 , wherein the non-ionic surfactant has the following formula:

wherein R and R′ are identical or different and selected from the group consisting of H and methyl; wherein R″ is an optional sulfonyl linking group —SO 2 N(R′″″), with R′″″ selected from the group consisting of C 1 to C 6 alkyl; wherein (OR′″) z is a poly(oxyalkylene) group comprising at least one type of oxyalkylene unit; wherein R″″ is a terminal group selected from the group consisting of H, methyl, and C 1 to C 4 alkyl; and wherein the ratio of x to y is in a range of 1:1 to 3:1.

7 . The imprint lithography mold assembly of claim 6 , wherein the ratio of x to y is in a range of 1:1 to 2:1.

8 . The imprint lithography mold assembly of claim 1 , wherein the non-ionic surfactant has the following formula:

where x is an integer in a range of 0 to 6, inclusive; and y is an integer in a range of 0 to 15, inclusive.

9 . The imprint lithography mold assembly of claim 1 , wherein the non-ionic surfactant has the following formula:

where x is an integer having a value of 1 to 2; y is an integer having a value of 2 to 1; and z is an integer having a value in a range of 0 to 6, inclusive.

10 . The imprint lithography mold assembly of claim 1 , wherein the non-ionic surfactant includes a silicon atom.

11 . The imprint lithography mold assembly of claim 1 , further comprising a lamella between the surface of the mold and the bulk material, wherein the lamella comprises the second end of the non-ionic surfactant.

12 . The imprint lithography mold assembly of claim 11 , wherein the second end of the non-ionic surfactant is in contact with the surface of the mold.

13 . The imprint lithography mold assembly of claim 1 , further comprising one or more additional surfactants.

14 . The imprint lithography mold assembly of claim 13 , wherein the one or more additional surfactants are selected from the group consisting of ionic, non-ionic, cationic, and zwitterionic surfactants.

15 . The imprint lithography mold assembly of claim 13 , wherein one of the additional surfactants is selected from a group consisting of a silicon-containing surfactant, a hydrocarbon-based surfactant, and a fluorinated surfactant.

16 . The imprint lithography mold assembly of claim 13 , wherein the polymerizable composition further comprises an initiator.

17 . The imprint lithography mold assembly of claim 13 , wherein the bulk material comprises one or more compounds selected from the group consisting of vinyl ethers, methacrylates, acrylates, thiolenes, and epoxies.

18 . The imprint lithography mold assembly of claim 1 , wherein a viscosity of the polymerizable material is in a range of about 0.5 cps to about 20 cps.

19 . The imprint lithography mold assembly of claim 1 , wherein a viscosity of the polymerizable material is in a range of about 10 cps to about 500,000 cps.

20 . The imprint lithography mold assembly of claim 1 , wherein a viscosity of the polymerizable material is in a range of about 10 cps to about 20,000 cps.