IP Library Granted Patent US 7,558,691
Granted Patent B2
US 7,558,691 · App. 11/845,863 · Granted Jul 7, 2009

Method for determining a characteristic of a sensor arrangement

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Quick Facts
Patent No.
US 7,558,691
App. No.
11/845,863
Granted
Jul 7, 2009
Kind
B2
Abstract

A method is disclosed for determining a characteristic of a sensor arrangement having at least one measuring sensor and at least one reference sensor for recording the same physical variable, and having an analysis unit electrically connected thereto. The characteristic is determined from measured values of the at least one measuring sensor and of the at least one reference sensor. It is proposed to record a characteristic point during continuous measurement operation, starting with the first time the sensor arrangement is put into operation, when a definable measurement point is reached in a process for the first time, if the changes in measured value in the variation over time of the at least one measuring sensor and in the variation over time of the at least one reference sensor remain within a definable tolerance band within a definable time interval.

Claims (32)

1. A method for determining a characteristic of a sensor arrangement having at least one measuring sensor and at least one reference sensor for recording the same physical variable, and having an analysis unit electrically connected thereto, the method comprising:

determining said characteristic from measured values of the at least one measuring sensor and of the at least one reference sensor; and

recording a characteristic point during continuous measurement operation, starting with the first time the sensor arrangement is put into operation, when a definable measurement point is reached in a process for the first time, if changes in measured value of the at least one measuring sensor and of the at least one reference sensor remain within a definable tolerance band within a definable time interval.

2. The method as claimed in claim 1 , comprising:

dynamically adjusting a limit to suit the changes in measured value as a function of the changes in measured value of the at least one measuring sensor and of the at least one reference sensor within the definable time interval.

3. The method as claimed in claim 2 ,

wherein

the limit is adjusted proportionally to the changes in measured value within the definable time interval.

4. The method as claimed in claim 3 ,

wherein where changes in measured value within the definable time interval are small, a characteristic point is calculated from the difference in the measured values of the at least one measuring sensor and of the at least one reference sensor and is assigned to an associated measurement point of the sensor arrangement.

5. The method as claimed in claim 3 ,

wherein where absolute changes in measured value within the definable time interval are large, and differences between the changes in measured value of the at least one measuring sensor and the changes in measured value of the at least one reference sensor are small, a characteristic point is statistically calculated based on a plurality of reference values.

6. The method as claimed in claim 3 ,

wherein where absolute changes in measured value within the definable time interval are large, and differences between the changes in measured value of the at least one measuring sensor and the changes in measured value of the at least one reference sensor are small, a characteristic point is analytically calculated based on a plurality of reference values.

7. The method as claimed in claim 1 ,

wherein where changes in measured value within the definable time interval are small, a characteristic point is calculated from the difference in the measured values of the at least one measuring sensor and of the at least one reference sensor and is assigned to an associated measurement point of the sensor arrangement.

8. The method as claimed in claim 1 ,

wherein where absolute changes in measured value within the definable time interval are large, and differences between the changes in measured value of the at least one measuring sensor and the changes in measured value of the at least one reference sensor are small, a characteristic point is statistically calculated based on a plurality of reference values.

9. The method as claimed in claim 1 ,

wherein where absolute changes in measured value within the definable time interval are large, and differences between the changes in measured value of the at least one measuring sensor and the changes in measured value of the at least one reference sensor are small, a characteristic point is analytically calculated based on a plurality of reference values.

10. The method as claimed in claim 9 ,

wherein missing characteristic points of the characteristic are calculated by interpolation and/or extrapolation from measurement-based characteristic points.

11. The method as claimed in claim 1 ,

wherein missing characteristic points of the characteristic are calculated by interpolation and/or extrapolation from measurement-based characteristic points.

12. The method as claimed in claim 11 ,

wherein while the characteristic is being determined, the deviation of the sensor arrangement from the recorded characteristic point is recorded for characteristic points that already exist.

13. The method as claimed in claim 1 ,

wherein while the characteristic is being determined, the deviation of the sensor arrangement from the recorded characteristic point is recorded for characteristic points that already exist.

14. The method as claimed in claim 13 , comprising

dynamically adjusting a limit as a function of the measured value of the physical variable.

15. The method as claimed in claim 1 , comprising

dynamically adjusting a limit as a function of the measured value of the physical variable.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2008
From: ABB PATENT GMBH
To: ABB AG
Reel/Frame 022012/0247 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 13, 2007
From: MUELLER, HARALD U..; SZASZ, PAUL; HUCK, RALF; MERLIN, TILO; KELLER, STEFFEN
To: ABB PATENT GMBH
Reel/Frame 020239/0588 →