Error correction code (ECC) circuit test mode
View Patent ↗An ECC circuit and method for an integrated circuit memory allows a user to enter a test mode and select a specific location to force a known failure on any memory chip, whether it is fully functional or partially functional. Additional circuitry is placed in the data path where existing buffers and drivers are already located, minimizing any additional speed loss or area penalty required to implement the forced data failure. In a first general method, a logic zero is forced onto a selected data line at a given time. In a second general method, a logic one is forced onto a selected data line at a given time.
1. An integrated circuit memory comprising:
a memory array coupled to an internal data line;
an ECC logic circuit for providing correct output data; and
forcing logic interposed between the internal data line and an input of the ECC logic circuit to force a specific data state on a select data bit onto the input of the ECC logic circuit when the memory array is read.
2. The integrated circuit memory of claim 1 wherein the forcing logic comprises at least one control signal input.
3. The integrated circuit memory of claim 1 wherein the forcing logic forces a logic zero onto the input of the ECC logic circuit.
4. The integrated circuit memory of claim 1 wherein the forcing logic forces a logic one onto the input of the ECC logic circuit.
5. The integrated circuit memory of claim 1 wherein the forcing logic selectively forces either a logic zero or a logic one onto the input of the ECC logic circuit.
6. The integrated circuit memory of claim 1 wherein the forcing logic comprises:
a first NAND gate having two inputs for receiving two control signals and an output;
a second NAND gate having a first input coupled to the output of the first NAND gate, a second input coupled to the internal data line, and an output; and
an inverter having an input coupled to the output of the second NAND gate and an output coupled to the input of the ECC logic circuit.
7. The integrated circuit memory of claim 6 wherein the first NAND gate comprises an additional input for receiving an additional control signal.
8. The integrated circuit memory of claim 1 wherein the forcing logic comprises:
a first NAND gate having two inputs for receiving two control signals and an output;
a second NAND gate having a first input coupled to the output of the first NAND gate, a second input, and an output coupled to the input of the ECC logic circuit; and
an inverter having an input coupled to the internal data line and an output coupled to the second input of the second NAND gate.
9. The integrated circuit memory of claim 1 wherein the forcing logic comprises:
a first logic portion capable of forcing a logic zero onto the input of the ECC logic circuit; and
a second logic portion capable of forcing a logic one onto the input of the ECC logic circuit.
10. The integrated circuit memory of claim 9 wherein the first logic portion is under control of a first control signal, and the second logic portion is under control of a second control signal.
11. An integrated circuit memory comprising:
a memory array coupled to an internal data line;
an ECC logic circuit for providing correct output data;
an ECC test circuit interposed between the internal data line and an input of the ECC logic circuit;
a test mode register; and
a predecoder coupled between the test mode register and the ECC test circuit, wherein the test mode register generates an enable signal received by the predecoder and the ECC test circuit forces a specific data state on a select data bit onto the input of the ECC logic circuit when the memory array is read.
12. The integrated circuit memory of claim 11 wherein the ECC test circuit comprises at least one control signal input.
13. The integrated circuit memory of claim 11 wherein the ECC test circuit forces a logic zero onto the input of the ECC logic circuit.
14. The integrated circuit memory of claim 11 wherein the ECC test circuit forces a logic one onto the input of the ECC logic circuit.
15. The integrated circuit memory of claim 11 wherein the ECC test circuit selectively forces either a logic zero or a logic one onto the input of the ECC logic circuit.
16. An integrated circuit memory comprising:
a memory array coupled to an internal data line;
an ECC logic circuit for providing correct output data;
an ECC test circuit interposed between the internal data line and an input of the ECC logic circuit;
a test mode register; and
a predecoder coupled between the test mode register and the ECC test circuit, wherein the test mode register generates an enable signal received directly by the ECC test circuit and the ECC test circuit forces a specific data state on a select data bit onto the input of the ECC logic circuit when the memory array is read.
17. The integrated circuit memory of claim 16 wherein the ECC test circuit comprises at least one control signal input.
18. The integrated circuit memory of claim 16 wherein the ECC test circuit forces a logic zero onto the input of the ECC logic circuit.
19. The integrated circuit memory of claim 16 wherein the ECC test circuit forces a logic one onto the input of the ECC logic circuit.
20. The integrated circuit memory of claim 16 wherein the ECC test circuit selectively forces either a logic zero or a logic one onto the input of the ECC logic circuit.