IP Library Granted Patent US 7,636,162
Granted Patent B2
US 7,636,162 · App. 11/850,763 · Granted Dec 22, 2009

Microchip testing device

Assignee: Ushiodenki Kabushiki Kaisha
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Quick Facts
Patent No.
US 7,636,162
App. No.
11/850,763
Granted
Dec 22, 2009
Kind
B2
Abstract

Microchip testing device having a chip holder that can be exactly positioned and from which adhered sample liquid can be removed easily. The microchip testing device has a chip holder, with a cover and a box area, mounted on a measurement stage, a microchip that has an optical measurement chamber is housed in the chip holder, a light source that radiates light on the optical measurement chamber of the microchip, a detector that receives light that has passed through the optical measurement chamber, and a controller that controls the device. The chip holder has reference planes to position the microchip in two directions perpendicular to the optical axis of the optical measurement chamber and pushers that push the microchip against the reference planes, so that the microchip is positioned within the chip holder by closing the cover of the chip holder.

Claims (13)

1. Microchip testing device, comprising:

a measurement stage,

a chip holder having a cover and a box area that are connected together by a hinge and which is mounted on the measurement stage,

a microchip that has an optical measurement chamber and is housed in the chip holder,

a light source that radiates light on the optical measurement chamber of the microchip,

a detector that receives light that has passed through the optical measurement chamber, and

a controller that controls the device,

wherein the chip holder has X and Y direction reference planes to position the microchip in X and Y directions perpendicular to an optical axis of the optical measurement chamber and X and Y direction pushers that push the microchip against the X and Y direction reference planes, respectively, and

wherein at least the Y direction pusher pushes the microchip in the Y direction and the microchip pushes against the Y direction reference plane so that the microchip is positioned within the chip holder in at least the Y direction by closing the cover of the chip holder.

2. Microchip testing device as described in claim 1 , wherein a surface of at least one of the pushers is a tapering bevel.

3. Microchip testing device as described in claim 1 , wherein one of the pushers comprises an element on the cover and an element on the box area, and wherein one of said elements has a tapering bevel.

4. Microchip testing device as described in claim 1 , wherein the hinge connecting the cover and box area of the chip holder is formed by concave and convex areas that have an interlocking relationship by which the cover and box area are engaged and separated.

5. Microchip testing device as described in claim 2 , wherein one of the pushers comprises an element on the cover and an element on the box area, and wherein one of said elements has a tapering bevel.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 1, 2019
From: ROHM CO., LTD.
To: HORIBA, LTD.
Reel/Frame 049049/0016 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 16, 2011
From: USHIODENKI KABUSHIKI KAISHA
To: ROHM CO, LTD.
Reel/Frame 026281/0867 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 6, 2007
From: OGAWA, YOSHIMASA; KANEDA, KAZUYUKI; KABETA, KATSUTOSHI
To: USHIODENKI KABUSHIKI KAISHA
Reel/Frame 019789/0645 →
Priority Claims (1)
JP 2006-242430 · Sep 7, 2006 · national
Continuity (1)
Related Publication 20080062423A1 · Mar 13, 2008