IP Library Granted Patent US 8,652,658
Granted Patent B2
US 8,652,658 · App. 11/858,949 · Granted Feb 18, 2014

C-plane sapphire method and apparatus

Inventors: Vitali Tatartchenko (Puteaux, FR); Christopher D. Jones (Amherst, NH); Steven Anthony Zanella (Dublin, NH); John W. Locher (Amherst, NH); Fery Pranadi (Nashua, NH)
Assignee: Saint-Gobain Ceramics & Plastics, Inc.
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Quick Facts
Patent No.
US 8,652,658
App. No.
11/858,949
Granted
Feb 18, 2014
Kind
B2
Abstract

A method and apparatus for the production of C-plane single crystal sapphire is disclosed. The method and apparatus may use edge defined film-fed growth techniques for the production of single crystal material exhibiting low polycrystallinity and/or low dislocation density.

Claims (9)

1. An as-grown C-plane single crystal sapphire ribbon having a neck and a body with substantially planar major surfaces, wherein the ribbon has a width of greater than or equal to 7.5 cm, a length of greater than the width, and fewer than 900 dislocations per cm 2 when measured through a thickness of the crystal using transmission X-ray diffraction topography based on Bragg diffraction, wherein the as-grown C-plane single crystal sapphire ribbon is formed by an edge defined film-fed growth technique.

2. The as-grown C-plane single crystal sapphire ribbon of claim 1 having a width of greater than or equal to about 10 cm.

3. The as-grown C-plane single crystal sapphire ribbon of claim 1 exhibiting fewer than 900 dislocations per cm 2 when measured through the thickness of 0.15 cm using the transmission X-ray diffraction topography based on Bragg diffraction.

4. The as-grown C-plane single crystal sapphire ribbon of claim 1 exhibiting fewer than 100 dislocations per cm 2 when measured through the thickness of 0.15 cm using the transmission X-ray diffraction topography based on Bragg diffraction.

5. The as-grown C-plane single crystal sapphire ribbon of claim 1 exhibiting fewer than 10 dislocations per cm 2 when measured through the thickness of 0.15 cm using the transmission X-ray diffraction topography based on Bragg diffraction.

6. The as-grown C-plane single crystal sapphire ribbon of claim 1 exhibiting fewer than 500 dislocations per cm 2 when measured through the thickness of 0.15 cm using the transmission X-ray diffraction topography based on Bragg diffraction.

7. The as-grown C-plane single crystal sapphire ribbon of claim 1 , wherein the width is greater than or equal to 15 cm.

8. The as-grown C-plane single crystal sapphire ribbon of claim 1 exhibiting fewer than 500 dislocations per cm 2 .

9. The as-grown C-plane single crystal sapphire ribbon of claim 1 exhibiting fewer than 100 dislocations per cm 2 .

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 12, 2024
From: SAINT-GOBAIN CERAMICS & PLASTICS, INC.
To: LUXIUM SOLUTIONS, LLC
Reel/Frame 067709/0124 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 25, 2008
From: TATARTCHENKO, VITALI; JONES, CHRISTOPHER D.; ZANELLA, STEVEN A.; LOCHER, JOHN W.; PRANADI, FERY
To: SAINT-GOBAIN CERAMICS & PLASTICS INC.
Reel/Frame 020414/0932 →
Continuity (2)
Provisional Application 60826723 · Sep 22, 2006
Related Publication 20080075941A1 · Mar 27, 2008